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31. 发明授权

US07356742B2 Method and apparatus for testing a memory device in quasi-operating conditions 失效
标题翻译：用于在准操作条件下测试存储器件的方法和装置
公开(公告)号：US07356742B2
公开(公告)日：2008-04-08
申请号：US11107896
申请日：2005-04-18
申请人： Hideyuki Aoki , Takeshi Wada , Masaaki Namba , Noboru Uchida , Shigeki Katsumi , Yuji Wada , Masaaki Mochiduki
发明人： Hideyuki Aoki , Takeshi Wada , Masaaki Namba , Noboru Uchida , Shigeki Katsumi , Yuji Wada , Masaaki Mochiduki
IPC分类号： G11C29/00
CPC分类号： G11C29/56
摘要： A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer (PC). The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a signal distribution unit for distributing the signal taken out form the measurement PC unit; a plurality of performance boards (PFBs) mounted with respective objected products to be observed simultaneously by using the signals distributed by the signal distribution unit; a display panel for displaying the current status of the test that is being conducted; a power source for producing the operating voltage of the system; and a control PC for controlling the selection of test parameters and various analytical operations. The PC tester is adapted to take out the signal from the chipset LSI (large scale integrated circuit) on the PC mother board in the measurement PC unit to the individual memories on the memory module or the memory module per se and test them in quasi-operating conditions.
摘要翻译：记忆测试系统可以通过使用个人计算机（PC）在准操作条件下以低成本准确地屏蔽测试对象。该系统利用包括测量PC单元的PC测试器，该单元携带用作参考的存储器模块; 信号分配单元，用于分配从测量PC单元取出的信号; 通过使用由信号分配单元分配的信号同时观察安装有相应对象产品的多个性能板（PFB）; 用于显示正在进行的测试的当前状态的显示面板; 用于产生系统的工作电压的电源; 以及用于控制测试参数和各种分析操作的选择的控制PC。 PC测试器适用于将测量PC单元中的PC母板上的芯片组LSI（大规模集成电路）的信号从存储器模块或存储器模块本身的各个存储器中取出，运行条件。

32. 发明授权

US07200394B2 Information distribution service system based on predicted changes in location of mobile information terminal 有权
标题翻译：基于预测移动信息终端位置变化的信息分发服务系统
公开(公告)号：US07200394B2
公开(公告)日：2007-04-03
申请号：US10644305
申请日：2003-08-20
申请人： Hideyuki Aoki , Norio Murakami
发明人： Hideyuki Aoki , Norio Murakami
IPC分类号： H04Q7/20
CPC分类号： H04W64/00 , G08G1/0962 , H04L29/06 , H04L41/00 , H04L41/12 , H04L67/18 , H04L69/329
摘要： In an information distribution service system comprising a plurality of mobile information terminals, a computer system and a plurality of information-provider terminals, the computer system is provided with a user-information database for registration information categories provided for the mobile information terminals' users each serving as a recipient of an information distribution service rendered by the information distribution service system, an information-provider database for registering locations of the information-provider terminals and information to be distributed by the information-provider terminals as notifications, and a location management unit provided for the purpose of inferring changes in location of each mobile information terminal in a time series by using an inference formula provided in advance for predicting the particular mobile information terminal's moving direction and location on the basis of information on locations of the particular mobile information terminal.
摘要翻译：在包括多个移动信息终端，计算机系统和多个信息提供者终端的信息分发服务系统中，为计算机系统提供用于每个移动信息终端用户的注册信息类别的用户信息数据库作为由信息发布服务系统呈现的信息分发服务的接收者，用于将信息提供者终端的位置和由信息提供者终端分发的信息注册为通知的信息提供者数据库，以及位置管理单元提供的目的是通过使用预先提供的推定公式来基于关于特定移动信息的位置的信息来预测特定移动信息终端的移动方向和位置来推断每个移动信息终端的位置的变化终奌站。

