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    • 34. 发明申请
    • PRINTING PRESS
    • 印刷机
    • US20120069117A1
    • 2012-03-22
    • US13322230
    • 2010-05-21
    • Hideaki SakuraiShoichi AokiMakoto KajiNorifumi Tasaka
    • Hideaki SakuraiShoichi AokiMakoto KajiNorifumi Tasaka
    • B41J2/01
    • B41J3/546B41F13/02B41F19/007
    • In a printing press, it is configured such that a newspaper web offset printing press is composed by a feeder device, a printing device, a guiding device, a turn bar device, and a folding unit; as a guiding device, there are provided an upstream side guide roller and a downstream side guide roller which are disposed with a predetermined interval along a transportation direction of a web for guiding transportation of the web; and there is disposed an ink-jet printer for performing digital printing on the web guided between the guide rollers. By setting diameters of the upstream side guide roller and the downstream side guide roller to different values, vibration of the print medium which is transported while being guided by the guide rollers is suppressed, and the print quality is thereby improved.
    • 在印刷机中,由纸送纸装置,印刷装置,引导装置,转杆装置和折叠单元构成报纸卷筒纸胶版印刷机。 作为引导装置,设置有沿着幅材的传送方向以预定间隔布置的上游侧引导辊和下游侧引导辊,用于引导幅材的传送; 并且设置有用于在引导辊之间引导的幅材上进行数字印刷的喷墨打印机。 通过将上游侧引导辊和下游侧引导辊的直径设定为不同的值,可以抑制在被引导辊引导的同时传送的打印介质的振动,从而提高打印质量。
    • 35. 发明授权
    • Development method, method of manufacturing photomask, and method of manufacturing semiconductor device
    • 开发方法,制造光掩模的方法以及制造半导体器件的方法
    • US08017287B2
    • 2011-09-13
    • US12559735
    • 2009-09-15
    • Hideaki SakuraiMasatoshi Terayama
    • Hideaki SakuraiMasatoshi Terayama
    • G03F1/00G03F7/30G03F7/40
    • G03F7/30G03F1/00G03F7/3028
    • A development method according to an embodiment includes exposing a photosensitive film formed on a substrate at a predetermined exposure amount, carrying out a first development process that develops the exposed photosensitive film at a predetermined first development condition so as to leave the photosensitive film, obtaining a sensitivity information of an unexposed photosensitive film on the substrate from a film thickness reduction of the photosensitive film developed by the first development process and the predetermined exposure amount, predicting pattern dimensions of multiple types of patterns to be formed when a second development process is carried out following the first development process from the sensitivity information, and determining a first acceptable range of a development condition in the second development process, determining a second acceptable range of the development condition in the second development process from the first acceptable range and a variation amount of pattern dimensions between the multiple types of patterns after the second development process and determining a second development condition in the second development process so as to satisfy both of the first and second acceptable ranges. The development method is used for forming a mask pattern on a photomask, which is then used for patterning a wafer in the manufacturing of a semiconductor device.
    • 根据实施方案的显影方法包括以预定曝光量曝光形成在基板上的感光膜,进行在预定的第一显影条件下显影曝光的感光膜以便使感光膜离开的第一显影处理,获得 通过第一显影处理显影的感光性膜的膜厚减少和预定的曝光量,预测基板上未曝光的感光膜的感光度信息,预测在进行第二显影处理时将形成的多种图案的图案尺寸 在从所述灵敏度信息进行的第一开发过程之后,并且确定所述第二开发过程中的开发条件的第一可接受范围,从所述第一可接受范围和变化中确定所述第二开发过程中的所述开发条件的第二可接受范围 在第二显影处理之后,在多种类型的图案之间绘制图案尺寸,并确定第二显影处理中的第二显影条件以便满足第一和第二可接受范围。 显影方法用于在光掩模上形成掩模图案,然后将其用于制造半导体器件中的晶片图案化。