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31. 发明专利

GB1389119A ELECTRON-BEAM MICROANALYSER APPARATUS 未知
公开(公告)号：GB1389119A
公开(公告)日：1975-04-03
申请号：GB4720672
申请日：1972-10-12
申请人： SIEMENS AG
IPC分类号： G01N23/227 , G01Q30/08 , G01Q30/16 , H01J37/073 , H01J37/252 , H01J37/256 , H01J49/48 , H01J37/26
摘要： 1389119 Electron beam apparatus SIEMENS AG 12 Oct 1972 [14 Oct 1971] 47206/72 Heading H1D An electron beam microanalyser includes a field-emission cathode 2, an anode 10 and an electrode 17 providing a decelerating field in chamber 14, the electron beam causing the emission of Auger electrons from a sample 19 which are analysed in a hemispherical electrostatic analyser 23. The analyser consists of a first lattice 24 and a second lattice 25 between which a variable voltage source 26 is connected, the source being adjusted to a voltage appropriate to the energy of the Auger electrons being investigated. A modulating voltage is applied between the sample and lattice 24 from an oscillator 29 and transformer 30. A modulated voltage output is taken via capacitor 32 to a detection unit 33. A picture tube 34 scanned in synchronism with the scanning coils 36 of the electron beam is used to display the output. Figs. 2, 4 and 6 (not shown) show modified electron optical systems which have reduced aberrations, variable focal length and a "zoom" lens effect whereby the focal length of the lens can be maintained while varying the potentials on the electrode elements.

33. 发明专利

DE2050763A1 未知
公开(公告)号：DE2050763A1
公开(公告)日：1971-05-13
申请号：DE2050763
申请日：1970-10-15
申请人： WESTINGHOUSE ELECTRIC CORP
IPC分类号： H01L21/027 , F15C5/00 , G01Q30/08 , G03F7/20 , H01J37/302 , H01L21/00 , H01L23/29 , C23F1/02

34. 发明公开

EP3835797A1 MAGNET DEVICE 审中-公开
公开(公告)号：EP3835797A1
公开(公告)日：2021-06-16
申请号：EP19215280.9
申请日：2019-12-11
申请人： Université de Genève
发明人： Kuzmenko, Alexey , Poumirol, Jean-Marie
IPC分类号： G01Q30/08 , G02B21/24 , H01F7/02
摘要： The present relates to a magnet device comprising a first magnet received in a second magnet. The first magnet and said second magnet have complementary conical shapes so that said first magnet is arranged for being received in said second magnet. The second magnet has an opening leading to said first magnet when said first magnet is received in said second magnet. When the first magnet is received in the second magnet, the first magnet and the second magnet are oppositely magnetized, and the first magnet, the second magnet and the opening are aligned along a longitudinal axis of the magnet device, so that the magnetic device generates a magnetic field from the opening.
The invention further relates to a microscope comprising said magnet device and a method for retrofitting a microscope instrument using said magnet device.

35. 发明公开

EP1762838A4 SAMPLE STAND ARRANGEMENT FOR SCANNING TYPE PROBE MICROSCOPE 审中-公开
标题翻译：样品架安排STM
公开(公告)号：EP1762838A4
公开(公告)日：2007-06-13
申请号：EP06756443
申请日：2006-05-22
申请人： OLYMPUS CORP
发明人： YAGI AKIRA
IPC分类号： G01N1/28 , G01Q30/08 , G01Q30/20 , G01Q60/24
CPC分类号： G01Q30/20
摘要： A sample stand arrangement (10), wherein ten sample stands (12) are integrally held by a crosslinked portions (14) and the left end part of a glass plate (GP). The sample stand arrangement board (10) is manufactured by cutting out the glass plate (GP). All the sample stands (12) are arranged so that their sample fixing faces (12a) can share a same plane.

36. 发明公开

EP1034557A4 RADIOFREQUENCY GASEOUS DETECTION DEVICE (RF-GDD) 审中-公开
标题翻译：射频气体探测装置
公开(公告)号：EP1034557A4
公开(公告)日：2007-01-17
申请号：EP98955259
申请日：1998-11-18
申请人： DANILATOS GERASIMOS DANIEL
发明人： DANILATOS GERASIMOS DANIEL
IPC分类号： G01Q30/08 , G01Q60/02 , H01J37/244 , H01J47/06 , G01N23/225 , H01J37/28
CPC分类号： H01J37/244 , H01J47/06

