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    • 31. 发明公开
    • Multibit memory device
    • 多位存储设备
    • EP1315170A3
    • 2004-07-14
    • EP02258092.2
    • 2002-11-25
    • Hewlett-Packard Company
    • Sharma, ManishTran,Lung T.
    • G11C11/56G11C11/15
    • H01L27/224G11C11/005G11C11/16G11C11/56G11C11/5607G11C11/5671G11C17/16G11C2216/26
    • A memory device (50) includes memory cells (130, 230) having re-writeable element (134, 234) and a write-once element (136, 236) in series with the re-writeable element (134, 234), the re-writeable element (134, 234) being programmable between a high resistance state and a low resistance state. The write-once element (136, 236) can be an anti-fuse element that is programmable from a high resistance state to a low resistance state, or a fuse element that is programmable from a low resistance state to a high resistance state. The two possible states for the re-writeable element (134, 234) and the two possible states for the write-once element (136, 236) allow the memory cells (130, 230) to store four different bits.
    • 存储器件(50)包括具有可重写元件(134,234)和与可重写元件(134,234)串联的一次写入元件(136,236)的存储器单元(130,230),所述 可重写元件(134,234)可在高电阻状态和低电阻状态之间编程。 一次写入元件(136,236)可以是可从高电阻状态编程到低电阻状态的反熔丝元件,或者是可从低电阻状态编程到高电阻状态的熔丝元件。 用于可重写元件(134,234)的两种可能状态和用于一次写入元件(136,236)的两种可能状态允许存储器单元(130,230)存储四个不同的位。
    • 36. 发明申请
    • ONE-TIME PROGRAMMABLE MEMORY DEVICE AND METHODS THEREOF
    • 一次可编程存储器件及其方法
    • WO2011059645A2
    • 2011-05-19
    • PCT/US2010/053205
    • 2010-10-19
    • FREESCALE SEMICONDUCTOR, INC.STRAUSS, Timothy, J.TAYLOR, Kelly, K.
    • STRAUSS, Timothy, J.TAYLOR, Kelly, K.
    • G11C16/10G11C16/22G11C16/26G11C16/3459G11C2216/26
    • A portion of a programmable memory device (104) is configured as a one-time programmable (OTP) memory, where in response to a write access to the memory device, a memory controller (118) determines whether the write access is associated with a memory location designated as an OTP memory location (404). If so, the memory controller performs a read of the memory location (408), and allows the write access only if each memory cell of the memory location is in an un-programmed state (410). Thus, only a single write access to an OTP memory location is permitted, and subsequent write attempts are disallowed. Further, to enhance detection of programmed cells, the read of the OTP memory location is performed with a lower read voltage than a read voltage associated with a write access (407) to a non-OTP memory location, thereby improving detection of programmed memory cells in the OTP memory location.
    • 可编程存储器件(104)的一部分被配置为一次性可编程(OTP)存储器,其中响应于对存储器件的写入访问,存储器控制器(118)确定写访问是否与 指定为OTP存储器位置的存储器位置(404)。 如果是,存储器控制器执行存储器位置(408)的读取,并且仅当存储器位置的每个存储器单元处于未编程状态时才允许写访问(410)。 因此,只允许对OTP存储器位置的单个写入访问,并且不允许后续写入尝试。 此外,为了增强对编程单元的检测,以比与非OTP存储器位置的写访问(407)相关联的读取电压更低的读取电压执行OTP存储器位置的读取,由此改进对编程的存储器单元的检测 在OTP内存位置。
    • 37. 发明申请
    • TWO-COMPONENT, RECTIFYING-JUNCTION MEMORY ELEMENT
    • 双组分,修复连接记忆元件
    • WO2005053002A3
    • 2007-10-18
    • PCT/US2004039749
    • 2004-11-26
    • UNIV PRINCETON
    • SMITH SHAWNFORREST STEPHEN R
    • H01L35/24G11C13/00G11C13/02G11C17/16H01L20060101H01L27/28H01L51/00H01L51/05H01L51/30
    • H01L51/0587B82Y10/00G11C13/0009G11C13/0014G11C13/0016G11C17/16G11C2213/72G11C2216/26H01L27/285H01L51/0037
    • Embodiments of the present invention are directed to low complexity, efficient, two-component memory elements for use in low-cost, robust, and reliable WORM memories. The memory element of one embodiment is an organic-on-inorganic heterojunction diode comprising an organic-polymer layer joined to a doped, inorganic semiconductor layer. The organic polymer layer serves both as one later of a two-later, semiconductor-based diode, as well as a fuse. Application of a voltage greater than a threshold WRITE voltage for a period of time greater than a threshold time interval for a WRITE-voltage pulse irreversibly and dramatically increases the resistivity of the organic polymer layer. The memory element that represents one embodiment of the present invention is more easily manufactured than previously described, separate-fuse-and-diode memory elements, and has the desirable characteristics of being switchable at lower voltages and with significantly shorter-duration WRITE-voltage pulses than the previously described memory elements.
    • 本发明的实施例涉及用于低成本,稳健和可靠的WORM存储器的低复杂度,高效率的双分量存储器元件。 一个实施方案的存储元件是无机异源结二极管,其包含连接到掺杂的无机半导体层的有机聚合物层。 有机聚合物层同时用作两个以后的半导体二极管以及一个保险丝。 对于写电压脉冲施加大于阈值写入电压的时间大于阈值时间间隔的时间段,并且显着增加有机聚合物层的电阻率。 代表本发明的一个实施例的存储元件比先前描述的更容易制造,分离的熔丝和二极管存储元件,并且具有可在较低电压下切换并具有显着更短持续时间的写电压脉冲的期望特性 比之前描述的存储器元件。
    • 39. 发明公开
    • ONE-TIME PROGRAMMABLE MEMORY DEVICE AND METHODS THEREOF
    • VERFAHRENDAFÜR的EINMAL PROGRAMMIBARE SPEICHERVORRICHTUNG
    • EP2494450A4
    • 2015-08-19
    • EP10830402
    • 2010-10-19
    • FREESCALE SEMICONDUCTOR INC
    • STRAUSS TIMOTHY JTAYLOR KELLY K
    • G06F13/10G06F13/14G11C16/08G11C16/10G11C16/22G11C16/26G11C16/34
    • G11C16/10G11C16/22G11C16/26G11C16/3459G11C2216/26
    • A portion of a programmable memory device is configured as a one-time programmable (OTP) memory, where in response to a write access to the memory device, a memory controller determines whether the write access is associated with a memory location designated as an OTP memory location. If so, the memory controller performs a read of the memory location, and allows the write access only if each memory cell of the memory location is in an un-programmed state. Thus, only a single write access to an OTP memory location is permitted, and subsequent write attempts are disallowed. Further, to enhance detection of programmed cells, the read of the OTP memory location is performed with a lower read voltage than a read voltage associated with a write access to a non-OTP memory location, thereby improving detection of programmed memory cells in the OTP memory location.
    • 可编程存储器件的一部分被配置为一次性可编程(OTP)存储器,其中响应于对存储器件的写入访问,存储器控制器确定写访问是否与指定为OTP的存储器位置相关联 内存位置。 如果是这样,则存储器控制器执行对存储器位置的读取,并且仅当存储器位置的每个存储器单元处于非编程状态时才允许写访问。 因此,只允许对OTP存储器位置的单个写入访问,并且不允许后续的写入尝试。 此外,为了增强对编程单元的检测,OTP存储器位置的读取以比与非OTP存储器位置的写入访问相关联的读取电压更低的读取电压来执行,从而改进对OTP中的编程存储器单元的检测 内存位置。