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    • 49. 发明授权
    • Semiconductor memory having redundancy circuit
    • 具有冗余电路的半导体存储器
    • US5815448A
    • 1998-09-29
    • US825605
    • 1997-03-31
    • Masashi HoriguchiJun EtohMasakazu AokiKiyoo Itoh
    • Masashi HoriguchiJun EtohMasakazu AokiKiyoo Itoh
    • G11C5/00G11C7/00G11C8/00G11C29/00
    • G11C29/80G11C29/785G11C29/808
    • A redundancy technique is introduced for a semiconductor memory and, more particularly, a redundancy technique for a dynamic random access memory (DRAM) having a storage capacity of 16 mega bits or more. In such a DRAM, the memory array is divided into memory mats. According to the present redundancy technique, for a semiconductor memory including a memory array which has a plurality of word lines, a plurality of bit lines arranged so that two-level crossings are formed between the word lines and the bit lines, memory cells disposed at desired ones of the two-level crossings, and spare bit lines, there is provided a redundancy circuit having a memory for storing therein a defective address existing in the memory array and comparing an address to be accessed with the stored defective address, and selection circuitry including logical OR gates for replacing a defective bit line by a spare bit line in accordance with the result of the comparison. Each of the address comparing circuits has stored therein the column address of a defective bit line and a part of the row address indicating the memory mat corresponding to the defective bit line.
    • 引入冗余技术用于半导体存储器,更具体地,涉及具有16兆位或更多存储容量的动态随机存取存储器(DRAM)的冗余技术。 在这样的DRAM中,存储器阵列被分成存储器垫。 根据本技术的冗余技术,对于包含具有多个字线的存储器阵列的半导体存储器,配置成在字线和位线之间形成2级交叉的多位位线,位于 提供了两级交叉中的期望的和备用位线,提供了一种冗余电路,其具有用于在其中存储存在于存储器阵列中的缺陷地址并将要访问的地址与所存储的缺陷地址进行比较的存储器,以及选择电路 包括用于根据比较结果用备用位线替换有缺陷位线的逻辑“或”门。 每个地址比较电路在其中存储有缺陷位线的列地址和指示与有缺陷位线对应的存储器堆的行地址的一部分。