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    • 54. 发明授权
    • Method of producing an integrated circuit configuration
    • 集成电路结构的制造方法
    • US06998338B2
    • 2006-02-14
    • US10646218
    • 2003-08-22
    • Manfred Engelhardt
    • Manfred Engelhardt
    • H01L21/4763
    • H01L21/76844H01L23/5226H01L2924/0002H01L2924/00
    • In an integrated circuit configuration, above a first conductive structure which is embedded in a first insulating layer there are arranged a first barrier layer and a second insulating layer, in which a contact hole is provided which reaches down to the first conductive structure. Above the first barrier layer, the side walls of the contact hole are provided with spacers which act as a diffusion barrier and which reach down to the surface of the first barrier layer. A second conductive structure is arranged in the contact hole. The second conductive structure is conductively connected to the first conductive structure. During the production of the contact hole, the spacers prevent deposition of material from the first conductive structure on the surface of the second insulating layer.
    • 在集成电路结构中,在嵌入在第一绝缘层中的第一导电结构之上,布置有第一阻挡层和第二绝缘层,其中设置有向下到达第一导电结构的接触孔。 在第一阻挡层上方,接触孔的侧壁设置有用作扩散阻挡层并且到达第一阻挡层表面的间隔物。 第二导电结构布置在接触孔中。 第二导电结构与第一导电结构导电连接。 在接触孔的制造期间,间隔物防止第二绝缘层表面上的第一导电结构材料的沉积。