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    • 42. 发明授权
    • Hierarchical bit line bias bus for block selectable memory array
    • 块可选存储阵列的分层位线偏置总线
    • US07633828B2
    • 2009-12-15
    • US11461362
    • 2006-07-31
    • Roy E. ScheuerleinLuca G. Fasoli
    • Roy E. ScheuerleinLuca G. Fasoli
    • G11C8/00
    • G11C16/08
    • Circuits and methods are described for decoding exemplary memory arrays of programmable and, in some embodiments, re-writable passive element memory cells, which are particularly useful for extremely dense three-dimensional memory arrays having more than one memory plane. In addition, circuits and methods are described for selecting one or more array blocks of such a memory array, for selecting one or more word lines and bit lines within selected array blocks, for conveying data information to and from selected memory cells within selected array blocks, and for conveying unselected bias conditions to unselected array blocks.
    • 描述了用于解码可编程的示例性存储器阵列的电路和方法,在一些实施例中,可重写无源元件存储器单元,其对于具有多于一个存储器平面的非常密集的三维存储器阵列特别有用。 此外,描述了用于选择这种存储器阵列的一个或多个阵列块的电路和方法,用于选择所选择的阵列块内的一个或多个字线和位线,用于将数据信息传送到选定的阵列块内的选定的存储器单元 并且用于将未选择的偏置条件传送到未选择的阵列块。
    • 45. 发明授权
    • Apparatus for reading a multi-level passive element memory cell array
    • 用于读取多级无源元件存储单元阵列的装置
    • US07542337B2
    • 2009-06-02
    • US11461343
    • 2006-07-31
    • Roy E. ScheuerleinTyler J. ThorpLuca G. Fasoli
    • Roy E. ScheuerleinTyler J. ThorpLuca G. Fasoli
    • G11C16/04
    • G11C11/56G11C13/004G11C13/0069G11C2013/0054G11C2013/009G11C2213/77
    • A four level passive element cell has memory states corresponding to decreasing resistance levels, which are preferably mapped respectively to data states 11, 01, 00, and 10. The LSB and MSB are preferably mapped as part of different pages. To discriminate between memory cell states, the selected bit line current is sensed for at least two different combinations of reference current level and read bias voltage. A mid-level reference is used to read the LSB. When reading the MSB, a first reference between the 10 and 00 data states, and a second reference between 01 and 11 data states may be used, and the mid-level reference need not be used. In certain embodiments, the bit line current may be simultaneously compared against the first and second references, without requiring a delay to stabilize the bit line current to a different value, and the MSB generated accordingly.
    • 四级无源元件单元具有对应于降低电阻电平的存储器状态,其优选地分别映射到数据状态11,01,00和10. LSB和MSB优选地被映射为不同页面的一部分。 为了区分存储单元状态,对于参考电流电平和读取偏置电压的至少两种不同的组合来检测所选择的位线电流。 中间级参考用于读取LSB。 当读取MSB时,可以使用10和00数据状态之间的第一个参考,并且可以使用01和11数据状态之间的第二个参考,并且不需要使用中间级参考。 在某些实施例中,位线电流可以同时与第一和第二参考值进行比较,而不需要延迟来将位线电流稳定到不同的值,并且相应地生成MSB。
    • 48. 发明授权
    • Method for using a multiple polarity reversible charge pump circuit
    • 使用多极性可逆电荷泵电路的方法
    • US07495500B2
    • 2009-02-24
    • US11618838
    • 2006-12-31
    • Ali K. Al-ShammaRoy E. Scheuerlein
    • Ali K. Al-ShammaRoy E. Scheuerlein
    • G05F1/10
    • H02M3/073H02M2003/071H02M2003/077
    • A multiple polarity reversible charge pump circuit is disclosed which, in certain embodiments, may be configured to generate a positive voltage at times and may be reversed to generate a negative voltage at other times. Such a charge pump circuit is advantageous if both the positive and negative voltage are not simultaneously required. In certain other embodiments, a charge pump circuit generates a high output current for only a positive boosted voltage in one mode of operation, but lower current positive and negative boosted voltage outputs in another mode of operation. Use with certain erasable memory array technologies is disclosed, particularly certain resistive passive element memory cells, and more particularly in a three-dimensional memory array.
    • 公开了一种多极性可逆电荷泵电路,其在某些实施例中可被配置为有时产生正电压并且可以反向以在其它时间产生负电压。 如果不同时需要正电压和负电压,则这种电荷泵电路是有利的。 在某些其他实施例中,电荷泵电路仅在一种工作模式下产生仅仅正升压电压的高输出电流,而在另一种工作模式下产生较低电流正和负升压电压输出。 公开了某些可擦除存储器阵列技术的使用,特别是某些电阻性无源元件存储单元,更具体地在三维存储器阵列中使用。
    • 49. 发明申请
    • OPTIMIZATION OF CRITICAL DIMENSIONS AND PITCH OF PATTERNED FEATURES IN AND ABOVE A SUBSTRATE
    • 关键尺寸的优化和基板上及以上图案特征的优化
    • US20080310231A1
    • 2008-12-18
    • US12136766
    • 2008-06-10
    • James M. CleevesRoy E. Scheuerlein
    • James M. CleevesRoy E. Scheuerlein
    • G11C11/34H01L27/092
    • H01L27/105H01L23/528H01L2924/0002H01L2924/00
    • A die is formed with different and optimized critical dimensions in different device levels and areas of those device levels using photolithography and etch techniques. One aspect of the invention provides for a memory array formed above a substrate, with driver circuitry formed in the substrate. A level of the memory array consists of, for example, parallel rails and a fan-out region. It is desirable to maximize density of the rails and minimize cost of lithography for the entire memory array. This can be achieved by forming the rails at a tighter pitch than the CMOS circuitry beneath it, allowing cheaper lithography tools to be used when forming the CMOS, and similarly by optimizing lithography and etch techniques for a device level to produce a tight pitch in the rails, and a more relaxed pitch in the less-critical fan-out region.
    • 在使用光刻和蚀刻技术的不同器件级别和那些器件级别的区域中,使用不同且优化的临界尺寸形成管芯。 本发明的一个方面提供了形成在衬底上的存储器阵列,其中驱动电路形成在衬底中。 存储器阵列的一个级别包括例如平行轨道和扇出区域。 希望使轨道的密度最大化并最小化整个存储器阵列的光刻成本。 这可以通过以比它下面的CMOS电路更紧的间距形成轨道来实现,从而允许在形成CMOS时使用更便宜的光刻工具,并且类似地通过优化用于器件级别的光刻和蚀刻技术以在 轨道,并且在不太关键的扇出区域更放松。