专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

31. 发明申请

US20110229224A1 Fixing unit and image forming apparatus using fixing unit 失效
标题翻译：固定单元和使用定影单元的成像设备
公开(公告)号：US20110229224A1
公开(公告)日：2011-09-22
申请号：US13064212
申请日：2011-03-11
申请人： Masahiro Watanabe
发明人： Masahiro Watanabe
IPC分类号： G03G15/16
CPC分类号： G03G15/2025 , G03G2215/2032
摘要： Disclosed is a fixing unit including a fixing member; a pressure member brought into press-contact with a front surface of the fixing member; a pressure mechanism that changes a position at which the pressure member is brought into press-contact with the fixing member, the pressure mechanism being capable of controlling a presence or absence and a width of the nip part; and a cleaning web unit having a contact roller brought into contact with at least the pressure member via a web, a supply roller that supplies a new web, and a winding roller that winds and collects the web having wiped off an attachment on the pressure roller. The contact roller is caused to move following a movement of the pressure mechanism to maintain a constant contact position, a constant contact direction, and a constant contact force thereof with respect to the pressure member.
摘要翻译：公开了一种固定单元，包括固定构件; 压力构件与所述固定构件的前表面压接; 压力机构，其使所述加压部件与所述固定部件压接的位置变化，所述压力机构能够控制所述辊隙部的有无宽度; 以及清洁纸单元，其具有经由幅材与至少压力构件接触的接触辊，供给新的幅材的供给辊和卷绕并收集已经擦除了加压辊上的附件的幅材的卷绕辊。使接触辊在压力机构的移动之后移动以保持接触位置恒定，接触方向恒定，并且其相对于压力构件的恒定接触力。

32. 发明授权

US07990910B2 Mobile station and reception quality measurement method 失效
标题翻译：移动台和接收质量测量方法
公开(公告)号：US07990910B2
公开(公告)日：2011-08-02
申请号：US12495415
申请日：2009-06-30
申请人： Masahiro Watanabe
发明人： Masahiro Watanabe
IPC分类号： H04B7/212
CPC分类号： H04W24/10 , H04L1/20 , H04L27/2655 , H04W56/003
摘要： A reception quality measurement method includes instructing a mobile station existing in a cell to measure a reception quality of a signal sent by a second base station forming a cell with a frequency different from a frequency of the cell of the first base station; setting a period including a synchronizing timing for the first base station, by the mobile station; setting a plurality of measurement timings in the period, and measuring reception quality of the signals sent by the second base station at each of the measurement timings, by the mobile station; comparing the reception qualities measured at the measurement timings, and selecting an optimum reception quality, by the mobile station; and reporting the selected optimum reception quality to the first base station as the reception quality of the signal sent by the second base station, by the mobile station.
摘要翻译：接收质量测量方法包括指示存在于小区中的移动台测量由形成具有与第一基站的小区的频率不同的频率的小区的第二基站发送的信号的接收质量; 由移动台设置包括第一基站的同步定时的周期; 在该周期内设定多个测量定时，并且由移动台测量第二基站在每个测量定时发送的信号的接收质量; 比较在测量定时测量的接收质量，并且由移动台选择最佳的接收质量; 并且由所述移动台向所述第一基站报告所选择的最佳接收质量作为由所述第二基站发送的信号的接收质量。

33. 发明授权

US07894658B2 Pattern inspection method and apparatus 有权
标题翻译：图案检验方法及装置
公开(公告)号：US07894658B2
公开(公告)日：2011-02-22
申请号：US11931693
申请日：2007-10-31
申请人： Takashi Hiroi , Masahiro Watanabe , Chie Shishido , Aritoshi Sugimoto , Maki Tanaka , Hiroshi Miyai , Asahiro Kuni , Yasuhiko Nara
发明人： Takashi Hiroi , Masahiro Watanabe , Chie Shishido , Aritoshi Sugimoto , Maki Tanaka , Hiroshi Miyai , Asahiro Kuni , Yasuhiko Nara
IPC分类号： G06K9/00
CPC分类号： G01N21/9501 , G01N21/956 , G01N2021/8854 , G01N2021/8861 , G01N2021/8864 , G01R31/311 , G03F1/86 , G06T1/0007 , G06T7/0002 , G06T7/001 , G06T2200/24 , G06T2207/10061 , G06T2207/30148 , H01J37/222 , H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/24592 , H01J2237/28
摘要： An apparatus for processing a defect candidate image, including: an imager for taking an enlarged image of a specimen; an image processor for processing the image taken by the imager to detect defect candidates existing on the specimen and classify the detected defect candidates into one of plural defect classes; a memory for storing information of the defect candidates including the images of the defect candidates and the classified defect class data outputted from the image processor; and a display unit having a display screen for displaying information stored in the memory, wherein the display unit displays an image of the defect candidates together with the defect class data stored in the memory and the displayed defect class data is changeable on the display screen, and the memory changes the stored defect class data of the displayed defect candidate to the changed defect class data.
摘要翻译：一种用于处理缺陷候选图像的装置，包括：用于拍摄样本的放大图像的成像器; 图像处理器，用于处理由成像器拍摄的图像以检测存在于样本上的缺陷候选，并将检测到的缺陷候选分类为多个缺陷类别中的一个; 存储器，用于存储包括缺陷候选图像和从图像处理器输出的分类缺陷类别数据的缺陷候选的信息; 以及显示单元，具有用于显示存储在存储器中的信息的显示屏幕，其中所述显示单元与存储在所述存储器中的缺陷类别数据一起显示所述缺陷候选的图像，并且所显示的缺陷类别数据可在所述显示屏幕上变化，并且存储器将存储的缺陷候选的缺陷类别数据改变为改变的缺陷类别数据。

