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    • 31. 发明授权
    • Interconnection network with dynamic sub-networks
    • 互联网络与动态子网络
    • US08397009B2
    • 2013-03-12
    • US12792218
    • 2010-06-02
    • Francois Jacquet
    • Francois Jacquet
    • G06F13/00G06F13/28
    • G06F13/4022Y02D10/14Y02D10/151
    • An interconnection network with m first electronic circuits and n second electronic circuits, comprising m interconnection sub-networks, each interconnection sub-network including: at least one addressing bus and one information transfer bus connecting one of the m first circuits to all the n second circuits, the information transfer bus comprising a plurality of portions of signal transmission lines connected to each other through signal repeater devices, and a controller device that controls the signal repeater devices, at least one of the signal repeater devices is controlled to be active depending on a value of an addressing signal to be sent to the addressing bus by said one of the m first circuits to the controller device, where m and n are integer numbers greater than 1.
    • 一种具有m个第一电子电路和n个第二电子电路的互连网络,包括m个互连子网络,每个互连子网络包括:将至少一个寻址总线和一个信息传输总线连接到所有n个第二电路中的一个 电路,包括通过信号中继器装置彼此连接的信号传输线路的多个部分的信息传送总线,以及控制信号中继器设备的控制器设备,至少一个信号中继器设备根据 由m个第一电路中的一个发送到寻址总线的寻址信号的值到控制器装置,其中m和n是大于1的整数。
    • 35. 发明申请
    • Memory device with programmable control for activation of read amplifiers
    • 具有可编程控制的存储器件,用于激活读取放大器
    • US20080008020A1
    • 2008-01-10
    • US11824948
    • 2007-07-03
    • Francois JacquetFranck Genevaux
    • Francois JacquetFranck Genevaux
    • G11C11/00G11C7/02
    • G11C7/14G11C7/08
    • An embodiment of the invention relate to a memory device including a memory plane composed of memory cells located at the intersection of lines and columns, and a dummy path designed to output a signal to activate read amplifiers arranged at the bottom of the columns in the memory plane, said dummy path including dummy memory cells connected between two dummy bit lines means of selecting at least one dummy cell designed to discharge at least one of the dummy bit lines, and control means connected to the two dummy bit lines to generate said activation signal, characterised in that said device includes means of programming the number of selected cells to discharge at least said dummy bit line, to adjust the time at which said activation signal is output.
    • 本发明的实施例涉及包括由位于行和列的交点处的存储器单元组成的存储器平面的存储器件,以及设计成输出信号以激活布置在存储器中的列的底部的读取放大器的虚拟路径 所述虚拟路径包括连接在两个虚拟位线之间的虚拟存储器单元,所述虚拟存储单元选择至少一个设计成对所述虚拟位线中的至少一个排放的虚拟单元,以及连接到所述两个虚拟位线的控制单元以产生所述激活信号 其特征在于,所述设备包括对所选择的单元的数量进行编程以便至少对所述虚拟位线进行排放的装置,以调整所述激活信号输出的时间。
    • 36. 发明授权
    • Memory circuit comprising an error correcting code
    • 存储电路包括纠错码
    • US07272775B2
    • 2007-09-18
    • US10453844
    • 2003-06-03
    • Francois JacquetJean-Pierre Schoellkopf
    • Francois JacquetJean-Pierre Schoellkopf
    • G11C29/42
    • G06F11/1008G06F11/1048
    • A memory circuit with an error correcting system comprising an address bus (102), an input data bus (108), and an output data bus (115), the circuit comprising a memory having an address bus (113), a data bus (114) and an error correcting circuit comprising an encoder (107). A first address register (104) is connected to the input address bus of the circuit for successively storing addresses corresponding to memory write operations only. A second data register (105) is connected to the input data bus of the circuit (108) for storing data transmitted to the encoder (107). Circuits make it possible to introduce a one-cycle shift into the memory writes, without modifying reads, giving the encoder more time to compute error correcting codes.
    • 一种具有包括地址总线(102),输入数据总线(108)和输出数据总线(115)的纠错系统的存储器电路,该电路包括具有地址总线(113),数据总线 114)和包括编码器(107)的纠错电路。 第一地址寄存器(104)连接到电路的输入地址总线,用于仅依次存储对应于存储器写入操作的地址。 第二数据寄存器(105)连接到电路(108)的输入数据总线,用于存储发送到编码器(107)的数据。 电路使得可以在存储器写入中引入一个周期的移位,而不修改读取,给编码器更多的时间来计算纠错码。
    • 38. 发明授权
    • Memory with storage cells biased in groups
    • 具有存储单元偏差的存储器
    • US07221581B2
    • 2007-05-22
    • US11274039
    • 2005-11-14
    • Francois JacquetFlorent Vautrin
    • Francois JacquetFlorent Vautrin
    • G11C11/00G11C7/00
    • G11C11/417
    • A memory circuit includes a plurality of storage cells (100) arranged in rows and columns thus forming a storage matrix. The storage cells (100) corresponding to the same bit line (21-23) are divided into several groups (60-61) of cells for the same column, these groups having their own biasing circuit (200) in order to act on the difference between the logic level low voltage and the substrate voltage of the link transistors. When a storage cell is not selected, the biasing circuit makes the voltage between source/drain and substrate equal to a negative voltage in order to minimize the leakage current. During a read operation, the substrate voltage and the source/drain voltage are brought back to the same level such that a maximum current will flow when the link transistor is conducting.
    • 存储电路包括以行和列排列的多个存储单元(100),从而形成存储矩阵。 对应于相同位线(21-23)的存储单元(100)被划分成用于同一列的单元的几组(60-61),这些组具有它们自己的偏置电路(200),以便作用于 逻辑电平低电压与链路晶体管的衬底电压之间的差异。 当不选择存储单元时,偏置电路使得源极/漏极和衬底之间的电压等于负电压,以便使漏电流最小化。 在读取操作期间,衬底电压和源极/漏极电压恢复到相同的电平,使得当链路晶体管导通时最大电流将流动。
    • 40. 发明授权
    • Dynamically unbalanced sense amplifier
    • 动态不平衡感测放大器
    • US07057955B2
    • 2006-06-06
    • US10860080
    • 2004-06-03
    • Franck GenevauxFrancois Jacquet
    • Franck GenevauxFrancois Jacquet
    • G11C7/00
    • G11C7/12G11C7/065G11C2207/065
    • A sense amplifier connected to first and second bit lines, comprising means for precharging said bit lines to a high voltage, means for connecting one or the other of the bit lines to a memory cell, said connection causing according to the state of the memory cell a maintaining of the bit line at the high voltage or a voltage reduction, first and second transistors respectively controlled by the first and second bit lines, and, in series with the first and second transistors, a controllable means for the current through the transistor controlled by the bit line connected to the memory cell to be greater than the current through the other transistor when the voltages of the two bit lines are at the high voltage.
    • 连接到第一和第二位线的感测放大器包括用于将所述位线预充电到高电压的装置,用于将一个或另一个位线连接到存储器单元的装置,所述连接根据存储器单元的状态 分别由第一和第二位线控制的高电压或电压降低的位线的保持,以及与第一和第二晶体管串联的用于通过晶体管控制的电流的可控制装置 当两个位线的电压处于高电压时,连接到存储单元的位线大于通过另一个晶体管的电流。