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    • 43. 发明申请
    • HDD PATTERN APPARATUS USING LASER, E-BEAM, OR FOCUSED ION BEAM
    • 使用激光,电子束或聚焦离子束的硬盘图案设备
    • WO2010120725A2
    • 2010-10-21
    • PCT/US2010/030823
    • 2010-04-13
    • APPLIED MATERIALS, INC.FOAD, Majeed A.MOFFATT, Stephen
    • FOAD, Majeed A.MOFFATT, Stephen
    • G11B5/84G11B5/82G11B5/73
    • G03B27/42G11B5/8404H01F10/187H01F41/34
    • A method and apparatus for manufacturing magnetic storage media is provided. A structural substrate is coated with a magnetically active material, and a magnetic pattern is formed in the magnetically active material by treating portions of the material with energy from a laser, e-beam, or focused ion beam. The beam may be divided into a packet of beamlets by passing the beam through a divider, which may be a diffraction grating for laser energy, a thin film single crystal for electrons, or a perforated plate for ions, or the beam may be generated by an array of emitters. The beamlets are then focused to a desired dimension and distribution by optics or electric fields. The resulting beam packet may be shaped further by passing through an aperture of any desired shape. The resulting beam may be applied sequentially to exposure zones to treat an entire substrate or plurality of substrates.
    • 提供了一种用于制造磁存储介质的方法和装置。 用磁性活性材料涂覆结构基材,通过用激光,电子束或聚焦离子束的能量处理材料的部分,在磁性活性材料中形成磁性图案。 通过将光束通过分隔器(可以是用于激光能量的衍射光栅),用于电子的薄膜单晶或用于离子的多孔板,可以将光束分成束分束,或者可以通过 一组发射器。 然后通过光学或电场将子束聚焦到期望的尺寸和分布。 所得到的束束可以进一步通过穿过任何所需形状的孔。 所得到的光束可以顺序施加到曝光区域以处理整个基板或多个基板。
    • 48. 发明申请
    • METHOD FOR MEASURING DOPANT CONCENTRATION DURING PLASMA ION IMPLANTATION
    • 测量等离子体离子注入过程中掺杂剂浓度的方法
    • WO2010019283A2
    • 2010-02-18
    • PCT/US2009/034995
    • 2009-02-24
    • APPLIED MATERIALS, INC.FOAD, Majeed A.LI, Shijian
    • FOAD, Majeed A.LI, Shijian
    • H01L21/66H01L21/265
    • G01N21/68G01N21/59H01L21/26513H01L22/12H01L22/26
    • Embodiments of the invention generally provide methods for end point detection at predetermined dopant concentrations during plasma doping processes. In one embodiment, a method includes positioning a substrate within a process chamber, generating a plasma above the substrate and transmitting a light generated by the plasma through the substrate, wherein the light enters the topside and exits the backside of the substrate, and receiving the light by a sensor positioned below the substrate. The method further provides generating a signal proportional to the light received by the sensor, implanting the substrate with a dopant during a doping process, generating multiple light signals proportional to a decreasing amount of the light received by the sensor during the doping process, generating an end point signal proportional to the light received by the sensor once the substrate has a final dopant concentration, and ceasing the doping process.
    • 本发明的实施例通常提供用于在等离子体掺杂工艺期间在预定掺杂剂浓度下进行终点检测的方法。 在一个实施例中,一种方法包括:将衬底放置在处理室内,在衬底上方产生等离子体,并将由等离子体产生的光透过衬底,其中光进入顶面并离开衬底的背面, 由位于基板下方的传感器发出的光。 该方法还提供产生与传感器接收的光成比例的信号,在掺杂过程期间用掺杂剂注入衬底,产生与在掺杂过程期间由传感器接收的光的减少量成比例的多个光信号,产生 一旦衬底具有最终掺杂剂浓度,则终止点信号与由传感器接收的光成比例,并停止掺杂过程。