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    • 31. 发明申请
    • Method of testing liquid crystal display cells and apparatus for the same
    • 液晶显示单元的测试方法及其设备
    • US20030193347A1
    • 2003-10-16
    • US10409047
    • 2003-04-09
    • Kabushiki Kaisha Toshiba
    • Minoru ItoNobuo Konda
    • G01R031/00
    • G02F1/1309
    • A plurality of liquid crystal display cells in a test unit are driven to display a series of test image patterns. When some of the liquid crystal display cells are judged to function poorly or completely good, they are controlled to display a predetermined image pattern, so that an inspection person can stop further testing them and focus testing on other liquid crystal display cells. Where some of the other liquid crystal display cells are then judged to function poorly or completely good, they are controlled to display the same pattern as such a predetermined image pattern. Thus, since the inspector can test such liquid crystal display cells as required to check, the testing efficiency is significantly improved.
    • 驱动测试单元中的多个液晶显示单元以显示一系列测试图像图案。 当某些液晶显示单元被判断为功能不好或完全良好时,它们被控制以显示预定的图像图案,使得检查人员可以停止进一步测试它们并且将测试聚焦在其他液晶显示单元上。 然后当其中一些其它液晶显示单元被判断为功能不好或完全良好时,它们被控制以显示与这种预定图像图案相同的图案。 因此,由于检查者可以根据需要对这样的液晶显示单元进行检查,因此显着提高了检测效率。
    • 36. 发明申请
    • Liquid crystal display panel for testing line on glass type signal lines
    • 液晶显示面板,用于玻璃式信号线上的测试线
    • US20030117165A1
    • 2003-06-26
    • US10299791
    • 2002-11-20
    • Dae Hong Kim
    • G01R031/00
    • G09G3/006G02F2001/136254
    • A liquid crystal display panel for making a LOG-type signal line test for detecting a short imperfection with a LOG-type signal line group even upon shorting of a shorting bar. In the panel, a picture display part has a plurality of liquid crystal cells, each of which is arranged at each intersection area between gate lines and data lines. Line on glass type signal lines are provided at an outer area of the picture display part by a line on glass system to apply signals required for driving external drive integrated circuits. At least two gate-shorting bars apply a test signal by separating the gate lines into two groups and separating partial signal lines of the line on glass type signal lines into at least two groups. At least two data shorting bars apply a test signal by separating the data lines into two groups and separating the remaining signal lines of the line on glass type signal lines into at least two groups.
    • 一种液晶显示面板,用于进行LOG型信号线测试,以便即使在短路时也能用LOG型信号线组检测短缺陷。 在面板中,图像显示部分具有多个液晶单元,每个液晶单元布置在栅极线和数据线之间的每个交叉区域。 玻璃线型信号线通过玻璃系统上的线路设置在图像显示部分的外部区域,以施加驱动外部驱动集成电路所需的信号。 至少两个栅极短路棒通过将栅极线分成两组并将玻璃类型信号线上的线的部分信号线分成至少两组来施加测试信号。 至少两个数据短路棒通过将数据线分成两组并将玻璃类型信号线上的线的剩余信号线分成至少两组来施加测试信号。
    • 37. 发明申请
    • Test fixture with adjustable pitch for network measurement
    • 测试夹具具有可调节距,用于网络测量
    • US20030115008A1
    • 2003-06-19
    • US10033587
    • 2001-12-18
    • Yutaka Doi
    • G06F019/00G01R031/00
    • G01R1/06772
    • A calibrated vector network analyzer (VNA) test system comprising two variable pitch test heads coupled to a VNA. A method for measuring the scattering parameters of at least one two port device under test (DUT) comprising: providing two variable pitch test heads, each test head comprising a signal arm and a ground arm and a cable electrically coupling the test head to a vector network analyzer (VNA); electrically coupling the signal arms of the test heads together; electrically coupling the ground arms of the test heads together; and utilizing the VNA to measure four scattering parameters of a network comprising the coupled test heads; electrically isolating the signal and ground arms of one of the two test heads from those of the other of the two test heads and using the VNA to obtain a reflect coefficient for each test head while the pitch of each test head is set to desired pitch of a port of the at least one DUT; placing each of the test heads in contact with a micro-strip circuit and utilizing the VNA to measure four scattering parameters of the network formed by placing the test heads in contact with the micro-strip circuit; utilizing the measured values to solve a set of 9 equations, the 9 equations containing 9 variables of which 1 is a propagation constant, and 8 are scattering parameters, utilizing the calibrated VNA to measure at least one scattering parameter of the at least one DUT. A method for measuring the scattering parameters of at least one two port DUT comprising: utilizing six reflection coefficients, four transmission coefficients, and a propagation constant to calibrate a VNA having two variable pitch test heads; utilizing the calibrated VNA to measure at least one scattering parameter of the at least one two port DUT.
    • 校准矢量网络分析仪(VNA)测试系统,包括耦合到VNA的两个变桨距测试头。 一种用于测量被测试的至少一个两端口设备(DUT)的散射参数的方法,包括:提供两个可变俯仰测试头,每个测试头包括信号臂和接地臂以及将测试头电连接到矢量 网络分析仪(VNA); 将测试头的信号臂电耦合在一起; 将测试头的接地臂电耦合在一起; 并利用VNA来测量包括耦合测试头的网络的四个散射参数; 将两个测试头中的一个的信号和接地臂与两个测试头中的另一个测试头的信号和接地臂电隔离,并使用VNA获得每个测试头的反射系数,同时将每个测试头的间距设置为所需的间距 所述至少一个DUT的端口; 将每个测试头与微带电路接触并利用VNA来测量通过将测试头与微带电路接触而形成的网络的四个散射参数; 利用测量值来求解一组9个方程,9个方程包含9个变量,其中1是传播常数,8是散射参数,利用校准的VNA来测量至少一个DUT的至少一个散射参数。 一种用于测量至少一个两端口DUT的散射参数的方法,包括:利用六个反射系数,四个透射系数和传播常数来校准具有两个可变螺距测试头的VNA; 利用校准的VNA来测量至少一个两端口DUT的至少一个散射参数。