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    • 54. 发明申请
    • Substrate processing method and semiconductor manufacturing apparatus
    • 基板加工方法和半导体制造装置
    • US20080182345A1
    • 2008-07-31
    • US12010274
    • 2008-01-23
    • Masashi SugishitaMasaaki UenoAkira Hayashida
    • Masashi SugishitaMasaaki UenoAkira Hayashida
    • H01L21/66B05C11/02
    • H01L22/20H01L2924/0002Y10S438/905H01L2924/00
    • A semiconductor manufacturing apparatus and substrate processing method is provided with which the film formed on a substrate can be controlled in thickness and quality. The substrate processing method includes a step of acquiring a measurement value based on a first detecting section for detecting a state of a peripheral edge of a substrate and a measurement value based on a second detecting section for detecting a state of a center of the substrate and determining a first difference between the measurement value based on the first detecting section and the measurement value based on the second detecting section, comparing between a previously stored second difference between a measurement value concerning the first detecting section and a measurement value concerning the second detecting section with the first difference between the measurement value based on the first detecting section and the measurement value based on the second detecting section, calculating a correction value for a pressure in a cooling-gas passage provided between a process chamber for processing the substrate and a heating device depending upon the first difference when the first difference is different from the second difference, and correcting the pressure value based on the pressure correction value, anda step of processing the substrate by flowing a cooling gas through the cooling-gas passage by means of a cooling device while heating the process chamber by the heating device, and placing the heating device and the cooling device under control of a control section depending upon a pressure value corrected.
    • 提供了一种半导体制造装置和基板处理方法,其可以控制在基板上形成的膜的厚度和质量。 基板处理方法包括基于用于检测基板的周缘的状态的第一检测部和基于用于检测基板的中心的状态的第二检测部的测量值来获取测量值的步骤,以及 基于第二检测部分确定基于第一检测部分的测量值和测量值之间的第一差异,将先前存储的关于第一检测部分的测量值和与第二检测部分相关的测量值之间的第二差值进行比较 基于第一检测部分的测量值和基于第二检测部分的测量值之间的第一差异,计算在处理基板的处理室和加热之间设置的冷却气体通道中的压力的​​校正值 设备取决于fi的第一个差异 第一差异与第二差异不同,并且基于压力校正值校正压力值,以及通过借助于冷却装置使冷却气体流过冷却气体通道而加热基板的步骤,同时加热处理室 通过加热装置,并且根据校正的压力值将加热装置和冷却装置放置在控制部分的控制下。