34. 发明申请

US20110035075A1 ENERGY MANAGEMENT APPARATUS FOR CUSTOMERS 有权
标题翻译：能源管理设备
公开(公告)号：US20110035075A1
公开(公告)日：2011-02-10
申请号：US12850234
申请日：2010-08-04
申请人： Yasushi TOMITA , Masahiro Watanabe , Rena Tachihara , Yuichi Otake , Tatsuya Yamada
发明人： Yasushi TOMITA , Masahiro Watanabe , Rena Tachihara , Yuichi Otake , Tatsuya Yamada
IPC分类号： G06F1/32 , G05D23/19
CPC分类号： F24F11/30 , F24F11/62
摘要： A customer-dedicated energy management apparatus includes an air-conditioner partial-road characteristics identification unit for creating air-conditioning partial-road characteristics by using air-conditioning operation achievement data in the past, an intra-room heat-capacity characteristics identification unit for creating intra-room heat-capacity characteristics by using the air-conditioning operation achievement data in the past, and intra-room state value data, an air-conditioning setting temperature calculation unit for determining an air-conditioning setting temperature by using the air-conditioning partial-road characteristics and the intra-room heat-capacity characteristics, the setting temperature being appropriate for implementing an air-conditioning power-consumption-amount suppression target value determined, and an air-conditioner control unit for controlling an air conditioner so that the setting temperature determined will be implemented.
摘要翻译：客户专用的能量管理装置包括：空调局部道路特性识别单元，用于通过使用过去的空调操作成果数据来产生空调部分道路特性;室内热容特性识别单元，用于通过使用过去的空调运转成果数据和室内状态值数据来产生室内热容量特性;空调设定温度计算单元，用于通过使用空调设定温度来确定空调设定温度，调节部分道路特性和房间内热容量特性，设定温度适合于确定的空调消耗量抑制目标值，以及空调器控制单元，用于控制空调，使得确定的设定温度将被实施。

35. 发明申请

US20110024781A1 Light emitting device 有权
标题翻译：发光装置
公开(公告)号：US20110024781A1
公开(公告)日：2011-02-03
申请号：US12805290
申请日：2010-07-22
申请人： Tetsuji Fujimoto , Kazuyuki Ilzuka , Masahiro Watanabe , Katsuya Akimoto
发明人： Tetsuji Fujimoto , Kazuyuki Ilzuka , Masahiro Watanabe , Katsuya Akimoto
IPC分类号： H01L33/10
CPC分类号： H01L33/20 , H01L33/0079 , H01L33/38 , H01L33/44 , H01L2924/0002 , H01L2924/00
摘要： A light emitting device has a light emitting layer having a first semiconductor layer of a first conductivity type, a second semiconductor layer of a second conductivity type different from the first conductivity type, and an active layer sandwiched between the first semiconductor layer and the second semiconductor layer, a reflecting layer provided on a side of one surface of the light emitting layer, which reflects a light emitted from the active layer, a supporting substrate provided on an opposite side of the reflecting layer with respect to the light emitting layer, which supports the light emitting layer via an adhesion layer, an ohmic contact portion provided on a part of the reflecting layer, which electrically connects between the reflecting layer and the light emitting layer, and convexo-concave portions formed on other surface of the light emitting layer and side surfaces of the light emitting layer, respectively, and an insulating film configured to cover the convexo-concave portions.
摘要翻译：发光器件具有发光层，其具有第一导电类型的第一半导体层，不同于第一导电类型的第二导电类型的第二半导体层和夹在第一半导体层和第二半导体层之间的有源层反射层，其设置在发光层的一个表面的一侧，其反射从有源层发射的光;支撑基板，设置在反射层相对于发光层的相反侧，支撑基板支撑经由粘合层的发光层，设置在反射层的一部分上的欧姆接触部分，其在反射层和发光层之间电连接，以及形成在发光层的另一表面上的凸凹部分，以及分别具有发光层的侧面和覆盖凹凸的绝缘膜 e部分。

