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    • 51. 发明授权
    • Interferometric optical phase discrimination apparatus
    • 干涉光学相位鉴别装置
    • US4105335A
    • 1978-08-08
    • US813298
    • 1977-07-06
    • Nobuyoshi TanakaNaoki AyataMitsuo TakedaSusumu MatsumuraKazuya Matsumoto
    • Nobuyoshi TanakaNaoki AyataMitsuo TakedaSusumu MatsumuraKazuya Matsumoto
    • G01B9/02G01B11/06G02B21/06
    • G01B9/0209G01B11/06G01B11/0675
    • Film of a known refractive index whose thickness is to be measured is illuminated by a white light beam. Two wave fronts from both sides of the film are directed to an interferometer. The wave fronts are out of phase in accordance with the thickness of the film. The two wave fronts are amplitude-split, respectively, by the beam splitter of the interferometer. Two of the split wave fronts are tilted by tilting means in the interferometer. The other two split wave fronts, as well as the two tilted wave fronts, are directed to an interference surface. Thus, there is formed a white interference pattern on the interference surface. The white interference pattern has a middle peak and two side peaks. The space interval between these peaks is measured by a scanner. By knowing the peak-to-peak interval, it is possible to discriminate the space interval between both sides of the film.
    • 其厚度被测量的已知折射率的膜被白光束照射。 电影两侧的两个波前被引导到干涉仪。 根据薄膜的厚度,波前是相位相异的。 两个波前分别由干涉仪的分束器进行振幅分割。 两个分波锋面通过倾斜装置在干涉仪中倾斜。 另外两个分裂波阵面以及两个倾斜的波前方向被引导到干涉面。 因此,在干涉面上形成白色干涉图案。 白色干涉图案具有中间峰和两个边峰。 这些峰之间的间隔由扫描仪测量。 通过知道峰到峰间隔,可以区分膜的两侧之间的间隔。
    • 54. 发明申请
    • DECODING ENCODED DATA
    • 解码编码数据
    • US20120139763A1
    • 2012-06-07
    • US13313772
    • 2011-12-07
    • Kiyoshi TakemuraNobuyoshi TanakaMakoto OgawaTadayuki Okada
    • Kiyoshi TakemuraNobuyoshi TanakaMakoto OgawaTadayuki Okada
    • H03M5/00
    • H03M7/4031G06T9/005H03M7/30H03M7/40H03M7/46
    • A method for decoding encoded data. The method includes receiving data encoded by replacing each of a plurality of characters with bit strings. The method also includes recording, on the basis of definition information, at least one of the characters as corresponding to each of the bit lengths, and generating decode information based on the number of characters, wherein the decode information includes bit string information for sorting the bit strings in a bit length order that is a predetermined order associated with bit lengths. The method also includes, in response to receiving a particular bit length, generating character information in which the characters are sorted in the bit length order by inserting a character corresponding to the particular bit length into a position corresponding to the particular bit length in an array in which at least one of the bit lengths.
    • 一种解码编码数据的方法。 该方法包括接收通过用位串替换多个字符中的每一个而编码的数据。 该方法还包括基于定义信息记录与每个比特长度相对应的字符中的至少一个,并且基于字符数生成解码信息,其中解码信息包括用于分类的比特串信息 位串以与位长度相关联的预定顺序的位长度顺序排列。 该方法还包括响应于接收到特定比特长度,通过将对应于特定比特长度的字符插入与阵列中的特定比特长度相对应的位置来生成字符以比特长度顺序排序的字符信息 其中至少一个位长度。
    • 56. 发明申请
    • EFFECTIVE METHOD TO PERFORM MEMORY TEST USING MULTIPLE PROCESSOR UNIT, DMA, AND SIMD INSTRUCTION
    • 使用多个处理器单元,DMA和SIMD指令执行存储器测试的有效方法
    • US20090187793A1
    • 2009-07-23
    • US12357080
    • 2009-01-21
    • Hiroshi DohjiHironori MakimuraMinoru KidaNobuyoshi Tanaka
    • Hiroshi DohjiHironori MakimuraMinoru KidaNobuyoshi Tanaka
    • G06F11/26G06F13/28
    • G11C29/56G11C2029/0401G11C2029/2602
    • To provide a method and the like for testing a main memory in a multi processor system, which is capable of reducing a test execution time and accordingly a start-up time as compared with the case where a single processor is used for the test. The present invention provides a method for testing a main memory (MM) in a multi processor system (MPS) including a main processor (MP) and multiple sub processors (SP) each having a DMA transfer mechanism and a local store (LS). The method and the like including: MP allocating a partial memory region (PMA) in MM to each SP; MP requesting each SP to test the allocated PMA; each SP filling LS thereof with initial data in response to receiving the request; each SP transferring the data stored in LS thereof to PMA by using a DMA transfer; each SP transferring the data stored in PMA to LS thereof by a DMA transfer; and SP testing the data in LS; and MP judging a test result on MM by putting together the tests results in response to the completion of all the tests by respective SP.
