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    • 25. 发明授权
    • Exposure apparatus
    • 曝光装置
    • US06266131B1
    • 2001-07-24
    • US09309709
    • 1999-05-11
    • Tomohide HamadaHiroshi Shirasu
    • Tomohide HamadaHiroshi Shirasu
    • G03B2742
    • G03F7/70691G02F1/1303G03B27/58G03F7/70358
    • A method of transferring a pattern of a mask onto an object through a projection system, includes the steps of providing a carriage having a mask holder surface adapted to hold the mask in a position which is angularly displaced from a horizontal position by a predetermined angle and an object holder surface adapted to the object in a position which is angularly displaced from the horizontal position by the predetermined angle, the carriage being movable in a first direction; transferring the pattern onto the object, the projection system being located between the mask and the object during the transfer operation; moving the carriage so that the projection system comes to a position out of a place between the mask holder surface and the object holder surface; and conveying the object from the object holder surface.
    • 通过投影系统将掩模图案转印到物体上的方法包括以下步骤:提供具有掩模保持器表面的托架,所述托架表面适于将掩模保持在与水平位置成角度地移位预定角度的位置,以及 所述物体保持器表面适于在与所述水平位置成角度地移位预定角度的位置处,所述托架能够沿第一方向移动; 将图案转移到物体上,投影系统在转印操作期间位于掩模和物体之间; 移动滑架使得投影系统进入位于掩模保持器表面和物体保持器表面之间的位置; 并从物体保持器表面传送物体。
    • 27. 发明授权
    • Scanning exposure apparatus
    • 扫描曝光装置
    • US5715037A
    • 1998-02-03
    • US615853
    • 1996-03-12
    • Kazuaki SaikiSusumu MoriHiroshi Shirasu
    • Kazuaki SaikiSusumu MoriHiroshi Shirasu
    • G03F7/20G03F9/00H01L21/027
    • G03F7/70241G03F7/70275G03F7/70358G03F9/00G03F9/70
    • The present invention provides a scanning exposure apparatus for projecting an image of a pattern area of a mask having a first alignment mark onto a photosensitive substrate disposed on a substrate stage. A second alignment mark is provided on at least one of the photosensitive substrate and the substrate stage. The scanning exposure apparatus includes a plurality of projection optical systems disposed along a predetermined direction and adapted to receive the luminous fluxes passed through the mask and to project elected images of unchanged dimension of the plurality of illuminated regions of the mask onto the substrate. There is provided a mark detection system for detecting the first alignment mark on the mask and the second alignment mark, and at least one of the projection optical systems constitutes a part of the mark detection system.
    • 本发明提供了一种用于将具有第一对准标记的掩模的图案区域的图像投影到设置在基板台上的感光基板上的扫描曝光装置。 在感光基板和基板台的至少一个上设置第二对准标记。 扫描曝光装置包括沿着预定方向设置的多个投影光学系统,其适于接收通过掩模的光通量,并将掩模的多个照明区域的未改变尺寸的选定图像投影到基板上。 提供了一种用于检测掩模上的第一对准标记和第二对准标记的标记检测系统,并且至少一个投影光学系统构成标记检测系统的一部分。
    • 28. 发明授权
    • Exposure method and apparatus using holographic techniques
    • 使用全息技术的曝光方法和装置
    • US5504596A
    • 1996-04-02
    • US169055
    • 1993-12-20
    • Akihiro GotoTakashi GemmaYutaka IchiharaNobutaka MagomeNaomasa ShiraishiHiroshi ShirasuToshio Matsuura
    • Akihiro GotoTakashi GemmaYutaka IchiharaNobutaka MagomeNaomasa ShiraishiHiroshi ShirasuToshio Matsuura
    • G03F7/20G03H1/00G03H1/26
    • G03F7/70558G03F7/70625G03H1/00
    • An exposure apparatus is used for reproducing a mask pattern of a semiconductor device or the like onto a photosensitive substrate using a holography. The holography is utilized also in a process for alignment between a mask pattern hologram and an exposure region of the substrate. The pattern hologram is recorded to a recording medium by interference between an object wave from the pattern and a reference wave, and a second hologram is formed to the medium by diffraction light from an alignment mark formed on the mask. Prior to reconstruction of the pattern image, reconstruction light from the second hologram, illuminated with a reconstruction wave, is irradiated onto the substrate arranged in place of the mask. A reproduction image of the alignment mark on the substrate surface illuminated with the reconstruction light is measured, and relative displacement between the medium and the substrate is detected from a result of the measurement. The relative positional relationship between the medium and the substrate is corrected in accordance with the displacement information, and, thereafter, the surface is exposed with a reconstruction image of the pattern hologram.