36. 发明申请

US20110013047A1 Computer readable storage medium, image correction apparatus, and image correction method 有权
标题翻译：计算机可读存储介质，图像校正装置和图像校正方法
公开(公告)号：US20110013047A1
公开(公告)日：2011-01-20
申请号：US12923387
申请日：2010-09-17
申请人： Masahiro Watanabe
发明人： Masahiro Watanabe
IPC分类号： H04N5/235
CPC分类号： H04N5/235 , G06T5/009 , G06T2207/10144 , H04N1/4074 , H04N5/243
摘要： An image correction apparatus includes an exposure-level calculating unit that calculates an exposure level using information on an image capturing unit, which captures image data, at the time of capture of an image, a brightness calculating unit that calculates brightness of the image using information on the image data captured by the image capturing unit, and an image correction unit that corrects the brightness of the image data in accordance with the exposure level calculated by the exposure-level calculating unit and the brightness of the image calculated by the brightness calculating unit.
摘要翻译：一种图像校正装置，包括：曝光级别计算单元，其使用关于拍摄图像时的图像数据的图像的信息来计算曝光水平;图像捕获时的亮度计算单元，利用信息计算图像的亮度; 对由图像拍摄单元拍摄的图像数据和图像校正单元，其根据由曝光级别计算单元计算的曝光水平和由亮度计算单元计算的图像的亮度来校正图像数据的亮度。

37. 发明授权

US07871309B2 Polishing pad 有权
标题翻译：抛光垫
公开(公告)号：US07871309B2
公开(公告)日：2011-01-18
申请号：US11720964
申请日：2005-12-08
申请人： Kazuyuki Ogawa , Tetsuo Shimomura , Atsushi Kazuno , Yoshiyuki Nakai , Masahiro Watanabe , Takatoshi Yamada , Masahiko Nakamori
发明人： Kazuyuki Ogawa , Tetsuo Shimomura , Atsushi Kazuno , Yoshiyuki Nakai , Masahiro Watanabe , Takatoshi Yamada , Masahiko Nakamori
IPC分类号： B24B1/00 , B24D11/00
CPC分类号： B24B37/205 , Y10T428/24339 , Y10T428/24992
摘要： It is an object of the invention to provide a polishing pad capable of high precision optical detection of an endpoint during polishing in progress and prevention of slurry leakage from between a polishing region and a light-transmitting region during the use thereof even after the polishing pad has been used for a long period. It is a second object of the invention to provide a polishing pad capable of suppression of deterioration of polishing characteristics (such as in-plane uniformity) and generation of scratches due to a difference in behavior of a polishing region and a light-transmitting region during polishing. It is a third object of the invention to provide a polishing pad having a polishing region and a light-transmitting region with a concentration of a specific metal equal to or lower than a specific value (threshold value).
摘要翻译：本发明的目的是提供一种抛光垫，其能够在抛光过程中对端点进行高精度光学检测，并且即使在抛光垫之后也可防止在使用期间抛光区域和透光区域之间的浆料泄漏已被使用了很长时间。本发明的第二个目的是提供一种能够抑制抛光特性（例如面内均匀性）劣化的抛光垫以及由于抛光区域和透光区域的行为差异而产生的划痕抛光。本发明的第三个目的是提供一种具有抛光区域和特定金属浓度等于或低于特定值（阈值）的透光区域的抛光垫。

