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21. 发明授权

EP1494275B1 Method to inspect directionally solidified castings 有权
标题翻译： Verfahren zur Inspektion gerichteter erstarrter Gussteilen
公开(公告)号：EP1494275B1
公开(公告)日：2012-05-02
申请号：EP04253680.5
申请日：2004-06-18
申请人： United Technologies Corporation
发明人： Jones, Howard B , Bluege, John H
IPC分类号： H01L21/66 , C22C19/03 , G01N21/88
CPC分类号： G01N21/4788 , G01N21/8806 , G01N21/95 , G01N21/9515 , G01N2021/8918 , G01N2021/8928

22. 发明公开

EP2406618A2 APPARATUS AND METHOD FOR MEASURING HAZE OF SHEET MATERIALS OR OTHER MATERIALS 审中-公开
标题翻译：装置和方法用于测量薄膜浊度，或其他材料
公开(公告)号：EP2406618A2
公开(公告)日：2012-01-18
申请号：EP10751185.9
申请日：2010-03-02
申请人： Honeywell International Inc.
发明人： SHAKESPEARE, Tarja T. , SHAKESPEARE, John F.
IPC分类号： G01N21/89 , G01N21/86 , B65H7/02 , B65H43/00
CPC分类号： G01N21/47 , G01N21/59 , G01N21/896 , G01N21/958 , G01N2021/8928
摘要： A method includes illuminating (902) a material (102, 202, 302) with first light (108, 208, 308, 504, 604, 802) and capturing (904) an image (400, 700) of second light (114-116, 214-216, 314-316, 804, 808, 814, 816, 822) transmitted through the material. The method also includes analyzing (908) multiple regions (402-406, 702) of the image and determining (910) one or more haze measurements associated with the material based on the analyzing. The method further includes storing and/or outputting (910) the one or more haze measurements. Analyzing the multiple regions of the image may include summing pixel values in each region to produce a total pixel value for that region. The multiple regions of the image may include (i) a first region forming a first disc, (ii) a second region forming either a first annular region around the first region or a second disc larger than and including the first disc, and (iii) a third region forming either a second annular region around the second region or a third disc larger than and including the first and second discs.

23. 发明公开

EP1015875A1 VERFAHREN ZUM ERKENNEN VON DIFFUS STREUENDEN MATERIALIEN, VERUNREINIGUNGEN UND SONSTIGEN FEHLERN BEI TRANSPARENTEN GEGENSTÄNDEN 有权
标题翻译：过程识别漫散射的材料，杂质等缺陷透明物体
公开(公告)号：EP1015875A1
公开(公告)日：2000-07-05
申请号：EP98952616.5
申请日：1998-09-21
申请人： Heuft Systemtechnik GmbH
发明人： HEUFT, Bernhard
IPC分类号： G01N21/90
CPC分类号： G01N21/90 , G01N21/9018 , G01N2021/8829 , G01N2021/8832 , G01N2021/8928
摘要： The invention concerns a method for identifying in objects made of transparent material, for example, drink bottles, diffuse dispersion defects, wherein the objects concerned (10) are examined by means of a light source (12) and a camera (16), a contrast model (14) being arranged between the light source (12) and the object to be examined. The diffuse dispersion defects are identified on the basis of a decrease in the contrast effect of the contrast model (14) represented through the object.

24. 发明授权

US08563958B2 Inspection apparatus and inspection method 有权
标题翻译：检验仪器和检验方法
公开(公告)号：US08563958B2
公开(公告)日：2013-10-22
申请号：US13328768
申请日：2011-12-16
申请人： Kazuo Takahashi , Takahiro Jingu
发明人： Kazuo Takahashi , Takahiro Jingu
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N2021/8896 , G01N2021/8928
摘要： Reflected light caused by the state of the surface of a wafer, a foreign material, or a defect is superimposed on a haze frequency component caused by the type and thickness of a film or a surface irregularity. In order to detect a haze frequency component caused by a haze present on the surface of an object to be inspected, light propagating from the object to be inspected is detected and converted into an electric signal. The electric signal is sampled at a predetermined sampling time interval and converted into digital data. A frequency component caused by a foreign material, a defect or the like is separated from the digital data to ensure that a haze frequency component is selected. The haze frequency component is caused by a stain attached to the surface of the wafer, hazy tarnish, a surface irregularity or the like.
摘要翻译：由晶片的表面状态，异物或缺陷引起的反射光叠加在由膜的类型和厚度或表面不规则性引起的雾度频率分量上。为了检测由待检查物体的表面上存在的雾度引起的雾度频率分量，检测从被检查物体传播的光，并将其转换为电信号。以预定的采样时间间隔采样电信号并将其转换为数字数据。由异物引起的频率分量，缺陷等与数字数据分离，以确保选择雾度频率分量。雾度频率分量由附着在晶片表面的污迹，模糊晦暗，表面不规则等引起。

