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    • 51. 发明授权
    • Transient heat assisted STTRAM cell for lower programming current
    • 瞬态热辅助STTRAM电池用于较低的编程电流
    • US08238151B2
    • 2012-08-07
    • US12642533
    • 2009-12-18
    • Jun LiuGurtej Sandhu
    • Jun LiuGurtej Sandhu
    • G11C11/14
    • G11C11/1675G11C11/161
    • A memory cell including magnetic materials and heating materials, and methods of programming the memory cell are provided. The memory cell includes a free region, a pinned region, and a heating region configured to generate and transfer heat to the free region when a programming current is directed to the cell. The heat transferred from the heating region increases the temperature of the free region, which decreases the magnetization and the critical switching current density of the free region. In some embodiments, the heating region may also provide a current path to the free region, and the magnetization of the free region may be switched according to the spin polarity of the programming current, programming the memory cell to a high resistance state or a low resistance state.
    • 提供包括磁性材料和加热材料的存储单元,以及编程存储单元的方法。 存储单元包括自由区域,固定区域和加热区域,该区域被配置成当编程电流被引导到单元时,产生和传递热量到自由区域。 从加热区域传递的热量增加了自由区域的温度,这降低了自由区域的磁化强度和临界开关电流密度。 在一些实施例中,加热区域还可以提供到自由区域的电流路径,并且可以根据编程电流的自旋极性来切换自由区域的磁化,将存储器单元编程为高电阻状态或低电平状态 电阻状态。
    • 55. 发明授权
    • Method for positioning spacers for pitch multiplication
    • 定位用于间距乘法的间隔物的方法
    • US08173550B2
    • 2012-05-08
    • US13179851
    • 2011-07-11
    • Sanket SantGurtej SandhuNeal R. Rueger
    • Sanket SantGurtej SandhuNeal R. Rueger
    • H01L21/302
    • H01L21/3088H01L21/0337H01L21/3085H01L21/3086H01L21/76802H01L27/1052
    • Multiple pitch-multiplied spacers are used to form mask patterns having features with exceptionally small critical dimensions. One of each pair of spacers formed around a plurality of mandrels is removed and alternating layers, formed of two mutually selectively etchable materials, are deposited around the remaining spacers. Layers formed of one of the materials are then etched, leaving behind vertically-extending layers formed of the other of the materials, which form a mask pattern. Alternatively, instead of depositing alternating layers, amorphous carbon is deposited around the remaining spacers followed by a plurality of cycles of forming pairs of spacers on the amorphous carbon, removing one of the pairs of spacers and depositing an amorphous carbon layer. The cycles can be repeated to form the desired pattern. Because the critical dimensions of some features in the pattern can be set by controlling the width of the spaces between spacers, exceptionally small mask features can be formed.
    • 使用多个间距倍数的间隔物来形成具有特别小的临界尺寸的特征的掩模图案。 去除围绕多个心轴形成的每对间隔件中的一个,并且由两个相互选择性可蚀刻的材料形成的交替层围绕剩余的间隔物沉积。 然后蚀刻由一种材料形成的层,留下由形成掩模图案的另一种材料形成的垂直延伸层。 或者,代替沉积交替的层,非晶碳沉积在剩余的间隔物周围,随后在无定形碳上形成成对隔离物的多个循环,去除一对隔离物之一并沉积无定形碳层。 可以重复循环以形成所需的图案。 由于图案中的某些特征的临界尺寸可以通过控制间隔物之间​​的间隔的宽度来设定,所以可以形成特别小的掩模特征。
    • 57. 发明申请
    • MASK MATERIAL CONVERSION
    • 掩模材料转换
    • US20110130006A1
    • 2011-06-02
    • US13024166
    • 2011-02-09
    • Mirzafer K. AbatchevGurtej Sandhu
    • Mirzafer K. AbatchevGurtej Sandhu
    • H01L21/306
    • H01L21/308H01L21/0337H01L21/0338H01L21/31144H01L21/32139
    • The dimensions of mask patterns, such as pitch-multiplied spacers, are controlled by controlled growth of features in the patterns after they are formed. To form a pattern of pitch-multiplied spacers, a pattern of mandrels is first formed overlying a semiconductor substrate. Spacers are then formed on sidewalls of the mandrels by depositing a blanket layer of material over the mandrels and preferentially removing spacer material from horizontal surfaces. The mandrels are then selectively removed, leaving behind a pattern of freestanding spacers. The spacers comprise a material, such as polysilicon and amorphous silicon, known to increase in size upon being oxidized. The spacers are oxidized to grow them to a desired width. After reaching the desired width, the spacers can be used as a mask to pattern underlying layers and the substrate. Advantageously, because the spacers are grown by oxidation, thinner blanket layers can be deposited over the mandrels, thereby allowing the deposition of more conformal blanket layers and widening the process window for spacer formation.
