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    • 41. 发明申请
    • Semiconductor Integrated Circuit
    • 半导体集成电路
    • US20110246860A1
    • 2011-10-06
    • US13162180
    • 2011-06-16
    • Yutaka SHINAGAWATakeshi KataokaEiichi IshikawaToshihiro TanakaKazumasa YanagisawaKazufumi Suzukawa
    • Yutaka SHINAGAWATakeshi KataokaEiichi IshikawaToshihiro TanakaKazumasa YanagisawaKazufumi Suzukawa
    • H03M13/05G11C16/04G06F11/10
    • G11C16/349G11C16/06G11C16/3495
    • A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed In an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior In a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.
    • 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域,其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 当用于存储信息的阈值电压的最大变化幅度较大时,由于由于存储信息的重写操作而对存储单元的应力变大,所以不利于保证重写操作的次数; 然而,由于读取电流变大,因此可以加快存储器信息的读取速度。 可以优先考虑第一非易失性存储器区域以加快存储器信息的读取速度,并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。
    • 42. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US07978545B2
    • 2011-07-12
    • US12775377
    • 2010-05-06
    • Yutaka ShinagawaTakeshi KataokaEiichi IshikawaToshihiro TanakaKazumasa YanagisawaKazufumi Suzukawa
    • Yutaka ShinagawaTakeshi KataokaEiichi IshikawaToshihiro TanakaKazumasa YanagisawaKazufumi Suzukawa
    • G11C7/00
    • G11C16/349G11C16/06G11C16/3495
    • A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed in an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior in a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.
    • 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写的非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域,其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 当用于存储信息的阈值电压的最大变化幅度较大时,由于由于存储信息的重写操作而对存储单元的应力变大,所以在保证重写操作次数方面较差; 然而,由于读取电流变大,因此可以加快存储器信息的读取速度。 可以优先考虑第一非易失性存储器区域以加快存储器信息的读取速度,并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。
    • 43. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • 半导体集成电路
    • US20100220531A1
    • 2010-09-02
    • US12775377
    • 2010-05-06
    • YUTAKA SHINAGAWATakeshi KataokaEiichi IshikawaToshihiro TanakaKazumasa YanagisawaKazufumi Suzukawa
    • YUTAKA SHINAGAWATakeshi KataokaEiichi IshikawaToshihiro TanakaKazumasa YanagisawaKazufumi Suzukawa
    • G11C16/04G06F12/02G06F11/00G06F13/20
    • G11C16/349G11C16/06G11C16/3495
    • A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed in an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior in a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.
    • 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写的非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域,其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 当用于存储信息的阈值电压的最大变化幅度较大时,由于由于存储信息的重写操作而对存储单元的应力变大,所以在保证重写操作次数方面较差; 然而,由于读取电流变大,因此可以加快存储器信息的读取速度。 可以优先考虑第一非易失性存储器区域以加快存储器信息的读取速度,并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。
    • 47. 发明申请
    • ENCODING DEVICE AND ENCODING METHOD
    • 编码设备和编码方法
    • US20090263036A1
    • 2009-10-22
    • US12439021
    • 2007-10-16
    • Toshihiro Tanaka
    • Toshihiro Tanaka
    • G06K9/00H03M7/00
    • H03M7/4006H04N19/124H04N19/14H04N19/15H04N19/194H04N19/61H04N19/91
    • An encoding device 100 includes a quantization parameter generating circuit 111 that generates a provisional quantization parameter, a quantizing circuit 121 that generates quantized data by quantizing a signal to be quantized on the basis of the provisional quantization parameter, a binarizing circuit 131 that binarizes the quantized data to output binary symbol data, an arithmetic coding circuit 141 that generates coded data by arithmetic-coding the binary symbol data, a quantization parameter calculating circuit 112 that generates a suitable quantization parameter on the basis of a symbol amount of the binary symbol data, a code amount of the coded data, an upper limit of the symbol amount, and an target code amount, a quantizing circuit 122 that quantizes the signal to be quantized on the basis of the suitable quantization parameter.
    • 编码装置100包括产生临时量化参数的量化参数生成电路111,通过基于临时量化参数对要量化的信号进行量化而生成量化数据的量化电路121,二值化电路131, 用于输出二进制符号数据的数据,通过对二进制符号数据进行算术编码生成编码数据的算术编码电路141,量化参数计算电路112,其基于二进制符号数据的符号量生成适当的量化参数, 编码数据的代码量,符号量的上限和目标代码量,量化电路122,其根据适当的量化参数对待量化的信号进行量化。