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    • 31. 发明申请
    • TESTING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT AND INFORMATION RECORDING MEDIUM
    • 半导体集成电路和信息记录介质的测试方法
    • US20090237104A1
    • 2009-09-24
    • US12066748
    • 2007-03-06
    • Hiromi TsuchidaAkihiro MaejimaJinsaku KanedaEisaku Maeda
    • Hiromi TsuchidaAkihiro MaejimaJinsaku KanedaEisaku Maeda
    • G01R31/26
    • G01R31/2894
    • A testing method of semiconductor integrated circuit wherein the quality of diffusion for semiconductor chips can be tested before the semiconductor chips become packaged semiconductor integrated circuits is provided. Input data is set, and circuit current values I(L) and I(H) obtained for each of a plurality of circuit areas are compared with first test pass ranges I1(L) and I1(H) to extract articles within the first test pass (S2), and the current values of the circuit areas determined to be articles within the first test pass and second test pass ranges I2(L), and I2(H) determined based on these current values are compared, thereby conducting a retest to extract circuit areas within the second test pass. The current values may be replaced by the voltage values.
    • 提供半导体集成电路的测试方法,其中可以在半导体芯片变成封装半导体集成电路之前测试半导体芯片的扩散质量。 设置输入数据,将与多个电路区域中的每一个获得的电路电流值I(L)和I(H)与第一测试通过范围I1(L)和I1(H)进行比较,以提取第一测试 (S2),并且将根据这些电流值确定的确定为第一测试通过和第二测试通过范围I2(L)和I2(H)的物品的电路区域的当前值进行比较,从而进行重新测试 在第二次测试通过期间提取电路区域。 电流值可以由电压值代替。
    • 35. 发明授权
    • Semiconductor integrated circuit device
    • 半导体集成电路器件
    • US07495296B2
    • 2009-02-24
    • US11139590
    • 2005-05-31
    • Eisaku MaedaAkihiro MaejimaHiroki MatsunagaJinsaku KanedaMasahiko Sasada
    • Eisaku MaedaAkihiro MaejimaHiroki MatsunagaJinsaku KanedaMasahiko Sasada
    • H01L29/94
    • H01L27/11803H01L2924/0002H01L2924/00
    • The present invention relates to a layout of a multi-channel semiconductor integrated circuit and provides a layout of a semiconductor integrated circuit having ternary circuits in order to increase a degree of integration in the semiconductor integrated circuit and stabilize output characteristics. A ternary circuit is formed by arranging a second high-side transistor, a diode, a second level shift circuit on one hand, and a low-side transistor, a first high-side transistor, a first level shift circuit, and a pre-driver on the other, so that each of cells are arranged in a row and an output bonding pad is placed between the second high-side transistor and the low-side transistor, wherein a cell width of the first level shift circuit, second level shift circuit and pre-driver corresponds to a cell width of the low-side transistor.
    • 本发明涉及多通道半导体集成电路的布局,并提供具有三元电路的半导体集成电路的布局,以增加半导体集成电路中的集成度并稳定输出特性。 一方面通过布置第二高侧晶体管,二极管,第二电平移位电路和低端晶体管,第一高侧晶体管,第一电平移位电路和预置电路来形成三元电路, 驱动器,使得每个单元排列成一行,并且输出接合焊盘放置在第二高侧晶体管和低侧晶体管之间,其中第一电平移位电路的单元宽度,第二电平移位 电路和预驱动器对应于低侧晶体管的单元宽度。
    • 39. 发明申请
    • CAPACITIVE LOAD DRIVING CIRCUIT
    • 电容负载驱动电路
    • US20090167371A1
    • 2009-07-02
    • US11720507
    • 2006-01-11
    • Hiroshi AndoAkihiro MaejimaHiroki MatsunagaJinsaku KanedaEisaku Maeda
    • Hiroshi AndoAkihiro MaejimaHiroki MatsunagaJinsaku KanedaEisaku Maeda
    • H03K3/00
    • G09G3/296G09G3/293
    • It is aimed to reduce the area of an output circuit in a capacitive load driving circuit capable of high voltage output, such as a PDP scan driver for driving a plasma display panel. To achieve this, there are provided an arbitrary number of N-type MOS transistors 001, 002, . . . , and 003 including grounded sources and gates receiving a control signal, diodes 004, 005, . . . , and 006 paired with the N-type MOS transistors 001, 002, . . . , and 003, respectively, and including cathodes connected to drains of the N-type MOS transistors 001, 002, . . . , and 003 and anode, all connected to a first node 044, the number of diodes being the same as the number of N-type MOS transistors, and a first P-type MOS transistor 015 having a drain connected to the first node 044, a gate receiving a control signal and a source connected to a high voltage source.
