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    • 31. 发明申请
    • Semiconductor device and method of fabricating the same
    • 半导体装置及其制造方法
    • US20070052041A1
    • 2007-03-08
    • US10558671
    • 2004-05-31
    • Haruyuki SoradaTakeshi TakagiAkira AsaiYoshihiko KanzawaKouji KatayamaJunko Iwanaga
    • Haruyuki SoradaTakeshi TakagiAkira AsaiYoshihiko KanzawaKouji KatayamaJunko Iwanaga
    • H01L29/94
    • H01L29/785H01L29/66795H01L29/78687
    • A semiconductor device according to this invention includes: a first insulating layer (11); a first body section (13) including an island-shaped semiconductor formed on the first insulating layer; a second body section (14) including an island-shaped semiconductor formed on the first insulating layer; a ridge-shaped connecting section (15) formed on the first insulating layer to interconnect the first body section and the second body section; a channel region (15a) formed by at least a part of the connecting section in lengthwise direction of the connecting section; a gate electrode (18) formed to cover a periphery of the channel region, with a second insulating layer intervening therebetween; a source region formed to extend over the first body section and a portion of the connecting section between the first body section and the channel region; and a drain region formed to extend over the second body section and a portion of the connecting section between the second body section and the channel region, wherein a semiconductor forming the channel region has a lattice strain.
    • 根据本发明的半导体器件包括:第一绝缘层(11); 第一主体部分(13),其包括形成在所述第一绝缘层上的岛状半导体; 包括形成在所述第一绝缘层上的岛状半导体的第二主体部分(14) 形成在第一绝缘层上以互连第一主体部分和第二主体部分的脊形连接部分(15); 由所述连接部的至少一部分在所述连接部的长度方向上形成的通路区域(15a) 形成为覆盖沟道区域的周边的栅极电极(18),其间插入有第二绝缘层; 形成为在第一主体部分上延伸的源极区域和在第一主体部分和沟道区域之间的连接部分的一部分; 以及形成为在第二主体部分上延伸的漏极区域和在第二主体部分和沟道区域之间的连接部分的一部分,其中形成沟道区域的半导体具有晶格应变。
    • 33. 发明授权
    • Bipolar transistor device having phosphorous
    • 具有磷的双极晶体管器件
    • US06893934B2
    • 2005-05-17
    • US10603737
    • 2003-06-26
    • Teruhit OhnishiAkira Asai
    • Teruhit OhnishiAkira Asai
    • H01L29/73H01L21/331H01L21/8222H01L21/8248H01L21/8249H01L27/06H01L29/165H01L29/732H01L29/737
    • H01L29/66242H01L29/7378
    • A Si1-xGex layer 111b functioning as the base composed of an i—Si1-xGex layer and a p+ Si1-xGex layer is formed on a collector layer 102, and a Si cap layer 111a as the emitter is formed on the p+ Si1-xGex layer. An emitter lead electrode 129, which is composed of an n− polysilicon layer 129b containing phosphorus in a concentration equal to or lower than the solid-solubility limit for single-crystal silicon and a n+ polysilicon layer 129a containing phosphorus in a high concentration, is formed on the Si cap layer 111a in a base opening 118. The impurity concentration distribution in the base layer is properly maintained by suppressing the Si cap layer 111a from being doped with phosphorus (P) in an excessively high concentration. The upper portion of the Si cap layer 111a may contain a p-type impurity. The p-type impurity concentration distribution in the base layer of an NPN bipolar transistor is thus properly maintained.