    • 使用曝光装置将半导体装置等的掩模图案再现到使用全息术的感光基板上。 全息术也用于掩模图案全息图和衬底的曝光区域之间的对准的过程。 图案全息图通过来自图案的对象波与参考波之间的干涉而被记录到记录介质上,并且通过衍射光从形成在掩模上的对准标记的衍射光形成第二全息图。 在图案图像重建之前,用重建波照射的来自第二全息图的重建光被照射到布置在掩模上的衬底上。 测量用重建光照射的基板表面上的对准标记的再现图像,并且从测量结果检测介质和基板之间的相对位移。 根据位移信息来校正介质和基板之间的相对位置关系,然后用图案全息图的重构图像曝光表面。
    • 29. 发明申请
    • INTERMEDIATE VACUUM SEAL ASSEMBLY FOR SEALING A CHAMBER HOUSING TO A WORKPIECE
    • 用于将工作室密封住的室内真空密封组件
    • US20100245795A1
    • 2010-09-30
    • US12721493
    • 2010-03-10
    • Fardad A. HashemiHiroshi ShirasuDouglas C. Watson
    • Fardad A. HashemiHiroshi ShirasuDouglas C. Watson
    • G03B27/54H01J9/00
    • G03F7/70841G03B27/54G03F7/70525G03F7/70808
    • A chamber assembly (226) for providing a sealed chamber (38) adjacent to a workpiece (28) includes a chamber housing (244), a chamber pressure source (246) and a seal assembly (250). The chamber housing (244) cooperates with the workpiece (28) to define at least a portion of the sealed chamber (38). The chamber pressure source (246) controls a chamber pressure within the sealed chamber (38) to be different than the environmental pressure. The seal assembly (250) seals the chamber housing (244) to the workpiece (28). The seal assembly (250) can include a first seal contact region (270) and a second seal contact region (272) that cooperate to define a seal gap (274) adjacent to at least one of the chamber housing (244) and the workpiece (28). The seal assembly (250) may further include a seal pressure source (276) for controlling a seal pressure within the seal gap (274) so that the seal pressure is different than the chamber pressure and the environmental pressure. The first seal contact region (270) and the second seal contact region (272) cooperate to exert a first force (284) on a surface (278). The seal pressure source (276) generates a second force (286) on the surface (278). The first force (284) is approximately equal in magnitude and opposite in direction to the second force (286).
    • 用于提供与工件(28)相邻的密封腔(38)的腔室组件(226)包括腔室壳体(244),腔室压力源(246)和密封组件(250)。 腔室壳体(244)与工件(28)配合以限定密封腔室(38)的至少一部分。 腔室压力源(246)控制密封腔室(38)内的腔室压力不同于环境压力。 密封组件(250)将腔室壳体(244)密封到工件(28)。 密封组件(250)可以包括第一密封接触区域(270)和第二密封接触区域(272),第一密封接触区域(270)和第二密封接触区域(272)协作以限定邻近腔室壳体(244)和工件 (28)。 密封组件(250)还可以包括用于控制密封间隙(274)内的密封压力的密封压力源(276),使得密封压力不同于腔室压力和环境压力。 第一密封接触区域(270)和第二密封接触区域(272)协作以在表面(278)上施加第一力(284)。 密封压力源(276)在表面(278)上产生第二力(286)。 第一力(284)的大小相等并且在与第二力(286)相反的方向上相反。
    • 30. 发明授权
    • Projection exposure apparatus
    • 投影曝光装置
    • US06317196B1
    • 2001-11-13
    • US09209270
    • 1998-12-11
    • Tomohide HamadaHiroshi ShirasuYukio KakizakiKinya Kats
    • Tomohide HamadaHiroshi ShirasuYukio KakizakiKinya Kats
    • G03B2118
    • G03F7/70775G03F7/70358G03F7/70716G03F9/70
    • A projection exposure apparatus is provided. The projection exposure apparatus includes an illumination optical system for illuminating a portion of a mask pattern on a mask with an exposing radiation flux of a predetermined shape, a fixed support, a projection optical system fixed to the fixed support for projecting the image of the illuminated portion of the mask pattern onto a substrate, and a carriage for integrally holding the mask and the substrate, the carriage being movable in a predetermined direction with respect to the projection optical system to successively exposing the substrate with the image of the mask pattern formed by the exposing radiation flux. The projection exposure apparatus further includes a long mirror elongated in the predetermined direction and fixed to the fixed support, the length of the long mirror being at least equal to the stroke of the carriage movement in the predetermined direction, and a measurement system for measuring the position of the mask and the position of the substrate with respect to the long mirror to determine the position of the mask relative to the substrate in a direction perpendicular to the predetermined direction.
    • 提供投影曝光装置。 投影曝光装置包括:照射光学系统,用于以掩模形式曝光掩模图案的一部分,其具有预定形状的曝光辐射通量;固定支架;固定在固定支架上的投影光学系统,用于投射照明图像 掩模图案的一部分到基板上,以及滑架,用于一体地保持掩模和基板,托架可相对于投影光学系统沿预定方向移动,以使基板与由 曝光辐射通量。 投影曝光装置还包括在预定方向上延伸并固定到固定支撑件上的长镜,长反射镜的长度至少等于滑架在预定方向上的行程的行程,以及测量系统 掩模的位置和基板相对于长镜的位置,以确定掩模相对于基板在垂直于预定方向的方向上的位置。