25. 发明授权

US08184294B2 Apparatus and method for measuring haze of sheet materials or other materials 有权
标题翻译：用于测量片材或其他材料的雾度的装置和方法
公开(公告)号：US08184294B2
公开(公告)日：2012-05-22
申请号：US12400641
申请日：2009-03-09
申请人： Tarja T. Shakespeare , John F. Shakespeare
发明人： Tarja T. Shakespeare , John F. Shakespeare
IPC分类号： G01N21/00
CPC分类号： G01N21/47 , G01N21/59 , G01N21/896 , G01N21/958 , G01N2021/8928
摘要： A method includes illuminating a material with first light and capturing an image of second light transmitted through the material. The method also includes analyzing multiple regions of the image and determining one or more haze measurements associated with the material based on the analyzing. The method further includes storing and/or outputting the one or more haze measurements. Analyzing the multiple regions of the image may include summing pixel values in each region to produce a total pixel value for that region. The multiple regions of the image may include (i) a first region forming a first disc, (ii) a second region forming either a first annular region around the first region or a second disc larger than and including the first disc, and (iii) a third region forming either a second annular region around the second region or a third disc larger than and including the first and second discs.
摘要翻译：一种方法包括用第一光照射材料并捕获通过材料透射的第二光的图像。该方法还包括基于分析来分析图像的多个区域并确定与材料相关联的一个或多个雾度测量。该方法还包括存储和/或输出一个或多个雾度测量。分析图像的多个区域可以包括对每个区域中的像素值求和以产生该区域的总像素值。图像的多个区域可以包括（i）形成第一盘的第一区域，（ii）形成围绕第一区域的第一环形区域或大于并包括第一盘的第二盘的第二区域，以及（iii））形成围绕第二区域的第二环形区域或大于并包括第一和第二盘的第三盘的第三区域。

26. 发明授权

US08101935B2 Inspection apparatus and inspection method 有权
标题翻译：检验仪器和检验方法
公开(公告)号：US08101935B2
公开(公告)日：2012-01-24
申请号：US12272211
申请日：2008-11-17
申请人： Kazuo Takahashi , Takahiro Jingu
发明人： Kazuo Takahashi , Takahiro Jingu
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N2021/8896 , G01N2021/8928
摘要： Reflected light caused by the state of the surface of a wafer, a foreign material or a defect is superimposed on a haze frequency component caused by the type and thickness of a film or a surface irregularity. It has therefore been difficult to accurately measure the haze frequency component by use of a fixed threshold value. In order to detect a haze frequency component caused by a haze present on the surface of an object to be inspected, light propagating from the object to be inspected is detected and converted into an electric signal. The electric signal is sampled at a predetermined sampling time interval and converted into digital data. A frequency component caused by a foreign material, a defect or the like is separated from the digital data to ensure that a haze frequency component is selected. The haze frequency component is caused by a stain attached to the surface of the wafer, hazy tarnish, a surface irregularity or the like.
摘要翻译：由晶片表面的状态，异物或缺陷引起的反射光叠加在由膜的类型和厚度或表面不规则性引起的雾度频率分量上。因此，难以通过使用固定的阈值来精确地测量雾度频率分量。为了检测由待检查物体的表面上存在的雾度引起的雾度频率分量，检测从被检查物体传播的光，并将其转换为电信号。以预定的采样时间间隔采样电信号并将其转换为数字数据。由异物引起的频率分量，缺陷等与数字数据分离，以确保选择雾度频率分量。雾度频率分量由附着在晶片表面的污迹，模糊晦暗，表面不规则等引起。

27. 发明申请

US20090140180A1 INSPECTION APPARATUS AND INSPECTION METHOD 有权
标题翻译：检查装置和检查方法
公开(公告)号：US20090140180A1
公开(公告)日：2009-06-04
申请号：US12272211
申请日：2008-11-17
申请人： Kazuo Takahashi , Takahiro Jingu
发明人： Kazuo Takahashi , Takahiro Jingu
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N2021/8896 , G01N2021/8928
摘要： Reflected light caused by the state of the surface of a wafer, a foreign material or a defect is superimposed on a haze frequency component caused by the type and thickness of a film or a surface irregularity. It has therefore been difficult to accurately measure the haze frequency component by use of a fixed threshold value. In order to detect a haze frequency component caused by a haze present on the surface of an object to be inspected, light propagating from the object to be inspected is detected and converted into an electric signal. The electric signal is sampled at a predetermined sampling time interval and converted into digital data. A frequency component caused by a foreign material, a defect or the like is separated from the digital data to ensure that a haze frequency component is selected. The haze frequency component is caused by a stain attached to the surface of the wafer, hazy tarnish, a surface irregularity or the like.
摘要翻译：由晶片表面的状态，异物或缺陷引起的反射光叠加在由膜的类型和厚度或表面不规则性引起的雾度频率分量上。因此，难以通过使用固定的阈值来精确地测量雾度频率分量。为了检测由待检查物体的表面上存在的雾度引起的雾度频率分量，检测从被检查物体传播的光，并将其转换为电信号。以预定的采样时间间隔采样电信号并将其转换为数字数据。由异物引起的频率分量，缺陷等与数字数据分离，以确保选择雾度频率分量。雾度频率分量由附着在晶片表面的污迹，模糊晦暗，表面不规则等引起。

