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    • 33. 发明申请
    • COUNTING DETECTOR
    • 计数器
    • WO2009133481A2
    • 2009-11-05
    • PCT/IB2009/051192
    • 2009-03-20
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBHMARKS, AvivHERRMANN, ChristophROESSL, Ewald
    • MARKS, AvivHERRMANN, ChristophROESSL, Ewald
    • G01T1/17
    • G01T1/17
    • A pulse shaper (124) includes an integrator (202) with a feedback capacitor (208) that stores integrated charge of a charge pulse indicative of a detected photon. An output pulse of the integrator includes a peak amplitude indicative of the detected photon. An end pulse identifier (214) identifies the end of the charge pulse. A controller (216) generates a control signal that invokes a reset of the integrator (202) when the end of the 5 pulse is identified. An energy discriminator (128) includes a chain of comparators (132) connected in series. An output of each of the comparators (702, 704) is influenced by an output of a previous one of the comparators (702, 704). A decision component (706) determines an output of the comparators (702, 704), and a controller component (708) triggers the decision component (706) to store the output of the comparators (702, 704) 10 after lapse of a charge collection time.
    • 脉冲整形器(124)包括具有反馈电容器(208)的积分器(202),该反馈电容器存储指示检测到的光子的电荷脉冲的积分电荷。 积分器的输出脉冲包括指示检测到的光子的峰值振幅。 结束脉冲识别器(214)识别充电脉冲的结束。 当识别出5脉冲的结束时,控制器(216)产生调用积分器(202)的复位的控制信号。 能量鉴别器(128)包括串联连接的比较器链(132)。 每个比较器(702,704)的输出受到前一个比较器(702,704)的输出的影响。 判定部件(706)确定比较器(702,704)的输出,并且控制器部件(708)触发判定部件(706),以在经过充电之后存储比较器(702,704)10的输出 收集时间。
    • 34. 发明申请
    • ELECTRICAL ISOLATION OF X-RAY SEMICONDUCTOR IMAGER PIXELS
    • X射线半导体成像像素的电气隔离
    • WO2009083920A1
    • 2009-07-09
    • PCT/IB2008/055539
    • 2008-12-26
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBHROESSL, EwaldPROKSA, Roland
    • ROESSL, EwaldPROKSA, Roland
    • H01L27/146
    • H01L27/1463H01L27/14659
    • To mitigate the influence of charge sharing occurring in semiconductor detectors, an improved semiconductor detector (200) is provided, which comprises: a plurality of anodes (210) arranged to form at least one opening (230), each opening being formed by two anodes in the plurality of anodes; at least one cathode (220); a detector cell (240) located between the plurality of anodes and the at least one cathode; wherein the detector cell comprises at least one groove (250), each of the at least one groove having a first opening (252) aligned with one of the at least one opening being formed by two anodes in the plurality of anodes, each of the at least one groove extending towards the at least one cathode. By forming grooves in the detector cell, the charge cloud generated by a single photon can be received by a corresponding anode instead of several neighboring anodes, which thereby improves the spectral resolution and count rate of a semiconductor detector.
    • 为了减轻在半导体检测器中发生的电荷共享的影响,提供了一种改进的半导体检测器(200),其包括:多个阳极(210),被布置成形成至少一个开口(230),每个开口由两个阳极形成 在多个阳极中; 至少一个阴极(220); 位于所述多个阳极和所述至少一个阴极之间的检测器单元(240); 其中所述检测器单元包括至少一个凹槽(250),所述至少一个凹槽中的每个凹槽具有与所述多个阳极中的两个阳极形成的所述至少一个开口中的一个开口对准的第一开口(252) 至少一个凹槽,朝向所述至少一个阴极延伸。 通过在检测器单元中形成凹槽,由单个光子产生的电荷云可由相应的阳极代替几个相邻的阳极来接收,从而提高半导体检测器的光谱分辨率和计数率。