    • 提供一种用于测试多处理器系统中的主存储器的方法等,与单处理器用于测试的情况相比,其能够减少测试执行时间并相应地减少启动时间。 本发明提供了一种用于在包括主处理器(MP)和多个子处理器(SP)的多处理器系统(MPS)中测试主存储器(MM)的方法,每个子处理器具有DMA传输机制和本地存储器(LS)。 所述方法等包括:MP向每个SP分配MM中的部分存储区域(PMA); MP要求每个SP测试分配的PMA; 每个SP响应于接收到请求而填充其初始数据; 每个SP通过使用DMA传输将其LS中存储的数据传送到PMA; 每个SP通过DMA传输将存储在PMA中的数据传送到LS; 并对LS中的数据进行SP测试; 并且MP通过将测试结果组合在一起来响应于相应SP的所有测试的完成来判断MM的测试结果。
    • 57. 发明授权
    • Connector
    • 连接器
    • US07407403B2
    • 2008-08-05
    • US11338010
    • 2006-01-24
    • Nobuyoshi TanakaYoji KanaokaTakayuki Nakatsugawa
    • Nobuyoshi TanakaYoji KanaokaTakayuki Nakatsugawa
    • H01R13/627
    • H01R13/6272
    • A male housing (1) has a hood (5) for receiving a female housing (2) and the female housing (2) has a locking arm (9) for engaging the hood (5) when the housings (1, 2) are fit together. Protection walls (19) are formed on the female housing (2) on opposite sides of the locking arm (9). The protection walls (19) are substantially flush with the hood (5) when the housings (1, 2) are fit together. An operation portion (20) of the locking arm (9) also is substantially flush with the hood (5) when the housings (1, 2) are fit together. A predetermined interval is set between opposed ends of the protection wall (19) and the hood (5) and between the operation portion (20) and the hood (5). Thus, an operator's gloves will not be caught while fitting the male and female housing (1, 2) together.
    • 阳壳体(1)具有用于容纳阴壳体(2)的罩(5),并且阴壳体(2)具有当壳体(1,2)为 适合在一起。 保护壁(19)形成在锁定臂(9)的相对侧上的阴壳体(2)上。 当壳体(1,2)装配在一起时,保护壁(19)基本上与罩(5)齐平。 当壳体(1,2)装配在一起时,锁定臂(9)的操作部分(20)也基本上与罩(5)齐平。 在保护壁(19)和罩(5)的相对端之间以及操作部(20)和罩(5)之间设置预定间隔。 因此,在将男女外壳(1,2)安装在一起时,操作者的手套不会被抓住。
    • 59. 发明申请
    • Connector for use in substrate
    • 用于基板的连接器
    • US20070197059A1
    • 2007-08-23
    • US11656719
    • 2007-01-23
    • Nobuyoshi Tanaka
    • Nobuyoshi Tanaka
    • H01R12/00
    • H01R12/7017H01R12/724
    • A fixing part (12) has two resiliently deformable legs (18) separated by a slot (17). A locking projection (19) is formed at a distal end (19C) of the fixing part (12) and has a locking surface (19A) spaced from the distal end (19C). A maximum cross-sectional dimension (A) of the fixing part (12) at the locking surface (19A) exceeds the diameter (d) of a through-hole (71) in a substrate (70). A tapered sliding-contact surface (19B) extends from the locking surface (19A) to the distal end (19C). Noncontact surfaces (21) are at opposite circumferential ends of each sliding contact surface (19B) and substantially adjacent the slot (17). The noncontact surfaces (22) of each locking projection (19) are spaced from one another at the slot (17) by distances that are no greater than the diameter (d) of the through-hole (71).
    • 固定部分(12)具有由槽(17)分开的两个可弹性变形的支脚(18)。 锁定突起(19)形成在固定部分(12)的远端(19C)处并且具有与远端(19C)间隔开的锁定表面(19A)。 固定部分(12)在锁定表面(11A)处的最大横截面尺寸(A)超过衬底(70)中的通孔(71)的直径(d)。 锥形滑动接触表面(19B)从锁定表面(19A)延伸到远端(19C)。 非接触表面(21)在每个滑动接触表面(19B)的相对的周向端部处并且基本上邻近狭槽(17)。 每个锁定突起(19)的非接触表面(22)在槽(17)处彼此间隔开不超过通孔(71)的直径(d)的距离。