    • 作为由i-Si 1-x Ge x x构成的基底的Si 1-x Ge 2 x层111b, / SUB层,并且在集电极层102上形成有Si + 1-xSi Ge层,并且Si覆盖层111a 因为发射极形成在p + 1 Si 1-x Ge层上。 发射极引线电极129,其由含有等于或低于单晶硅的固溶度极限的磷的N +和/或多个多晶硅层129b组成, 在基底开口118中的Si覆盖层111a上形成含有高浓度磷的多晶硅层129a。 通过抑制Si覆盖层111a以过高的浓度掺杂磷(P)来适当地维持基层中的杂质浓度分布。 Si覆盖层111a的上部可以含有p型杂质。 因此,适当地维持NPN双极晶体管的基极层中的p型杂质浓度分布。
    • 36. 发明授权
    • Bipolar transistor device having phosphorous
    • 具有磷的双极晶体管器件
    • US06674149B2
    • 2004-01-06
    • US10009201
    • 2001-12-10
    • Teruhito OhnishiAkira Asai
    • Teruhito OhnishiAkira Asai
    • H01L27082
    • H01L29/66242H01L29/7378
    • A Si1-xGex layer 111b functioning as the base composed of an i-Si1-xGex layer and a p+ Si1-xGex layer is formed on a collector layer 102, and a Si cap layer 111a as the emitter is formed on the p+ Si1-xGex layer. An emitter lead electrode 129, which is composed of an n− polysilicon layer 129b containing phosphorus in a concentration equal to or lower than the solid-solubility limit for single-crystal silicon and a n+ polysilicon layer 129a containing phosphorus in a high concentration, is formed on the Si cap layer 111a in a base opening 118. The impurity concentration distribution in the base layer is properly maintained by suppressing the Si cap layer 111a from being doped with phosphorus (P) in an excessively high concentration. The upper portion of the Si cap layer 111a may contain a p-type impurity. The p-type impurity concentration distribution in the base layer of an NPN bipolar transistor is thus properly maintained.
    • 在集电极层102上形成用作由i-Si1-xGex层和ap + Si1-xGex层构成的基底的Si1-xGex层111b,在p上形成作为发射极的Si覆盖层111a Si1-xGex层。 发射极引线电极129,其由含有等于或低于单晶硅的固溶度极限的磷的n +多晶硅层129b和含有磷的多晶硅层129a组成 在基底开口118中的Si覆盖层111a上形成高浓度。通过抑制Si覆盖层111a以过高的浓度掺杂磷(P)来适当地保持基底层中的杂质浓度分布。 Si覆盖层111a的上部可以含有p型杂质。 因此,适当地维持NPN双极晶体管的基极层中的p型杂质浓度分布。
    • 38. 发明授权
    • Liquid discharging method accompanied by the displacement of a movable member, a liquid jet head for implementing such method, and a liquid jet apparatus for the implementation thereof
    • 伴随可移动部件的移动的液体排出方法,用于实施这种方法的液体喷射头和用于实现该方法的液体喷射装置
    • US06595625B2
    • 2003-07-22
    • US08889184
    • 1997-07-07
    • Sadayuki SugamaAkira AsaiHiroyuki IshinagaToshio KashinoKiyomitsu KudoHiroyuki Sugiyama
    • Sadayuki SugamaAkira AsaiHiroyuki IshinagaToshio KashinoKiyomitsu KudoHiroyuki Sugiyama
    • B41J205
    • B41J2/14048B41J2/14129B41J2202/21
    • A liquid discharging method comprises the step of displacing the free end of the movable member following the creation of air bubble in the air bubble generating area. For this method, the fulcrum of the movable member is positioned on the side different from liquid discharging side with respect to the displacement area for the free end of the movable member to be displaceable, and at the same time, the free end thereof is arranged to face the effective bubbling area positioned on the downstream side of the central portion of the length of the effective bubbling area that forms the bubble generating area in the direction of the movable member from the fulcrum to the free end thereof, and a part of the effective bubbling area positioned to face the free end of the movable member on the downstream side of the effective bubbling area is arranged to face the displacement area directly. Thus, the initiation of the displacement of the free end of the movable member is effectuated quickly and reliably, and the pressure exerted by the air bubble creation is led to the discharge port side and the fulcrum side of the movable member sufficiently at the time of bubbling, and the development of air bubble that follows is directed to the discharge port side more reliably and efficiently.
    • 液体排放方法包括在气泡生成区域中产生气泡之后移动可动构件的自由端的步骤。 对于该方法,可移动部件的支点相对于可移动部件的自由端的位移区域位于不同于液体排出侧的一侧上,并且同时其自由端被布置 面对有效起泡区域,该有效起泡区域位于有效起泡区域的长度的中心部分的下游侧,该有效起泡区域在可动构件的方向上从支点到其自由端形成气泡产生区域,并且部分 与有效起泡区域的下游侧的可动构件的自由端相对配置的有效鼓泡区域被配置为直接面对移动区域。 因此,快速可靠地实现可动构件的自由端的移动的开始,并且由气泡产生所施加的压力在可动构件的排出口侧和支点侧充分地被引导到 鼓泡,并且随后的气泡的发展更可靠和高效地引导到排出口侧。