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    • 44. 发明申请
    • OVERHEAT DETECTION IN THERMALLY CONTROLLED DEVICES
    • 过热检测在热控制器件中
    • US20100102949A1
    • 2010-04-29
    • US12650831
    • 2009-12-31
    • Efraim Rotem
    • Efraim Rotem
    • G08B29/00
    • G06F1/206
    • Systems and methods of overheat detection provide for generating a control signal on a die containing a processor based on an internal temperature of the processor and a control temperature threshold. It can be determined whether to generate a warning temperature event on the die based on a behavior of the control signal. In one embodiment, the warning temperature event provides for initiation of an automated data saving process, which reduces the abruptness of conventional warning temperature shutdowns. Other embodiments provide the user the option of saving his or her work before a shutdown temperature threshold is reached.
    • 过热检测的系统和方法提供了在基于处理器的内部温度和控制温度阈值的情况下在包含处理器的管芯上生成控制信号。 可以基于控制信号的行为来确定是否在管芯上产生警告温度事件。 在一个实施例中,警告温度事件提供启动自动数据保存处理,这减少了常规警告温度关闭的突然性。 其他实施例为用户提供在达到关闭温度阈值之前保存他或她的工作的选项。