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    • 22. 发明申请
    • GAS INJECTION SYSTEM FOR ION BEAM DEVICE
    • 离子束装置气体注入系统
    • WO2017040039A1
    • 2017-03-09
    • PCT/US2016/047236
    • 2016-08-17
    • VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    • WALLACE, JayALLEN, ErnestHERTEL, RichardDANIELS, KevinGILCHRIST, Glen
    • H01J37/32H01L21/67
    • H01J37/3244H01J37/02H01J37/3056H01J2237/006H01J2237/20228H01L21/68764
    • A gas injection system for an ion beam device, the gas injection system including an extraction plate, an extraction aperture formed in the extraction plate for allowing passage of an ion beam, a first gas distributor removably fastened to the extraction plate on a first side of the extraction aperture, the first gas distributor having a gas orifice formed therein, a second gas distributor removably fastened to the extraction plate on a second side of the extraction aperture opposite the first side, the second gas distributor having a gas orifice formed therein, a first gas conduit extending through the extraction plate between the first gas distributor and a gas manifold mounted to the extraction plate, and a second gas conduit extending through the extraction plate between the second gas distributor the gas manifold, and a residue removal gas source connected to the gas manifold.
    • 一种用于离子束装置的气体注入系统,所述气体注入系统包括提取板,形成在所述提取板中用于允许离子束通过的提取孔,在所述提取板的第一侧上可移除地紧固到所述提取板的第一气体分配器 所述提取孔,所述第一气体分配器具有形成在其中的气体孔口;第二气体分配器,其在所述提取孔的与所述第一侧相对的第二侧上可拆卸地紧固到所述提取板,所述第二气体分配器具有形成在其中的气体孔口; 第一气体管道,其延伸穿过第一气体分配器和安装到提取板的气体歧管之间的提取板,以及第二气体导管,其延伸穿过第二气体分配器之间的提取板,气体歧管和残留物去除气体源连接到 气体歧管。
    • 23. 发明申请
    • CONTROLLING CONTAMINATION PARTICLE TRAJECTORY FROM A BEAM-LINE ELECTROSTATIC ELEMENT
    • 从光束静电元件控制污染颗粒物
    • WO2017019335A1
    • 2017-02-02
    • PCT/US2016/042493
    • 2016-07-15
    • VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    • LEE, William DavisLIKHANSKII, Alexandre
    • H01L21/265H01J37/317H01L21/683
    • H01J37/05H01J37/12H01J37/3171H01J2237/022H01J2237/028
    • Provided herein are approaches for controlling particle trajectory from a beam-line electrostatic element. A beam-line electrostatic element is disposed along a beam-line of an electrostatic filter (EF), and a voltage is supplied to the beam-line electrostatic element to generate an electrostatic field surrounding the beam-line electrostatic element, agitating a layer of contamination particles formed on the beam-line electrostatic element. A trajectory of a set of particles from the layer of contamination particles is then modified to direct the set of particles to a desired location within the EF. The trajectory is controlled by providing an additional electrode adjacent the beam-line electrostatic element, and supplying a voltage to the additional electrode to control a local electrostatic field in proximity to the beam-line electrostatic element. In another approach, the trajectory is influenced by one or more geometric features of the beam-line electrostatic element.
    • 本文提供了用于从束线静电元件控制粒子轨迹的方法。 沿着静电滤波器(EF)的光束线设置光束线静电元件,并且向束线静电元件供应电压以产生围绕光束线静电元件的静电场,搅动一层 形成在束线静电元件上的污染颗粒。 然后修改来自污染颗粒层的一组颗粒的轨迹,以将该组颗粒引导到EF内的期望位置。 通过在光束线静电元件附近提供附加电极来控制轨迹,并且向附加电极提供电压以控制靠近光束线静电元件的局部静电场。 在另一种方法中,轨迹受到束线静电元件的一个或多个几何特征的影响。