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    • 31. 发明授权
    • Inspection device and inspection method
    • 检验装置及检验方法
    • US07696767B2
    • 2010-04-13
    • US12458588
    • 2009-07-16
    • Keisuke InoueNobuhiro KatsumaSeiichi KageyamaMasanori HamadaTakashi Ogawa
    • Keisuke InoueNobuhiro KatsumaSeiichi KageyamaMasanori HamadaTakashi Ogawa
    • G01R31/02
    • G01R31/2886G01R1/0483
    • A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second conductive contact connecting a second electrode of a wiring board and the other external electrode of the semiconductor integrated circuit is arranged in a movable member. A third conductive contact connecting one third electrode of the inspection circuit board and the other third electrode of the wiring board is arranged in the movable member. The other third electrode is connected to the second electrode. When the movable member moves to the contacting position, the second conductive contact makes contact with the other external electrode, and the third conductive contact makes contact with the one third electrode.
    • 连接检查电路板的第一电极和半导体集成电路的一个外部电极的第一导电接触件布置在固定构件中。 连接布线板的第二电极和半导体集成电路的另一个外部电极的第二导电接触件布置在可移动部件中。 连接检查电路板的一个第三电极和布线板的另一个第三电极的第三导电接触件布置在可动件中。 另一第三电极连接到第二电极。 当可动构件移动到接触位置时,第二导电接触件与另一个外部电极接触,并且第三导电接触件与一个第三电极接触。
    • 35. 发明授权
    • Automotive door latch device
    • 汽车门锁装置
    • US07445256B2
    • 2008-11-04
    • US11188883
    • 2005-07-26
    • Shingo GotouJunichi ShimadaHirotsugu TakaiTakashi Ogawa
    • Shingo GotouJunichi ShimadaHirotsugu TakaiTakashi Ogawa
    • E05C3/06E05C3/00
    • E05B85/02E05B63/0056E05B77/265E05B77/30E05B77/34E05B81/06E05B81/16E05B81/34E05B2015/1664Y10S292/23Y10T292/1047Y10T292/1082
    • An actuating assembly for an automotive door latch device comprises a housing that operatively installs therein basic elements that are commonly used in an override function unit and a child proof function unit. The override function unit has a function wherein a manipulation of an inside door handle induces cancellation of the engaged condition of the latch means irrespective of the condition of the locking/unlocking means. The child proof function unit has a function wherein the manipulation of the inside door handle is made inoperative irrespective of the condition of the locking/unlocking means, thereby to make the cancellation of the engaged condition of the latch means impossible. The actuating assembly further comprises a cover that is coupled to the housing and holds thereon a selected element that is exclusively used in either one of the override function unit and the child proof function unit.
    • 用于汽车门闩锁装置的致动组件包括:壳体,其可操作地安装在超控功能单元和儿童防护功能单元中通常使用的基本元件。 超控功能单元具有这样的功能,其中,无论锁定/解锁装置的状况如何,内部门把手的操纵都会导致锁定装置的接合状态的消除。 防儿功能单元具有这样的功能,其中无论锁定/解锁装置的状况如何,内门把手的操作都不起作用,从而使闩锁装置的接合状态的消除是不可能的。 所述致动组件还包括盖,所述盖联接到所述壳体并且在其上保持专用于所述超驰功能单元和所述儿童防护功能单元中的任一个的选定元件。
    • 36. 发明申请
    • AUTOMATIC TRANSMISSION
    • 自动变速器
    • US20080207383A1
    • 2008-08-28
    • US12038543
    • 2008-02-27
    • Takaaki KatoTsuyoshi FukayaTakashi OgawaAkihito HongoyaHiroyuki Tsukamoto
    • Takaaki KatoTsuyoshi FukayaTakashi OgawaAkihito HongoyaHiroyuki Tsukamoto
    • F16H3/62
    • F16H3/66F16H2200/006F16H2200/0086F16H2200/2012F16H2200/2046F16H2200/2048F16H2200/2051
    • [Object] To provide an automatic transmission capable of providing a sufficient feeling of acceleration with a clear shift feeling at the time of shifting with acceleration by properly allocating step ratios between shift stages.[Means for Solution] In single pinion planetary gear mechanisms 21 and 22, a second sun gear S1 is linked to an input shaft 14 in a power-transmissible manner, a first sun gear S0 is linked to a third control brake B-3, and a first carrier C0 and a second ring gear R1 which are linked to each other are linked to a first control brake B-1. In single pinion planetary gear mechanisms 23 and 24, a third sun gear S2 and a fourth sun gear S3 which are linked to each other are linked to the input shaft 14 disengageably by a first control clutch C-1, and a third ring gear R2 and a fourth ring gear R3 are linked to a second control brake B-2 and a fourth control brake B-4, respectively. Furthermore, in the single pinion planetary gear mechanisms 23 and 24, a third carrier C2 is linked to the input shaft 14 disengageably by a second control clutch C-2 and a fourth carrier C3 is linked to an output shaft 17.
