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    • 37. 发明申请
    • LAYER TRANSFER WITH REDUCTION OF POST-FRACTURE ROUGHNESS
    • 具有减少断裂韧性的层转移
    • WO2009089969A1
    • 2009-07-23
    • PCT/EP2008/067318
    • 2008-12-11
    • S.O.I. TEC SILICON ON INSULATOR TECHNOLOGIESPERSONNIC, SébastienBOURDELLE, Konstantin
    • PERSONNIC, SébastienBOURDELLE, Konstantin
    • H01L21/762
    • H01L21/76254
    • The invention provides a method of transferring a layer of a donor substrate onto a receiving substrate, the method comprising : a first step (S10) for hydrogen ions into the donor substrate intended to form a layer of microcavities or platelets; a secondstep (S12) of implanting ions; a step (S13) for bonding the face of the donor substrate with a face of the receiving substrate; a step (S14) for detachment to cause splitting at the layer of microcavities or platelets formed in the donor substrate. The method further comprises, between the two implantation steps, a step (S11) for priming anneal heat treatment carried out at a temperature in the range 300°C to 700°C and for a duration that is less than 10% of the duration necessary to cause splitting at the layer of microcavities or platelets formed in the donor substrate at the temperature employed during said priming anneal heat treatment.
    • 本发明提供了一种将供体衬底的层转移到接收衬底上的方法,所述方法包括:用于形成一个微腔或血小板层的氢离子进入供体衬底的第一步骤(S10) 第二步(S12)注入离子; 用于将所述供体衬底的表面与所述接收衬底的表面接合的步骤(S13); 用于分离以在形成在供体衬底中的微腔或血小板层分裂的步骤(S14)。 该方法还包括在两个注入步骤之间的步骤(S11),用于在300℃至700℃的温度下进行退火热处理并持续时间小于所需持续时间的10% 以在所述起动退火热处理期间使用的温度在所述供体基底中形成的微腔或血小板层处分裂。