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    • 35. 发明授权
    • Power supply circuit for generating an internal power supply potential
based on an external potential
    • 用于基于外部电位产生内部电源电位的电源电路
    • US5587648A
    • 1996-12-24
    • US378217
    • 1995-01-25
    • Shinichi JinboShigeru Mori
    • Shinichi JinboShigeru Mori
    • G11C11/407G11C5/14G11C11/409G05F1/613
    • G11C5/147G11C5/14
    • An internal power supply circuit of the present invention includes a primary internal power supply potential supplying circuit, two auxiliary internal power supply potential supplying circuits, and a P channel MOS transistor. The internal power supply potential supplying circuit always supplies an internal power supply potential to a first output node based on an external power supply potential. One auxiliary internal power supply potential supplying circuit is activated in response to a control signal, and, when activated, supplies the internal power supply potential to the first output node. The other auxiliary internal power supply potential supplying circuit is activated in response to another control signal, and, when activated, supplies the internal power supply potential to a second output node. The P channel MOS transistor is connected between the first output node and the second output node. The P channel MOS transistor has a gate electrode receiving the control signal.
    • 本发明的内部电源电路包括主内部电源电位供给电路,两个辅助内部电源电位供给电路和P沟道MOS晶体管。 内部电源电位供应电路总是基于外部电源电位向第一输出节点提供内部电源电位。 响应于控制信号激活一个辅助内部电源电位供应电路,并且当被激活时,将内部电源电位提供给第一输出节点。 另一个辅助内部电源电位供应电路响应于另一个控制信号被激活,并且当被激活时,将内部电源电位提供给第二输出节点。 P沟道MOS晶体管连接在第一输出节点和第二输出节点之间。 P沟道MOS晶体管具有接收控制信号的栅电极。
    • 38. 发明授权
    • Semiconductor device having an improved immunity to a short-circuit at a
power supply line
    • 具有对电源线短路的抗干扰性的半导体装置
    • US5519650A
    • 1996-05-21
    • US301752
    • 1994-09-07
    • Tooru IchimuraKazuhiro SakemiShigeru MoriMikio Sakurai
    • Tooru IchimuraKazuhiro SakemiShigeru MoriMikio Sakurai
    • G11C11/41G11C29/50H01L21/3205H01L21/82H01L23/52H01L23/525G11C5/06
    • G11C29/50H01L23/5258H01L2924/0002
    • A semiconductor memory device includes a memory cell array (1) having a plurality of memory cells arranged in rows and columns, a plurality of column select lines (3) extending over the memory cell array and coupled to received column select signals generated by a column decoder (100), a plurality of power supply lines (4) provided in parallel with the column select lines to transfer a power supply voltage from a main power supply line (130), and a plurality of ground lines (5) provided in parallel with the column select lines to transfer a ground voltage from a main ground line. A plurality of fuse elements (6) are provided for each of the column select lines. When a short-circuit is found between a column select line and power supply line or a ground line, a fuse element corresponding to the short-circuited column select line is blown off and the short-circuited column select line is isolated from the column decoder. By repairing the short-circuited column select line with a redundant column select line (60), the memory device operates correctly without an adverse effect of the short-circuit.
    • 半导体存储器件包括具有以行和列排列的多个存储器单元的存储单元阵列(1),在存储单元阵列上延伸的多个列选择线(3),并与由列产生的接收列选择信号耦合 解码器(100),与列选择线并联设置的多个电源线(4),用于传送来自主电源线(130)的电源电压和并联设置的多个接地线(5) 列选择线从主地线传输接地电压。 为每个列选择线提供多个熔丝元件(6)。 当在列选择线和电源线或接地线之间发现短路时,与短路列选择线相对应的熔丝元件被断开,并且短路列选择线与列解码器隔离 。 通过修复具有冗余列选择线(60)的短路列选择线,存储器件正常工作而没有短路的不利影响。
    • 39. 发明授权
    • Semiconductor integrated circuit device with an internal voltage-down
converter
    • 具有内部降压转换器的半导体集成电路器件
    • US5451896A
    • 1995-09-19
    • US980414
    • 1992-11-20
    • Shigeru Mori
    • Shigeru Mori
    • G11C11/407G11C11/401G11C29/00G11C29/06H01L27/02G05F1/10
    • H01L27/0214
    • A semiconductor integrated circuit device includes an aging mode control circuit, which detects the times of toggle of an external supply voltage (external Vcc) with a predetermined amplitude and generates an aging mode enable signal, and an internal voltage reduction circuit transmitting a voltage, which changes in accordance with change of the external supply voltage (external Vcc), onto an internal supply line in response to the aging mode enable signal. The semiconductor integrated circuit device enters an aging mode only when the external supply voltage oscillates a predetermined number of times with an amplitude not less than the predetermined amplitude. The semiconductor integrated circuit device does not unnecessarily enter the aging mode for an aging test, and facilely and surely enters the aging mode without utilizing a special timing relationship of external control signals.
    • 半导体集成电路装置包括老化模式控制电路,其检测具有预定振幅的外部电源电压(外部Vcc)的触发次数并产生老化模式使能信号,以及内部电压降低电路,其传输电压, 根据老化模式使能信号,根据外部电源电压(外部Vcc)的变化,改变内部电源线。 仅当外部电源电压以不小于预定幅度的振幅振荡预定次数时,半导体集成电路器件进入老化模式。 半导体集成电路器件不会不必要地进入用于老化测试的老化模式,并且在不利用外部控制信号的特殊定时关系的情况下,便利且可靠地进入老化模式。
    • 40. 发明授权
    • Crosslinkable polysilane compositions and cured products thereof
    • 可交联聚硅烷组合物及其固化产物
    • US5384382A
    • 1995-01-24
    • US96273
    • 1993-07-26
    • Shigeru MoriEiichi TabeiHisashi Umehara
    • Shigeru MoriEiichi TabeiHisashi Umehara
    • C08L83/14C08G77/08
    • C08L83/14
    • Crosslinkable polysilane compositions contain (1) an alkenylsiloxy--terminated polysilane and a compound having at least three hydrosilyl groups in a molecule, (2) a hydro--siloxy--terminated polysilane and a compound having at least three alkenyl groups in a molecule, (3) a hydro--terminated polysilane and a compound having at least three alkenyl groups in a molecule, or (4) an alkenyl--terminated polysilane and a compound having at least three hydrosilyl groups in a molecule. By effecting hydrosilylation reaction between the components in the presence of a hydrosilylation catalyst, a tough crosslinked film is obtained without causing scission of a polysilane chain.
    • 可交联聚硅烷组合物含有(1)分子内具有至少三个氢化甲硅烷基的烯基甲硅烷氧基封端的聚硅烷和具有至少三个氢化甲硅烷基的化合物,(2)分子中具有至少三个烯基的水 - 甲硅烷氧基封端的聚硅烷和(3) )加氢封端的聚硅烷和分子中具有至少三个烯基的化合物,或(4)分子内具有至少三个氢化甲硅烷基的烯基封端的聚硅烷和化合物。 通过在氢化硅烷化催化剂的存在下进行组分之间的氢化硅烷化反应,获得坚韧的交联膜而不引起聚硅烷链断裂。