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    • 31. 发明授权
    • LCD device having pit region in top of protrusion structure for axisymmetrically aligning liquid crystal molecules
    • 液晶显示装置具有用于轴对称取向液晶分子的突起结构顶部的凹坑区域
    • US06327016B1
    • 2001-12-04
    • US09406782
    • 1999-09-28
    • Nobuaki YamadaTakashi KuriharaMasato Imai
    • Nobuaki YamadaTakashi KuriharaMasato Imai
    • G02F11337
    • G02F1/133707G02F1/1393
    • A liquid crystal display includes a first substrate having a substrate surface, a second substrate disposed facing the first substrate, a liquid crystal layer having liquid crystal molecules, interposed between the first and second substrates, a protrusion-like structure provided on the substrate surface facing the liquid crystal layer, and a vertical alignment layer provided on the first substrate so as to cover the protrusion-like structure. The liquid crystal layer is divided by the protrusion-like structure into a plurality of liquid crystal regions. The liquid crystal molecules have negative dielectric anisotropy and, in the presence of an applied voltage, are aligned axially symmetrically within at least one of the plurality of liquid crystal regions about an axis substantially perpendicular to the substrate surface. The protrusion-like structure includes a side wall sloped with respect to the substrate surface, and a pit region in a top portion of the protrusion-like structure.
    • 液晶显示器包括具有基板表面的第一基板,与第一基板相对设置的第二基板,设置在第一和第二基板之间的具有液晶分子的液晶层,设置在基板表面上的突起状结构 液晶层和设置在第一基板上以覆盖突起状结构的垂直取向层。 液晶层被突起状结构分成多个液晶区域。 液晶分子具有负的介电各向异性,并且在存在施加的电压的情况下,在多个液晶区域中的至少一个中基本上垂直于衬底表面的轴线对称地对准。 突起状结构包括相对于基板表面倾斜的侧壁和突起状结构的顶部中的凹坑区域。
    • 36. 发明授权
    • Method and apparatus distribution power suply pad of semiconductor integrated circuit
    • 半导体集成电路的方法和装置配电电源板
    • US07454724B2
    • 2008-11-18
    • US10823649
    • 2004-04-14
    • Takashi KuriharaKazutaka Takeuchi
    • Takashi KuriharaKazutaka Takeuchi
    • G06F17/50
    • G06F17/5036G06F17/5068
    • A method for accurately determining the provisional quantity and provisional locations of power supply pads prior to detailed layout of a semiconductor integrated circuit. The method decreases redesigning, shortens the design time, and lowers design costs. The method includes performing a power supply network analysis of the core section to obtain voltage values of the nodes, calculating current values between the nodes from the voltage values of the nodes and the resistances between the nodes, and calculating current values of the power supply pads from the current values between the nodes. The method further includes determining whether to eliminate or add a power supply pad depending on whether the current value of each power supply pad exceeds the current capacity of an associated IO buffer.
    • 一种用于在半导体集成电路的详细布局之前准确地确定电源焊盘的临时位置和临时位置的方法。 该方法减少了重新设计,缩短了设计时间,降低了设计成本。 该方法包括执行核心部分的电源网络分析以获得节点的电压值,从节点的电压值和节点之间的电阻计算节点之间的电流值,并计算电源焊盘的电流值 从节点之间的当前值。 该方法还包括根据每个电源焊盘的当前值是否超过相关联的IO缓冲器的当前容量来确定是否消除或添加电源焊盘。
    • 38. 发明授权
    • Diagnostic X-ray system
    • 诊断X射线系统
    • US07116752B2
    • 2006-10-03
    • US10659310
    • 2003-09-11
    • Tooru TakahashiTakashi Kurihara
    • Tooru TakahashiTakashi Kurihara
    • G01N23/04
    • A61B6/504A61B6/583
    • A region affected by X-ray beam limiting within a fluoroscopic image is specified based on position information on beam limiting by an X-ray beam limiting device. A judgment is made as to whether the region affected superposes a first brightness measuring region (region of interest) within the X-ray fluoroscopic image, and when superposition is not judged, automatic brightness control is performed based on the first brightness measuring region. When superposition is judged, the first brightness measuring region is transformed, and automatic brightness control is performed with reference to a second automatic brightness measuring region that does not superpose the region affected.
    • 基于X射线束限制装置的束限制的位置信息来指定在透视图像内受X射线束限制影响的区域。 判断受影响区域是否在X射线透视图像内叠加第一亮度测量区域(感兴趣区域),并且当未判断叠加时,基于第一亮度测量区域执行自动亮度控制。 当判断叠加时,变换第一亮度测量区域,参照不影响区域的第二自动亮度测量区域执行自动亮度控制。