会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 32. 发明授权
    • Switch control device
    • 开关控制装置
    • US08174961B2
    • 2012-05-08
    • US11804468
    • 2007-05-18
    • Gwan-Bon KooYoung-Bae ParkSung-Won Yun
    • Gwan-Bon KooYoung-Bae ParkSung-Won Yun
    • H04J7/00H03M3/00H03K7/08
    • H03K17/0822H03K2017/0806
    • The present invention relates to a switch controlling apparatus. The switch controlling apparatus controls a main switch by using a first signal that corresponds to a current flowing to the main switch. The switch controlling apparatus includes a PWM controller for generating a control signal to control turning on/off of the main switch by using the first signal and a clock signal, and a TSD unit for changing the control signal corresponding to heat generated from the main switch. The TSD unit changes a response speed for the heat of the main switch by using the clock signal and the control signal.
    • 开关控制装置技术领域本发明涉及开关控制装置。 开关控制装置通过使用与流过主开关的电流对应的第一信号来控制主开关。 开关控制装置包括:PWM控制器,用于通过使用第一信号和时钟信号产生控制主开关的导通/截止的控制信号;以及TSD单元,用于改变与从主开关产生的热相对应的控制信号 。 TSD单元通过使用时钟信号和控制信号来改变主开关的热量的响应速度。
    • 35. 发明授权
    • Thin film transistor array substrate, method for manufacturing the same and system for inspecting the substrate
    • 薄膜晶体管阵列基板及其制造方法以及检查基板的系统
    • US07863620B2
    • 2011-01-04
    • US12574915
    • 2009-10-07
    • Hyang-Shik KongSung-Wook HuhYoung-Bae Park
    • Hyang-Shik KongSung-Wook HuhYoung-Bae Park
    • H01L29/76H01L21/00
    • G02F1/1362G02F1/13458G02F2001/136254H01L21/32134H01L21/32136H01L27/124H01L27/1255H01L27/1288
    • Disclosed is a thin film transistor substrate and a system for inspecting the same. The thin film transistor substrate comprises gate wiring formed on an insulation substrate and including gate lines, and gate electrodes and gate pads connected to the gate lines; a gate insulation layer covering the gate wiring; a semiconductor layer formed over the gate insulation layer; data wiring formed over the gate insulation layer and including data pads; a protection layer covering the data wiring; auxiliary pads connected to the data pads through contact holes formed in the protection layer; and a pad auxiliary layer formed protruding a predetermined height under the data pads. The inspection system for determining whether a thin film transistor substrate is defective, in which the thin film transistor substrate comprises gate wiring including gate lines, gate electrodes and gate pads, and data wiring including source electrodes and drain electrodes, includes a probe pin for contacting the gate pads or data pads and transmitting a corresponding signal, wherein a contact tip at a distal end of the probe pin for contacting the gate pads or the data pads is rounded, and a radius of the rounded contact tip is 2 μm or less, or the rounded contact tip is coated with gold (Au).
    • 公开了一种薄膜晶体管基板及其检查系统。 薄膜晶体管基板包括形成在绝缘基板上并包括栅极线的栅极布线,以及连接到栅极线的栅电极和栅极焊盘; 覆盖栅极布线的栅极绝缘层; 形成在所述栅绝缘层上的半导体层; 数据布线形成在栅极绝缘层上并包括数据焊盘; 覆盖数据线的保护层; 辅助焊盘通过形成在保护层中的接触孔连接到数据焊盘; 以及在数据焊盘下方突出预定高度形成的焊盘辅助层。 用于确定薄膜晶体管基板是否缺陷的检查系统,其中薄膜晶体管基板包括包括栅极线,栅电极和栅极焊盘的栅极布线,以及包括源电极和漏电极的数据布线,包括用于接触的探针 所述栅极焊盘或数据焊盘并传输相应的信号,其中用于接触所述栅极焊盘或所述数据焊盘的所述探针的远端处的接触尖端是圆形的,并且所述圆形接触尖端的半径为2μm或更小, 或圆形接触尖端涂有金(Au)。
    • 38. 发明申请
    • Frequency modulation device and switching mode power supply using the same
    • 调频装置和开关电源使用相同
    • US20090028235A1
    • 2009-01-29
    • US12220768
    • 2008-07-25
    • Young-Bae ParkGwan-Bon Koo
    • Young-Bae ParkGwan-Bon Koo
    • H03K7/08
    • H03K7/06
    • The present invention relates to a frequency modulation device and a switching mode power supply using the frequency modulation device. To prevent electromagnetic interference (EMI), it is required to slightly vary a switching operation frequency in an SMPS operation. In some embodiments, at least one first signal having a predetermined cycle is generated, a second signal corresponding to a level of a first signal is generated at a turn-off time of a switch, a first reference voltage having at least two different levels is generated according to the second signal, and an oscillator signal for increasing along a first slope during a first period and decreasing along a second slope during a second period between the first reference voltage and a second reference voltage having a level that is different from the first reference voltage is generated.