    • 旨在减小能够高电压输出的电容性负载驱动电路中的输出电路的面积,例如用于驱动等离子体显示面板的PDP扫描驱动器。 为了实现这一点,提供了任意数量的N型MOS晶体管001,002。 。 。 ,003包括接收的源极和接收控制信号的门,二极管004,005,...。 。 。 ,006与N型MOS晶体管001,002配对。 。 。 和003,并且包括连接到N型MOS晶体管001,002的漏极的阴极。 。 。 ,003和阳极,全部连接到第一节点044,二极管的数量与N型MOS晶体管的数量相同,以及具有连接到第一节点044的漏极的第一P型MOS晶体管015, 接收控制信号的栅极和连接到高电压源的源极。
    • 40. 发明申请
    • Driver circuit
    • 驱动电路
    • US20060044041A1
    • 2006-03-02
    • US11211638
    • 2005-08-26
    • Eisaku MaedaHiroshi AndoJinsaku KanedaAkihiro MaejimaHiroki Matsunaga
    • Eisaku MaedaHiroshi AndoJinsaku KanedaAkihiro MaejimaHiroki Matsunaga
    • H03L5/00
    • H03K3/356113G09G3/296G09G2330/04H03K3/012H03K19/0013
    • A driver circuit is provided for preventing generation of a pass-through current in a CMOS output unit even if a power supply voltage VDD supplied from a low voltage power supply drops below a recommended operating power supply voltage. The driver circuit includes a level shift unit having PMOS transistors and NMOS transistors, and a CMOS output unit having a PMOS transistor and an NMOS transistor. The source, drain and gate of one PMOS transistor are respectively connected to a high voltage power supply, a first contact and a second contact. The source, drain and gate of a second PMOS transistor are respectively connected to a high voltage power supply, the second contact and the first contact. The source of one NMOS transistor is grounded, the drain thereof is connected to the first contact, and the gate thereof receives a low voltage signal. The source of a second NMOS transistor is grounded, the drain thereof is connected to the second contact, and the gate thereof receives a low voltage signal. In this driver circuit, the driving current of the one PMOS transistor is higher than the driving current of the one NMOS transistor.
    • 即使从低电压电源提供的电源电压VDD低于推荐的工作电源电压,也提供用于防止在CMOS输出单元中产生通过电流的驱动电路。 驱动器电路包括具有PMOS晶体管和NMOS晶体管的电平移位单元和具有PMOS晶体管和NMOS晶体管的CMOS输出单元。 一个PMOS晶体管的源极,漏极和栅极分别连接到高压电源,第一触点和第二触点。 第二PMOS晶体管的源极,漏极和栅极分别连接到高压电源,第二触点和第一触点。 一个NMOS晶体管的源极接地,其漏极连接到第一触点,其栅极接收低电压信号。 第二NMOS晶体管的源极接地,其漏极连接到第二触点,并且其栅极接收低电压信号。 在该驱动电路中,一个PMOS晶体管的驱动电流高于一个NMOS晶体管的驱动电流。