    • 掩模图案的尺寸,例如间距倍数的间隔物,通过形成图案之后的特征的受控生长来控制。 为了形成间距倍数间隔物的图案,首先形成芯片图案,覆盖半导体衬底。 然后通过在心轴上沉积覆盖层材料并优先从水平表面去除间隔物材料,将垫片形成在心轴的侧壁上。 然后选择性地去除心轴,留下独立间隔物的图案。 间隔物包括已知在氧化时尺寸增加的材料,例如多晶硅和非晶硅。 间隔物被氧化以使它们生长成所需的宽度。 在达到期望的宽度之后,间隔物可以用作掩模以对下面的层和基底进行图案化。 有利地,由于间隔物通过氧化生长,较薄的橡皮布层可以沉积在心轴上,从而允许沉积更多共形的覆盖层并加宽用于间隔物形成的工艺窗口。
    • 59. 发明授权
    • Pitch multiplication using self-assembling materials
    • 使用自组装材料进行倍增
    • US07923373B2
    • 2011-04-12
    • US11757846
    • 2007-06-04
    • Gurtej Sandhu
    • Gurtej Sandhu
    • H01L21/311
    • H01L21/0337H01L21/3086H01L21/31116H01L21/31144
    • Self-assembling materials, such as block copolymers, are used as mandrels for pitch multiplication. The copolymers are deposited over a substrate and directed to self-assemble into a desired pattern. One of the blocks forming the block copolymers is selectively removed. The remaining blocks are used as mandrels for pitch multiplication. Spacer material is blanket deposited over the blocks. The spacer material is subjected to a spacer etch to form spacers on sidewalls of the mandrels. The mandrels are selectively removed to leave free-standing spacers. The spacers may be used as pitch-multiplied mask features to define a pattern in an underlying substrate.
    • 自组装材料,如嵌段共聚物,被用作螺距倍增的心轴。 共聚物沉积在衬底上并指向自组装成所需的图案。 选择性地除去形成嵌段共聚物的块之一。 其余块用作俯仰倍增的心轴。 垫片材料被覆盖在块上。 间隔物材料经受间隔物蚀刻以在心轴的侧壁上形成间隔物。 选择性地去除心轴以留下独立的间隔物。 间隔物可以用作间距倍增掩模特征以在下面的基底中限定图案。
    • 60. 发明授权
    • Mask material conversion
    • 面膜材质转换
    • US07910288B2
    • 2011-03-22
    • US10932993
    • 2004-09-01
    • Mirzafer K. AbatchevGurtej Sandhu
    • Mirzafer K. AbatchevGurtej Sandhu
    • G03F1/00
    • H01L21/308H01L21/0337H01L21/0338H01L21/31144H01L21/32139
    • The dimensions of mask patterns, such as pitch-multiplied spacers, are controlled by controlled growth of features in the patterns after they are formed. To form a pattern of pitch-multiplied spacers, a pattern of mandrels is first formed overlying a semiconductor substrate. Spacers are then formed on sidewalls of the mandrels by depositing a blanket layer of material over the mandrels and preferentially removing spacer material from horizontal surfaces. The mandrels are then selectively removed, leaving behind a pattern of freestanding spacers. The spacers comprise a material, such as polysilicon and amorphous silicon, known to increase in size upon being oxidized. The spacers are oxidized to grow them to a desired width. After reaching the desired width, the spacers can be used as a mask to pattern underlying layers and the substrate. Advantageously, because the spacers are grown by oxidation, thinner blanket layers can be deposited over the mandrels, thereby allowing the deposition of more conformal blanket layers and widening the process window for spacer formation.
    • 掩模图案的尺寸,例如间距倍数的间隔物,通过形成图案之后的特征的受控生长来控制。 为了形成间距倍数间隔物的图案,首先形成芯片图案,覆盖半导体衬底。 然后通过在心轴上沉积覆盖层材料并优先从水平表面去除间隔物材料,将垫片形成在心轴的侧壁上。 然后选择性地去除心轴,留下独立间隔物的图案。 间隔物包括已知在氧化时尺寸增加的材料,例如多晶硅和非晶硅。 间隔物被氧化以使它们生长成所需的宽度。 在达到期望的宽度之后,间隔物可以用作掩模以对下面的层和基底进行图案化。 有利地,由于间隔物通过氧化生长,较薄的橡皮布层可以沉积在心轴上,从而允许沉积更多共形的覆盖层并加宽用于间隔物形成的工艺窗口。