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    • 31. 发明授权
    • Magnetic memory devices having a perpendicular magnetic tunnel junction
    • 具有垂直磁隧道结的磁存储器件
    • US09490298B2
    • 2016-11-08
    • US14264049
    • 2014-04-28
    • Woojin KimKi Woong KimWoo Chang Lim
    • Woojin KimKi Woong KimWoo Chang Lim
    • H01L29/82H01L21/8239H01L27/105H01L27/22H01L43/08G11C11/16H01F10/32
    • H01L27/222G11C11/161H01F10/3204H01F10/3254H01F10/3286H01L27/224H01L43/02H01L43/08H01L43/10
    • A magnetic memory device may include a free magnetic structure and a reference magnetic structure that are separated from each other by a tunnel barrier. The free magnetic structure may include an exchange-coupling layer, and first and second free layers that are separated from each other by the exchange-coupling layer. The first free layer may be provided between the second free layer and the tunnel barrier. A thickness of the first free layer may be greater than a first maximum anisotropy thickness, being the thickness at which the first free layer has maximum perpendicular anisotropy. A thickness of the second free layer may be smaller than a second maximum anisotropy thickness, being the thickness at which the second free layer has maximum perpendicular anisotropy. A magnetic tunnel junction having two free layers with different thicknesses can enable a magnetic memory device that has increased MR ratio and reduced switching current.
    • 磁存储器件可以包括通过隧道势垒彼此分离的自由磁结构和参考磁性结构。 自由磁结构可以包括交换耦合层,以及通过交换耦合层彼此分离的第一和第二自由层。 第一自由层可以设置在第二自由层和隧道势垒之间。 第一自由层的厚度可以大于第一最大各向异性厚度,即第一自由层具有最大垂直各向异性的厚度。 第二自由层的厚度可以小于第二最大各向异性厚度,即第二自由层具有最大垂直各向异性的厚度。 具有两个具有不同厚度的自由层的磁性隧道结可实现具有增加的MR比和降低的开关电流的磁存储器件。
    • 32. 发明授权
    • Magnetic memory devices
    • 磁存储器件
    • US09276198B2
    • 2016-03-01
    • US13967340
    • 2013-08-14
    • Woo Chang LimSangyong KimWhankyun KimSang Hwan ParkJeongheon Park
    • Woo Chang LimSangyong KimWhankyun KimSang Hwan ParkJeongheon Park
    • H01L43/08G11C11/16
    • H01L43/08G11C11/161G11C11/1659
    • A magnetic memory device according to embodiments includes a first reference magnetic layer on a substrate, a second reference magnetic layer on the first reference magnetic layer, a free layer between the first reference magnetic layer and the second reference magnetic layer, a first tunnel barrier layer between the first reference magnetic layer and the free layer, and a second tunnel barrier layer between the second reference magnetic layer and the free layer. The first reference magnetic, second reference magnetic and free layers each have a magnetization direction substantially perpendicular to a top surface of the substrate. A resistance-area product (RA) value of the first tunnel barrier layer is greater than that of the second tunnel barrier layer.
    • 根据实施例的磁存储器件包括衬底上的第一参考磁性层,第一参考磁性层上的第二参考磁性层,第一参考磁性层和第二参考磁性层之间的自由层,第一隧道势垒层 在第一参考磁性层和自由层之间,以及在第二参考磁性层和自由层之间的第二隧道势垒层。 第一参考磁性,第二参考磁性和自由层各自具有基本上垂直于衬底顶表面的磁化方向。 第一隧道势垒层的电阻面积乘积(RA)值大于第二隧道势垒层的电阻面积积(RA)值。