    • 本发明涉及使用该调频装置的频率调制装置和开关模式电源。 为了防止电磁干扰(EMI),需要在SMPS操作中稍微改变开关操作频率。 在一些实施例中,产生具有预定周期的至少一个第一信号,在开关的关断时间产生对应于第一信号的电平的第二信号,具有至少两个不同电平的第一参考电压是 根据第二信号生成的振荡器信号,以及振荡器信号,用于在第一周期期间沿着第一斜率增加,并且在第一参考电压和第二参考电压之间的第二周期期间沿着第二斜率减小,该第二参考电压具有与第一 产生参考电压。
    • 40. 发明申请
    • Thin film transistor array substrate, method for manufacturing the same and system for inspecting the substrate
    • 薄膜晶体管阵列基板及其制造方法以及检查基板的系统
    • US20050087770A1
    • 2005-04-28
    • US10986930
    • 2004-11-15
    • Hyang-Shik KongSung-Wook HuhYoung-Bae Park
    • Hyang-Shik KongSung-Wook HuhYoung-Bae Park
    • G02F1/136H01L21/3213H01L21/77H01L21/84H01L27/12H01L27/13H01L29/73
    • G02F1/1362G02F1/13458G02F2001/136254H01L21/32134H01L21/32136H01L27/124H01L27/1255H01L27/1288
    • Disclosed is a thin film transistor substrate and a system for inspecting the same. The thin film transistor substrate comprises gate wiring formed on an insulation substrate and including gate lines, and gate electrodes and gate pads connected to the gate lines; a gate insulation layer covering the gate wiring; a semiconductor layer formed over the gate insulation layer; data wiring formed over the gate insulation layer and including data pads; a protection layer covering the data wiring; auxiliary pads connected to the data pads through contact holes formed in the protection layer; and a pad auxiliary layer formed protruding a predetermined height under the data pads. The inspection system for determining whether a thin film transistor substrate is defective, in which the thin film transistor substrate comprises gate wiring including gate lines, gate electrodes and gate pads, and data wiring including source electrodes and drain electrodes, includes a probe pin for contacting the gate pads or data pads and transmitting a corresponding signal, wherein a contact tip at a distal end of the probe pin for contacting the gate pads or the data pads is rounded, and a radius of the rounded contact tip is 2 μm or less, or the rounded contact tip is coated with gold (Au).
    • 公开了一种薄膜晶体管基板及其检查系统。 薄膜晶体管基板包括形成在绝缘基板上并包括栅极线的栅极布线,以及连接到栅极线的栅电极和栅极焊盘; 覆盖栅极布线的栅极绝缘层; 形成在所述栅绝缘层上的半导体层; 数据布线形成在栅极绝缘层上并包括数据焊盘; 覆盖数据线的保护层; 辅助焊盘通过形成在保护层中的接触孔连接到数据焊盘; 以及在数据焊盘下方突出预定高度形成的焊盘辅助层。 用于确定薄膜晶体管基板是否缺陷的检查系统,其中薄膜晶体管基板包括包括栅极线,栅电极和栅极焊盘的栅极布线,以及包括源电极和漏电极的数据布线,包括用于接触的探针 栅极焊盘或数据焊盘并传输相应的信号,其中用于接触栅极焊盘或数据焊盘的探针的远端处的接触尖端是圆形的,并且圆形接触尖端的半径为2μm或更小, 或圆形接触尖端涂有金(Au)。