33. 发明授权

US07024604B2 Process for manufacturing semiconductor device 失效
标题翻译：半导体器件制造工艺
公开(公告)号：US07024604B2
公开(公告)日：2006-04-04
申请号：US10274144
申请日：2002-10-21
申请人： Hideyuki Aoki
发明人： Hideyuki Aoki
IPC分类号： G11C29/00
CPC分类号： G11C29/006 , G11C16/04 , G11C29/48 , G11C2029/2602 , Y10T156/10
摘要： A semiconductor device manufacturing process which includes a test process that minimizes the test time for a single wafer, reduces the test cost and improves the throughput. The test system is made up of a wafer which includes plural chips formed with flash memories, a wafer level whole-surface contact device for contact with the whole surface of the wafer, a tester for testing electric characteristics of the wafer, and a BOST board interposed between the tester and the wafer level whole-surface contact device and with chip-by-chip control circuits mounted thereon. Where the test time differs depending on each chip in the wafer, the BOST board controls each test item for each chip so that in a parallel manner for the chips, upon completion of a preceding test, a shift is made to the next test.
摘要翻译：一种半导体器件制造方法，其包括使单个晶片的测试时间最小化的测试过程，降低了测试成本并提高了产量。测试系统由包括形成有闪存的多个芯片的晶片，与晶片整个表面接触的晶片级全表面接触装置，用于测试晶片的电特性的测试器和BOST板插入在测试器和晶片级全表面接触器件之间以及安装在其上的逐芯片控制电路。在测试时间根据晶片中的每个芯片而不同的情况下，BOST板控制每个芯片的每个测试项目，以便以平行方式为芯片，在完成前一测试之后，进行下一次测试。

34. 发明授权

US06978295B2 Server apparatus for space information service, space information service providing method, and charge processing apparatus and charging method for space information service 失效
标题翻译：空间信息服务的服务器装置，空间信息服务提供方法以及空间信息服务的计费处理装置和计费方法
公开(公告)号：US06978295B2
公开(公告)日：2005-12-20
申请号：US09941420
申请日：2001-08-28
申请人： Yoshinobu Meifu , Keiji Mizuma , Hideyuki Aoki
发明人： Yoshinobu Meifu , Keiji Mizuma , Hideyuki Aoki
IPC分类号： G06F13/00 , G06F17/30 , H04L29/06 , H04L29/08 , H04W8/18 , G06F15/16
CPC分类号： H04L67/16 , G06F17/3087 , H04L29/06 , H04L67/18 , H04L69/329 , H04W8/18
摘要： A server apparatus comprises an information bubble managing unit for managing bubble data (information bubble) in which space range information including position information in a real physical space is correlated with desired supply information, an extracting unit for extracting supply information of bubble data including retrieval object space range information based on position information on a user terminal, a providing unit for providing the extracted supply information to the user terminal, and an information bubble movement control unit for updating at least position information of the bubble data to virtually move the information bubble in the real physical space. In providing an information service, it is possible to retrieve and refer information in an analog-like operation closer to human sensation in the user terminal by using an information bubble virtually registered in the real physical space, and provide information to many and unspecified users with a less number of information bubbles.
摘要翻译：一种服务器装置，包括：信息气泡管理单元，用于管理气泡数据（信息气泡），其中包括真实物理空间中的位置信息的空间范围信息与期望的供应信息相关联;提取单元，用于提取包括检索对象的气泡数据的供应信息基于用户终端上的位置信息的空间范围信息，用于将提取的供应信息提供给用户终端的提供单元，以及信息气泡移动控制单元，用于至少更新气泡数据的位置信息以虚拟地移动信息气泡真实的物理空间。在提供信息服务时，可以通过使用虚拟地登记在真实物理空间中的信息气泡，在用户终端中更接近人类感觉的类似模拟操作中检索和引用信息，并且向许多和未指定的用户提供信息少量的信息气泡。