    • 本发明提供一种自动变速器,其能够通过适当地分配变速级之间的步进比,提供具有通过加速度移位时的清晰换档感觉的足够的加速感。 [解决方案]在单小齿轮行星齿轮机构21和22中,第二太阳轮S 1以动力传递的方式连接到输入轴14,第一太阳齿轮S 0连接到第三控制制动器B- 如图3所示,并且彼此连接的第一行星架C 0和第二齿圈R 1连接到第一控制制动器B- 1。 在单小齿轮行星齿轮机构23,24中,通过第一控制离合器C-1分别与输入轴14连接的第三太阳齿轮S2和第四太阳轮S 3彼此连接,第三环 齿轮R 2和第四齿圈R 3分别连接到第二控制制动器B 2和第四控制制动器B-4。 此外,在单小齿轮行星齿轮机构23,24中,第三行星架C 2通过第二控制离合器C-2分别与输入轴14连接,第四行星架C 3与输出轴17连结。
    • 37. 发明申请
    • AUTOMATIC TRANSMISSION
    • 自动变速器
    • US20080207382A1
    • 2008-08-28
    • US12038357
    • 2008-02-27
    • Takaaki KatoTsuyoshi FukayaTakashi OgawaAkihito HongoyaHiroyuki Tsukamoto
    • Takaaki KatoTsuyoshi FukayaTakashi OgawaAkihito HongoyaHiroyuki Tsukamoto
    • F16H3/62
    • F16H3/66F16H2200/006F16H2200/0086F16H2200/2012F16H2200/2046F16H2200/2048F16H2200/2051
    • [Task] To provide an automatic transmission apparatus for forward 8-speed, which keeps a transmission gear ratio step in good balance.[Solution] The apparatus includes: a first planetary gear device PG0 having a ring gear R0 connected to an input shaft; a second planetary gear device PG1 having a carrier C1 connected to a carrier C0 of the first planetary gear device, and a sun gear S1 connected to R0; a third planetary gear device PG2 having a ring gear R2 connected to C1; a fourth planetary gear device PG3 having a sun gear S3 connected to a sun gear S2 of the third planetary gear device; a first clutch C-1 that selectively connects S2 to the input shaft; a second clutch C-2 that selectively connects C2 to the input shaft; a first brake B-1 that selectively regulates the rotation of R0; a second brake B-2 that selectively regulates the rotation of R2; a third brake B-3 that selectively regulates the rotation of S0; and a fourth brake B-4 that selectively regulates the rotation of R3. The apparatus further includes a third clutch C-3 that connects R0 and S1 to the input shaft, or connects R2 to C1. PG0 to PG3 are each provided as a single pinion type.
    • [任务]提供一种前进8速的自动变速装置,保持变速器齿轮比的平衡。 [解决方案]该装置包括:具有连接到输入轴的齿圈R 0的第一行星齿轮装置PG 0; 具有连接到第一行星齿轮装置的行星架C 0的行星架C 1的第二行星齿轮装置PG1和连接到R 0的太阳轮S 1; 具有连接到C 1的齿圈R 2的第三行星齿轮装置PG 2; 具有与第三行星齿轮装置的太阳齿轮S 2连接的太阳轮S 3的第四行星齿轮装置PG 3; 选择性地将S 2连接到输入轴的第一离合器C-1; 选择性地将C 2连接到输入轴的第二离合器C-2; 选择性地调节R 0的旋转的第一制动器B- 1; 选择性地调节R 2的旋转的第二制动器B 2; 选择性地调节S 0的旋转的第三制动器B- 3; 以及选择性地调节R 3的旋转的第四制动器B- 4。 该装置还包括将R 0和S 1连接到输入轴的第三离合器C-3,或将R 2连接到C 1。 PG 0〜PG 3分别设置为单小齿轮型。
    • 40. 发明申请
    • Semiconductor Inspection Method And System Therefor
    • 半导体检测方法及系统
    • US20080061233A1
    • 2008-03-13
    • US10590127
    • 2005-02-18
    • Takashi Ogawa
    • Takashi Ogawa
    • G01N23/225
    • G01R31/307G01N23/225
    • To provide an inspection method that makes it possible to inspect continuity or the like of a circuit element in a semiconductor device from observation with a scanning charged particle microscope such as an electron microscope without troublesome work like random access operation of a probe, and providing a system that realizes the inspection method.A method for inspecting an electronic circuit of the invention uses a composite apparatus including an electron gun 2, an ion beam gun 1, and a secondary charged particle detector 4 to observe on a micro-scale contrast change on a sample surface in the case in which the surface of a sample semiconductor device is irradiated with an electron beam or a positively charged ion beam to charge the sample surface highly, and in the case in which a desired pattern in an area in the highly charged state is irradiated with a charged ion beam or an electron beam of opposite charge.
    • 为了提供一种检查方法,使得可以通过诸如电子显微镜的扫描带电粒子显微镜观察半导体器件中的电路元件的连续性等,而不需要像探头的随机存取操作那样的麻烦的工作,并且提供 实现检验方法的系统。 本发明的电子电路的检查方法使用包括电子枪2,离子束枪1和二次带电粒子检测器4的复合装置,以观察样品表面上的微观尺度对比度变化 样品半导体器件的表面用电子束或带正电的离子束照射,对样品表面进行高度充电,并且在高电荷状态的区域中的期望图案被照射带电离子的情况下 光束或相反电荷的电子束。