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    • 49. 发明授权
    • Methods of fabricating dual layer semiconductor devices
    • 制造双层半导体器件的方法
    • US07465619B2
    • 2008-12-16
    • US11130575
    • 2005-05-17
    • Eugene A. Fitzgerald
    • Eugene A. Fitzgerald
    • H01L21/8238
    • H01L29/7842H01L21/823807H01L29/1054Y10S438/933
    • A semiconductor-based device includes a channel layer, which includes a distal layer and a proximal layer in contact with the distal layer. The distal layer supports at least a portion of hole conduction for at least one p-channel component, and the proximal layer supports at least a portion of electron conduction for at least one n-channel component. The proximal layer has a thickness that permits a hole wave function to effectively extend from the proximal layer into the distal layer to facilitate hole conduction by the distal layer. A method for fabricating a semiconductor-based device includes providing a distal portion of a channel layer and providing a proximal portion of the channel layer.
    • 基于半导体的器件包括沟道层,其包括远端层和与远端层接触的近端层。 远端层支撑至少一个p沟道分量的至少一部分空穴传导,并且近端支撑至少一个n沟道分量的至少一部分电子传导。 近端层具有允许空穴波函数从近端层有效地延伸到远侧层中的厚度,以便于远端层的空穴传导。 一种用于制造基于半导体的器件的方法包括提供沟道层的远端部分并提供沟道层的近端部分。