35. 发明授权

US06479305B2 Semiconductor device manufacturing method 失效
标题翻译：半导体器件制造方法
公开(公告)号：US06479305B2
公开(公告)日：2002-11-12
申请号：US09396732
申请日：1999-09-15
申请人： Ryuji Kono , Akihiko Ariga , Hideyuki Aoki , Hiroyuki Ohta , Yoshishige Endo , Masatoshi Kanamaru , Atsushi Hosogane , Shinji Tanaka , Naoto Ban , Hideo Miura
发明人： Ryuji Kono , Akihiko Ariga , Hideyuki Aoki , Hiroyuki Ohta , Yoshishige Endo , Masatoshi Kanamaru , Atsushi Hosogane , Shinji Tanaka , Naoto Ban , Hideo Miura
IPC分类号： H01L2166
CPC分类号： H01L21/6836 , H01L22/20 , H01L2221/68327 , H01L2924/0002 , H01L2924/014 , H01L2924/00
摘要： Semiconductor device chips manufacturing and inspecting method is disclosed in which a semiconductor wafer is cut into individual LSI chips. The LSI chips are rearranged and integrated into a predetermined number. The cut LSI chips are integrated in a jig having openings with a size commensurate with the dimensions of the LSI chip. At least one part of the jig having such openings has a coefficient of thermal expansion that is approximately equal to that of the LSI chips. The integrated predetermined number of chips are subjected to an inspection process in a subsequent inspection step thereby improving efficiency and reducing cost.
摘要翻译：半导体器件芯片制造和检查方法被公开，其中将半导体晶片切割成单独的LSI芯片。 LSI芯片重新排列并集成为预定数量。切割的LSI芯片集成在具有与LSI芯片的尺寸相当的尺寸的开口的夹具中。具有这种开口的夹具的至少一部分具有与LSI芯片大致相同的热膨胀系数。综合预定数量的芯片在随后的检查步骤中进行检查处理，从而提高效率并降低成本。

36. 发明授权

US4916977A Automatic transmission 失效
标题翻译：自动变速器
公开(公告)号：US4916977A
公开(公告)日：1990-04-17
申请号：US083498
申请日：1987-08-06
申请人： Hideyuki Aoki , Masakatsu Miura
发明人： Hideyuki Aoki , Masakatsu Miura
IPC分类号： F16H3/64 , F16H3/66 , F16H61/02 , F16H61/04 , F16H61/10 , F16H61/18
CPC分类号： F16H3/663 , F16H37/042
摘要： Automatic transmission including a main-transmission-mechanism consisting of two planetary gear units (three speed or four speed transmission mechanism for example) and a sub-transmission-mechanism consisting of one planetary gear unit (underdrive mechanism, for example). One speed and two speed for the whole transmission are obtained, with a low speed stage of the main-transmission-mechanism lower than two speed, by shifting the main-transmission-mechanism to one and two speed, respectively, while the sub-transmission-mechanism is kept at low speed (underdrive). And three speed for the whole transmission is obtained by shifting the sub-transmission-mechanism to high speed (direct coupling) while the main-transmission-mechanism is left at the two speed state. Further, four speed or five speed for the whole is obtained by shifting the main-transmission-mechanism to three speed or, if it is of four speed type, to four speed, respectively, while the sub-transmission-mechanism is kept at the high speed state.
摘要翻译：自动变速器包括由两个行星齿轮单元（例如三速或四速变速机构）构成的主变速机构和由一个行星齿轮单元（例如，低驱动机构）构成的副变速机构。通过将主传动机构分别移动到一档和两档，分别通过主传动机构的低速级低于两档来实现整个传动的一速和二速，而副传动机制保持在低速（低驱动）。而在主传动机构处于两速状态的同时，通过将副传动机构移动到高速（直接联接）来获得整个传动的三个速度。此外，通过将主变速机构分别变换为三速，或四速变速四档，将副变速机构分别保持在四速，高速状态

