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    • 43. 发明申请
    • Liquid crystal display device and method of fabricating the same
    • 液晶显示装置及其制造方法
    • US20070153175A1
    • 2007-07-05
    • US11643499
    • 2006-12-20
    • Sung-Soo ChangWoo-Hyun KimJin-Ho Kim
    • Sung-Soo ChangWoo-Hyun KimJin-Ho Kim
    • G02F1/1335
    • G02F1/133555G02F1/133504G02F1/133514
    • A liquid crystal display device includes an array substrate having reflective and transmissive regions in a pixel region, wherein the array substrate includes a reflective electrode corresponding to the reflective region and a pixel electrode on a first substrate. A color filter substrate defines the reflective region and the transmissive region in the pixel region. The color filter substrate includes a color filter with first and second portions that correspond to the respective transmissive and reflective regions on a second substrate. The thickness of the second portion is less than a thickness of the first portion. The combined thickness of the scatter and the thickness of the second portion is greater than the thickness of the first portion; and a liquid crystal layer between the array and color filter substrates.
    • 一种液晶显示装置,具备在像素区域具有反射和透射区域的阵列基板,其中阵列基板包括对应于反射区域的反射电极和在第一基板上的像素电极。 滤色器基板限定像素区域中的反射区域和透射区域。 滤色器基板包括滤色器,滤色器具有对应于第二基板上的相应透射和反射区域的第一和第二部分。 第二部分的厚度小于第一部分的厚度。 第二部分的散射和厚度的组合厚度大于第一部分的厚度; 以及阵列和滤色器基板之间的液晶层。
    • 48. 发明申请
    • Semiconductor device having LDD-type source/drain regions and fabrication method thereof
    • 具有LDD型源极/漏极区域的半导体器件及其制造方法
    • US20050045921A1
    • 2005-03-03
    • US10948883
    • 2004-09-24
    • Do-Hyung KimJin-Ho KimByung-Jun Hwang
    • Do-Hyung KimJin-Ho KimByung-Jun Hwang
    • H01L21/336H01L21/768H01L21/8234H01L21/8238H01L21/8244H01L27/092H01L27/11H01L29/78H01L29/06
    • H01L29/6653H01L21/76801H01L21/76832H01L21/76837H01L21/76895H01L21/823425H01L29/6659
    • A semiconductor device having LDD-type source/drain regions and a method of fabricating the same are provided. The semiconductor device includes at least a pair of gate patterns disposed on a semiconductor substrate and LDD-type source/drain regions disposed at both sides of the gate patterns. The substrate having the gate patterns and the LDD-type source/drain regions is covered with a conformal etch stop layer. The etch stop layer is covered with an interlayer insulating layer. The LDD-type source/drain region is exposed by a contact hole that penetrates the interlayer insulating layer and the etch stop layer. The method of forming the LDD-type source/drain regions and the etch stop layer includes forming low-concentration source/drain regions at both sides of the gate patterns and forming the conformal etch stop layer on the substrate having the low-concentration source/drain regions. Gate spacers are then formed on the sidewalls of the gate patterns. Using the gate patterns and the gate spacers as implantation masks, impurity ions are implanted into the semiconductor substrate to form high-concentration source/drain regions. The spacers are then selectively removed. An interlayer insulating layer is formed on the substrate where the spacers are removed.
    • 提供具有LDD型源极/漏极区域的半导体器件及其制造方法。 半导体器件包括设置在半导体衬底上的至少一对栅极图案和设置在栅极图案两侧的LDD型源极/漏极区域。 具有栅极图案和LDD型源极/漏极区域的衬底被保形蚀刻停止层覆盖。 蚀刻停止层被层间绝缘层覆盖。 LDD型源极/漏极区域通过穿透层间绝缘层和蚀刻停止层的接触孔露出。 形成LDD型源极/漏极区域和蚀刻停止层的方法包括在栅极图案的两侧形成低浓度源极/漏极区域,并在具有低浓度源/漏极区域的衬底上形成保形蚀刻停止层, 漏区。 然后在栅极图案的侧壁上形成栅极间隔物。 使用栅极图案和栅极间隔物作为注入掩模,将杂质离子注入到半导体衬底中以形成高浓度源极/漏极区域。 然后选择性地去除间隔物。 在基板上形成层间绝缘层,其中隔离物被去除。