38. 发明申请

US20100074164A1 Communication Systems 有权
标题翻译：通讯系统
公开(公告)号：US20100074164A1
公开(公告)日：2010-03-25
申请号：US12513805
申请日：2007-07-31
申请人： Michael John Beems Hart , Yuefeng Zhou , Dorin Viorel , Chenzi Zhu , Michiharu Nakamura , Masahiro Watanabe , Hiroshi Fujita , Makoto Yoshida
发明人： Michael John Beems Hart , Yuefeng Zhou , Dorin Viorel , Chenzi Zhu , Michiharu Nakamura , Masahiro Watanabe , Hiroshi Fujita , Makoto Yoshida
IPC分类号： H04B7/14
CPC分类号： H04W52/46 , H04L1/0003 , H04L1/0009 , H04L1/0028 , H04L1/0029 , H04L2001/0097
摘要： A method for transmission of information about downlink and uplink parameters of a intermediate apparatus link in a multi-hop wireless communication system, the system comprising a first node apparatus, a second node apparatus and one or more intermediate apparatuses, each said apparatus being operable to transmit and receive information along a series of links forming a communication path for downlink and uplink communication, the communication path extending between the first node and second node apparatuses via the or each intermediate apparatus, each link comprising either a first node link between the first node apparatus and a said intermediate apparatus or an intermediate apparatus link between a said intermediate apparatus and a said apparatus which is not the first node apparatus, and the system having access to a minimum allocation unit for allocating time and transmission frequency bandwidth, the method comprising: obtaining values of downlink and uplink parameters for a particular intermediate apparatus link; mapping both values onto a single minimum allocation unit and transmitting them towards the first node apparatus.
摘要翻译：一种用于在多跳无线通信系统中传输关于中间设备链路的下行链路和上行链路参数的信息的方法，所述系统包括第一节点设备，第二节点设备和一个或多个中间设备，每个所述设备可操作为沿着形成用于下行链路和上行链路通信的通信路径的一系列链路发送和接收信息，所述通信路径经由或每个中间设备在第一节点和第二节点设备之间延伸，每个链路包括第一节点之间的第一节点链路装置以及所述中间装置或中间装置之间的链路，所述中间装置或所述中间装置与不是所述第一节点装置的所述装置之间的链路，并且所述系统具有访问用于分配时间和传输频率带宽的最小分配单元，所述方法包括：获得一个参数的下行链路和上行链路参数的值中型设备连接; 将这两个值映射到单个最小分配单元上并将其发送到第一节点设备。

39. 发明申请

US20100064396A1 SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME 有权
标题翻译：扫描探针显微镜和使用其的样品观察方法
公开(公告)号：US20100064396A1
公开(公告)日：2010-03-11
申请号：US12523369
申请日：2008-02-26
申请人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Motoyuki Hirooka
发明人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Motoyuki Hirooka
IPC分类号： G01Q60/18 , G01Q60/24
CPC分类号： G01Q60/18 , G01Q60/22
摘要： In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample.
摘要翻译：在使用孔径探针的近场扫描显微镜中，实际上孔径形成的上限为至多几十nm。在使用散射探针的近场扫描显微镜中，由于外部照明光作为背景噪声，分辨能力被限制在至多几十nm。此外，通过探针的损伤或磨损，测量再现性被严重降低。可以以nm级分辨能力和高再现性测量样品表面的光学数据和不均匀性数据，同时通过制造具有nm级光学分辨率的等离子体增强近场探针而不损害探针和样品通过将nm级圆柱形结构与nm级微粒组合，并在样品上的各个测量点处以低接触力将探针重复地移动到样品并从中离开它们的能力。

40. 发明申请

US20090161244A1 Method and apparatus for inspecting defects of patterns formed on a hard disk medium 有权
标题翻译：用于检查形成在硬盘介质上的图案的缺陷的方法和装置
公开(公告)号：US20090161244A1
公开(公告)日：2009-06-25
申请号：US12314938
申请日：2008-12-19
申请人： Takenori Hirose , Masahiro Watanabe , Yasuhiro Yoshitake
发明人： Takenori Hirose , Masahiro Watanabe , Yasuhiro Yoshitake
IPC分类号： G11B27/36
CPC分类号： G11B5/82 , B82Y10/00 , G01N21/55 , G01N21/95607 , G01N2021/95615 , G11B5/743 , G11B5/855 , G11B20/18 , G11B2220/2516
摘要： If an inspection method for inspecting a patterned medium is intended for the nanoimprint process control, it is necessary to measure a correct shape of each pattern element. On the other hand, if the inspection method is intended for the quality control of products, it is necessary to inspect the products on a 100 percent basis. However, the conventional method which uses SEM or AFM could not satisfy these requirements.According to the present invention, 100-percent inspection of products becomes possible by a method including the steps of: irradiating a surface of a hard disk medium, on which a magnetic material pattern is formed, with a light beam including a plurality of wavelengths; detecting the intensity of a reflected light beam from the hard disk medium on a wavelength basis; calculating a spectral reflectance from the detected intensity of the reflected light beam; and detecting a shape of each pattern element formed on the hard disk medium on the basis of the calculated spectral reflectance.
摘要翻译：如果用于检查图案化介质的检查方法用于纳米压印过程控制，则需要测量每个图案元件的正确形状。另一方面，如果检验方法是用于产品的质量控制，则必须以100％的价格检查产品。然而，使用SEM或AFM的常规方法不能满足这些要求。根据本发明，通过包括以下步骤的方法可以对产品进行100％的检查：用包括多个波长的光束照射形成有磁性材料图案的硬盘介质的表面; 以波长为基础检测来自硬盘介质的反射光束的强度; 根据所检测的反射光束的强度计算光谱反射率; 并根据计算出的光谱反射率检测形成在硬盘介质上的每个图形元素的形状。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式