37. 发明授权

US4813301A Automatic transmission 失效
标题翻译：自动变速器
公开(公告)号：US4813301A
公开(公告)日：1989-03-21
申请号：US83495
申请日：1987-08-06
申请人： Hideyuki Aoki
发明人： Hideyuki Aoki
IPC分类号： F16H3/64 , F16H3/66 , F16H47/08 , F16H57/10
CPC分类号： F16H3/663 , F16H2200/0043 , F16H2200/2005
摘要： In an automatic transmission including a torque converter, the transmission mechanism is capable of performing lock-up function. The input side portion of a first clutch is coupled with the turbine of the torque converter, wherein the first clutch is in connection while the automatic transmission mechanism is in forward one, forward two and forward three speed, respectively. The input side portion of a third clutch is coupled with the impeller of the torque converter, wherein the third clutch is in cut-off during forward one and two speed and in connection during high speed stages (three speed and four speed, for instance).Thus, in low speed states (one speed and two speed), the torque is transferred through the oil flow of the torque converter, and in high speed states (three speed and four speed), the torque which is machanically coupled with the engine output shaft is transfered to the automatic transmission mechanism.
摘要翻译：在包括变矩器的自动变速器中，变速机构能够执行锁止功能。第一离合器的输入侧部分与变矩器的涡轮机连接，其中第一离合器分别连接在自动变速机构向前，前进两档和前进三档。第三离合器的输入侧部分与变矩器的叶轮耦合，其中第三离合器在前进一速度和第二速度期间被切断并且在高速级（例如三速和四速）期间连接，。因此，在低速状态（一速二速）下，扭矩通过变矩器的油流传递，在高速状态（三速四速）下，与发动机输出机械耦合的转矩轴被传送到自动变速机构。

38. 发明授权

US4722242A Automatic transmission 失效
标题翻译：自动变速器
公开(公告)号：US4722242A
公开(公告)日：1988-02-02
申请号：US833379
申请日：1986-02-26
申请人： Masakatsu Miura , Hideyuki Aoki
发明人： Masakatsu Miura , Hideyuki Aoki
IPC分类号： F16H3/44 , F16H3/66 , F16H57/02
CPC分类号： F16H3/663 , F16H2200/0043 , F16H2200/0047 , F16H2200/0052 , F16H2200/2005 , F16H2200/2007 , Y10T74/2186
摘要： A plurality of clutches are disposed at one place in the automatic transmission of the present invention to form a clutch portion, the clutch portion is disposed at a front end portion of the automatic transmission mechanism portion, an annexed transmission part is disposed at a position adjacent to the automatic transmission mechanism portion, and the annexed transmission part is provided with a counter gear which is actuated by an output member of the automatic transmission mechanism portion and is detachably attached with a sub-transmission unit. When the transmission is assembled, a multitransmission stage can be obtained by modifying the clutch portion, and attaching/detaching the sub-transmission unit.
摘要翻译：在本发明的自动变速器中的一个位置设置有多个离合器，以形成离合器部分，离合器部分设置在自动变速机构部分的前端部分处，附接的变速部分设置在相邻的位置并且所附的传动部分设置有由自动变速机构部分的输出构件致动并且可拆卸地附接有副传动单元的中间齿轮。当组装传动装置时，可以通过改变离合器部分以及附接/分离副传动装置来获得多传动台。

39. 发明授权

US4716787A Automatic transmission mechanism 失效
标题翻译：自动传动机构
公开(公告)号：US4716787A
公开(公告)日：1988-01-05
申请号：US833378
申请日：1986-02-26
申请人： Masakatsu Miura , Hideyuki Aoki
发明人： Masakatsu Miura , Hideyuki Aoki
IPC分类号： F16H3/66 , F16H57/10 , F16D25/10
CPC分类号： F16H3/663 , F16H2200/0047 , F16H2200/0052 , F16H2200/2005 , F16H2200/2007
摘要： Sun gears of a single planetary gear unit and a dual planetary gear unit are connected with respect to each other, carriers of the respective gear units in the connected state are connected to an output member, an input member is connected to a ring gear of the single planetary gear unit through a first clutch and also to a sun gear through a second clutch, and the sun gear and a ring gear of the dual planetary gear unit are stoppable by retaining means. When travelling forward, the ring gear of the single planetary gear unit is inputted with torque from the input member based on the state of connection of the first clutch.
摘要翻译：单个行星齿轮单元和双行星齿轮单元的太阳齿轮相互连接，处于连接状态的相应齿轮单元的载体连接到输出构件，输入构件连接到单行星齿轮单元通过第一离合器以及通过第二离合器到太阳齿轮，并且太阳齿轮和双行星齿轮单元的齿圈可通过保持装置停止。当前进时，基于第一离合器的连接状态，从输入构件输入单个行星齿轮单元的齿圈。

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