37. 发明申请

WO02058102A2 ADJUSTABLE CONDUCTANCE LIMITING APERTURE FOR ION IMPLANTERS 审中-公开
标题翻译：可调节导线限制离子植入物的孔
公开(公告)号：WO02058102A2
公开(公告)日：2002-07-25
申请号：PCT/US2002/001164
申请日：2002-01-16
IPC分类号： G01Q30/08 , H01J37/16 , H01J37/317 , H01L21/265 , H01J37/18
CPC分类号： H01J37/16 , H01J37/3171 , H01J2237/045 , H01J2237/188
摘要： A charged particle beam apparatus includes a charged particle beam source for directing a charged particle beam along a beam path in a downstream direction to a traget, and a processing station that defines a target chamber. The processing station includes a chamber divider which divides the target chamber into upstream and downstream regions during charged particle beam processing of the target, the target being located in the downstream region. The divider has an aperture therethrough sized to permit passage of the ion beam to the target without substantial blockage and to limit backflow of gas into the upstream region of the chamber. The divider minimizes the beam volume which is exposed to extraneous species generated at the target and thereby reduces the probability of beam-altering collisions.
摘要翻译：带电粒子束装置包括用于将带电粒子束沿着沿下游方向的光束路径引导到三极管的带电粒子束源，以及限定目标腔室的处理站。处理站包括一个室分隔器，其在靶的带电粒子束处理期间将目标室分成上游和下游区域，目标位于下游区域。分隔器具有穿过其中的孔，其尺寸允许离子束通过靶，而不会实质阻塞，并限制气体回流到腔室的上游区域。分隔器最小化暴露于在目标处产生的外来物种的光束体积，从而降低光束变化碰撞的可能性。

38. 发明申请

WO02011150A1 METHOD AND DEVICE FOR CHECKING AND EXAMINING THE INSIDE SURFACE OF NUCLEAR AND THERMONUCLEAR ASSEMBLIES 审中-公开
标题翻译：用于检查和检查核和组件的内表面的方法和装置
公开(公告)号：WO02011150A1
公开(公告)日：2002-02-07
申请号：PCT/RU2001/000309
申请日：2001-07-25
IPC分类号： G01Q30/08 , G21C1/30 , G21C17/01 , H01J37/26 , H01J37/28
CPC分类号： G21C17/01 , G01Q70/02 , G21C1/303 , G21Y2002/20 , G21Y2002/30 , G21Y2002/40 , G21Y2004/30 , G21Y2004/40 , Y02E30/40
摘要： The invention relates to nuclear engineering, in particular to a method and a device for checking and examining a surface inside the experimental channels of nuclear and thermonuclear assemblies. Examination of the surface is carried out during a radiation and thereafter. Said examination is carried out for various operating regimes of a probe scanning microscope by selecting a probing device and a regime corresponding thereto. Afterwards, pictures of various surface characteristics thus obtained are analysed, making it possible to conclude with respect to the degree and dynamics of a radiation effect. The probe scanning microscope comprises a computer provided with a control plate and a measuring head of the probe scanning microscope. Said measuring head comprises a cylindrical body (1) fitted with abutments (4), a scanning unit, an electronic block (3), a data channel (2), a camera-recorder (5), lights (6) and a fixing mechanism.
摘要翻译：本发明涉及核工程，特别涉及用于检查和检查核和热核组件的实验通道内的表面的方法和装置。在辐射期间进行表面的检查。通过选择探测装置和对应的状态，对探针扫描显微镜的各种操作方式进行所述检查。然后，分析由此获得的各种表面特征的图像，使得可以关于辐射效应的程度和动力学得出结论。探针扫描显微镜包括具有控制板的计算机和探针扫描显微镜的测量头。所述测量头包括装配有基台（4）的圆柱体（1），扫描单元，电子块（3），数据通道（2），照相机记录器（5），灯（6）和固定机制。

40. 发明公开

EP1080481A4 DISSOLUTION STAGE FOR AN ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 审中-公开
标题翻译：溶解样品台与控制的环境中的电子显微法
公开(公告)号：EP1080481A4
公开(公告)日：2003-01-02
申请号：EP99924453
申请日：1999-05-21
申请人： EURO CELTIQUE SA
发明人： MITCHELL JAMES A , PALERMO PHILIP J
IPC分类号： G01Q30/04 , G01Q30/08 , H01J37/00 , H01J37/18 , H01J37/20 , H01J37/252 , H01J37/26 , H01J37/28
CPC分类号： G01N23/2204 , H01J37/20 , H01J37/28 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/2005 , H01J2237/204 , H01J2237/206 , H01J2237/2605

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