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    • 49. 发明授权
    • Process for forming a deposited film
    • 沉积膜形成工艺
    • US4772486A
    • 1988-09-20
    • US113414
    • 1987-10-27
    • Shunichi IshiharaShigeru OhnoMasahiro KanaiShunri OdaIsamu Shimizu
    • Shunichi IshiharaShigeru OhnoMasahiro KanaiShunri OdaIsamu Shimizu
    • C23C16/30C23C16/452B05D3/06
    • C23C16/452C23C16/301C23C16/306
    • A process for forming a deposited film, which comprises introducing, into a film forming space for forming said deposited film on a substrate, compounds A-1 and B-1 respectively represented by following general formulae and employed as raw materials for said deposited film:R.sub.n M.sup.1.sub.m (A-1)A.sup.1.sub.a B.sub.b (B-1)and active species capable of effecting a chemical reaction with at least one of said compounds, thereby forming a deposited film on said substrate, wherein m is a positive integer equal to the valence of R or a multiple thereof, n is a positive integer equal to the valence of M.sup.1 or a multiple thereof, M.sup.1 stands for an element of the group III of the periodic table, R stands for a hydrogen atom (H), a halogen atom (X) or a hydrocarbon group, a is a positive integer equal to the valence of B or a multiple thereof, b is a positive integer equal to the valence of A.sup.1 or a multiple thereof, A.sup.1 stands for an element of the group V of the periodic table, and B stands for a hydrogen atom (H), a halogen atom (X) or a hydrocarbon group.
    • 一种用于形成沉积膜的方法,其包括在基板上将用于形成所述沉积膜的成膜空间引入分别由以下通式表示的化合物A-1和B-1,并用作所述沉积膜的原料: R a1b(B-1)和能够与所述化合物中的至少一种进行化学反应的活性物质,从而在所述基材上形成沉积膜,其中m是等于R的化合价的正整数 或其倍数,n为等于M1的化合价的正整数或其倍数,M1表示周期表第III族的元素,R表示氢原子(H),卤素原子(X )或烃基时,a为等于B的化合价的正整数或其倍数,b为与Al的化合价或其倍数相同的正整数,A1表示周期性的第Ⅴ族的元素 表和B代表氢原子(H),卤素 (X)或烃基。