28. 发明授权

US07405828B2 Method for measuring the degree of crosslinking of pressure sensitive adhesive 失效
标题翻译：测量压敏粘合剂交联度的方法
公开(公告)号：US07405828B2
公开(公告)日：2008-07-29
申请号：US11453805
申请日：2006-06-16
申请人： Yi-Hui Tan , Hao-Fei Kuo , Jen-Yen Lo
发明人： Yi-Hui Tan , Hao-Fei Kuo , Jen-Yen Lo
IPC分类号： G01N21/00 , G01N21/47
CPC分类号： C09J133/04 , G01N21/47 , G01N2021/8928
摘要： A method for measuring the degree of crosslinking of pressure sensitive adhesive. The method, having the advantages of simple steps and short measuring time, comprises immersing a transparent substrate coated with a pressure sensitive adhesive in a solvent. After a specific period, the haze of the transparent substrate is measured. The obtained haze is compared with a predetermined reference, thereby determining the degree of crosslinking of the pressure sensitive adhesive.
摘要翻译：用于测量压敏粘合剂的交联度的方法。具有简单步骤和短测量时间优点的方法包括将涂有压敏粘合剂的透明基材浸入溶剂中。经过一定时间后，测量透明基板的雾度。将获得的雾度与预定参考值进行比较，由此确定压敏粘合剂的交联度。

29. 发明授权

US06239870B1 Method for identifying materials, impurities and related defects with diffuse dispersion transparent objects 有权
标题翻译：用扩散色散透明物质识别材料，杂质和相关缺陷的方法
公开(公告)号：US06239870B1
公开(公告)日：2001-05-29
申请号：US09508137
申请日：2000-03-07
申请人： Bernhard Heuft
发明人： Bernhard Heuft
IPC分类号： G01N2100
CPC分类号： G01N21/90 , G01N21/9018 , G01N2021/8829 , G01N2021/8832 , G01N2021/8928
摘要： Diffusely scattering defects are to be detected in items made from transparent material, e.g. drinks bottles. To this end, the items (10) are inspected using a light source (12) and a camera (16), a contrast pattern (14) being arranged between the light source (12) and the item to be inspected. Diffusely scattering defects are detected by a decrease in the contrast of the contrast pattern (14) reproduced through the item.
摘要翻译：在由透明材料制成的物品中检测漫射散射缺陷，例如。饮料瓶为此，使用光源（12）和照相机（16），在光源（12）和待检查物品之间布置对比度图案（14）来检查物品（10）。通过物品再现的对比度图案（14）的对比度的降低来检测漫射散射缺陷。

30. 发明申请

WO2010104699A2 APPARATUS AND METHOD FOR MEASURING HAZE OF SHEET MATERIALS OR OTHER MATERIALS 审中-公开
标题翻译：用于测量材料或其他材料的HAZE的装置和方法
公开(公告)号：WO2010104699A2
公开(公告)日：2010-09-16
申请号：PCT/US2010/025877
申请日：2010-03-02
申请人： HONEYWELL INTERNATIONAL INC. , SHAKESPEARE, Tarja T. , SHAKESPEARE, John F.
发明人： SHAKESPEARE, Tarja T. , SHAKESPEARE, John F.
IPC分类号： G01N21/89 , G01N21/86 , B65H7/02 , B65H43/00
CPC分类号： G01N21/47 , G01N21/59 , G01N21/896 , G01N21/958 , G01N2021/8928
摘要： A method includes illuminating (902) a material (102, 202, 302) with first light (108, 208, 308, 504, 604, 802) and capturing (904) an image (400, 700) of second light (114-116, 214-216, 314-316, 804, 808, 814, 816, 822) transmitted through the material. The method also includes analyzing (908) multiple regions (402-406, 702) of the image and determining (910) one or more haze measurements associated with the material based on the analyzing. The method further includes storing and/or outputting (910) the one or more haze measurements. Analyzing the multiple regions of the image may include summing pixel values in each region to produce a total pixel value for that region. The multiple regions of the image may include (i) a first region forming a first disc, (ii) a second region forming either a first annular region around the first region or a second disc larger than and including the first disc, and (iii) a third region forming either a second annular region around the second region or a third disc larger than and including the first and second discs.
摘要翻译：一种方法包括用第一光（108,208,308,504,602,802）照射（902）材料（102,202,302）并且捕获（904）第二光（114-）的图像（400,700） 116,214-216,314-316,804,808,814,816,822）。该方法还包括分析（908）图像的多个区域（402-406,702），并且基于分析确定（910）与材料相关联的一个或多个雾度测量。该方法还包括存储和/或输出（910）一个或多个雾度测量。分析图像的多个区域可以包括对每个区域中的像素值求和以产生该区域的总像素值。图像的多个区域可以包括（i）形成第一盘的第一区域，（ii）形成围绕第一区域的第一环形区域或大于并包括第一盘的第二盘的第二区域，以及（iii））形成围绕第二区域的第二环形区域或大于并包括第一和第二盘的第三盘的第三区域。

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