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    • 55. 发明申请
    • LIGHT SCAN TYPE TOUCH PANEL
    • 光扫类型触控面板
    • US20120019484A1
    • 2012-01-26
    • US13048686
    • 2011-03-15
    • Hyun-Chul DoIm-Su ChoiYoung-Sun Kim
    • Hyun-Chul DoIm-Su ChoiYoung-Sun Kim
    • G06F3/042
    • G06F3/0423
    • A light scan type touch panel includes: at least two light scanning units located outside of a display screen at one side; a plurality of light guide units located at other sides of the display screen; and a light receiving unit located at at least one end of each of the plurality of light guide units. Each of the light guide units includes: a light guiding member having a light incidence plane and a light emission plane; a diffusion sheet located at the light incidence plane; a plurality of reflection sheets located at planes of the light guiding member other than the light incidence plane and the light emission plane; and diffuse reflection inducing units located at one side of the light guiding member, facing one of the plurality of reflection sheets.
    • 光扫描型触摸面板包括:位于一侧的显示屏外部的至少两个光扫描单元; 位于显示屏的另一侧的多个导光单元; 以及位于所述多个导光单元中的每一个的至少一端的光接收单元。 每个导光单元包括:具有光入射面和发光面的导光部件; 位于光入射面的扩散片; 位于所述导光部件的除了所述光入射面和所述发光面以外的平面的多个反射片; 以及位于导光构件的一侧的漫反射感应单元,面对多个反射片中的一个。
    • 59. 发明申请
    • NONVOLATILE MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME
    • 非易失性存储器件及其制造方法
    • US20100187595A1
    • 2010-07-29
    • US12694655
    • 2010-01-27
    • Sung-Hae LeeByong-Sun JuSuk-Jin ChungYoung-Sun Kim
    • Sung-Hae LeeByong-Sun JuSuk-Jin ChungYoung-Sun Kim
    • H01L29/788H01L21/8247
    • H01L27/11521H01L21/28273H01L29/42324
    • Nonvolatile memory devices and related methods of manufacturing the same are provided. A nonvolatile memory device includes a tunneling layer on a substrate, a floating gate on the tunneling layer, an inter-gate dielectric layer structure on the floating gate, and a control gate on the inter-gate dielectric layer structure. The inter-gate dielectric layer structure includes a first silicon oxide layer, a high dielectric layer on the first silicon oxide layer, and a second silicon oxide layer on the high dielectric layer opposite to the first silicon oxide layer The high dielectric layer may include first and second high dielectric layers laminated on each other, and the first high dielectric layer may have a lower density of electron trap sites than the second high dielectric layer and may have a larger energy band gap or conduction band-offset than the second high dielectric layer.
    • 提供了非易失性存储器件及其制造方法。 非易失性存储器件包括衬底上的隧道层,隧道层上的浮动栅极,浮置栅极上的栅极间电介质层结构以及栅极间电介质层结构上的控制栅极。 栅极间电介质层结构包括第一氧化硅层,第一氧化硅层上的高电介质层和与第一氧化硅层相对的高电介质层上的第二氧化硅层。高电介质层可以包括第一氧化硅层 和第二高介电层彼此层叠,并且第一高介电层可以具有比第二高介电层更低的电子陷阱位置密度,并且可以具有比第二高介电层更大的能带隙或导带偏移 。