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    • 55. 发明授权
    • Radiation detecting apparatus and radiographing system
    • 辐射检测装置和放射照相系统
    • US07714294B2
    • 2010-05-11
    • US12132782
    • 2008-06-04
    • Satoru SawadaSatoshi OkadaMasato InoueKazumi NaganoShinichi TakedaKeiichi NomuraYoshihiro Ogawa
    • Satoru SawadaSatoshi OkadaMasato InoueKazumi NaganoShinichi TakedaKeiichi NomuraYoshihiro Ogawa
    • G01T1/20
    • G01T1/20G01T7/005
    • A radiation detecting apparatus includes: a sensor panel having a substrate and a photoelectric conversion element array arranged on the substrate; a scintillator layer arranged on one surface side of the sensor panel; and a light generator arranged on the sensor panel at the other side in opposition to the one side on which the scintillator layer is arranged, in corresponding to an area in which the photoelectric conversion element array is arranged. The light generator includes a light transmitting electrode layer, a rear electrode layer and a light emitting layer arranged between the light transmitting electrode layer and the rear electrode. The light emitting layer according to a first aspect is formed from light emitting substance, a binder and a black pigment. The light emitting layer according to a second aspect contains a first pigment or dye absorbing a light of the same wavelength of a maximum light emission from the scintillator layer, and a second pigment or dye different from the first pigment or dye.
    • 一种放射线检测装置,包括:传感器面板,具有基板和布置在基板上的光电转换元件阵列; 布置在传感器面板的一个表面侧的闪烁体层; 以及光发生器,其对应于设置有光电转换元件阵列的区域,布置在与设置有闪烁体层的一侧相对的另一侧的传感器面板上。 光发生器包括透光电极层,后电极层和布置在透光电极层和后电极之间的发光层。 根据第一方面的发光层由发光物质,粘合剂和黑色颜料形成。 根据第二方面的发光层包含吸收来自闪烁体层的最大发光波长相同的光的第一颜料或染料,以及与第一颜料或染料不同的第二颜料或染料。
    • 60. 发明授权
    • Radiation detecting apparatus, manufacturing method thereof, scintillator panel and radiation detecting system
    • 辐射检测装置及其制造方法,闪烁体面板和放射线检测系统
    • US07595493B2
    • 2009-09-29
    • US11199201
    • 2005-08-09
    • Satoshi OkadaYoshihiro OgawaMasato InoueKazumi NaganoShinichi TakedaTomoyuki Tamura
    • Satoshi OkadaYoshihiro OgawaMasato InoueKazumi NaganoShinichi TakedaTomoyuki Tamura
    • G01T1/20
    • G21K4/00
    • A radiation detecting apparatus includes a sensor panel 100, a phosphor layer 111 formed on the sensor panel 100 to convert a radiation into light, and a phosphor protecting member 110 covering the phosphor layer 111 to adhere closely to the phosphor protecting member 110. The phosphor protecting member 110 includes a phosphor protecting layer 116 made of vapor deposition polymerization polyimide formed by vapor deposition polymerization, a reflecting layer 113 reflecting the light converted by the phosphor layer 111, and a protecting layer 117 made of vapor deposition polymerization polyurea formed by the vapor deposition polymerization. By such a configuration, a polymerization reaction of the phosphor protecting layer 116 is performed on the substrate. Thereby, the generation of by-products is suppressed to make it easy to acquire the uniformity of film quality. Consequently, the generation of a situation in which structural disorders are generated on the reflection surface of the reflecting layer 113 to cause image defects can be suppressed.
    • 辐射检测装置包括传感器面板100,形成在传感器面板100上以将辐射转换为光的荧光体层111和覆盖荧光体层111以紧密附着到荧光体保护构件110的荧光体保护构件110.荧光体 保护构件110包括由气相沉积聚合形成的气相沉积聚合聚酰亚胺制成的荧光体保护层116,反射由荧光体层111转换的光的反射层113和由蒸气形成的气相沉积聚合聚脲制成的保护层117 沉积聚合。 通过这样的结构,在基板上进行荧光体保护层116的聚合反应。 由此,抑制了副产物的产生,从而容易获得膜质量的均匀性。 因此,可以抑制在反射层113的反射面上产生结构紊乱以引起图像缺陷的情况的产生。