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    • 21. 发明授权
    • Process for dicing a semiconductor wafer having a plated heat sink using
a temporary substrate
    • 使用临时基板对具有电镀散热片的半导体晶片进行切割的工序
    • US5457072A
    • 1995-10-10
    • US196757
    • 1994-02-15
    • Masahiro TamakiKouji AonoSinichi Sakamoto
    • Masahiro TamakiKouji AonoSinichi Sakamoto
    • H01L23/36B81C99/00H01L21/304H01L21/78H01L21/302
    • B81C1/00214H01L21/304H01L21/6835H01L21/6836H01L21/78H01L2221/68327Y10S438/977
    • A method for producing semiconductor chips includes preparing a semiconductor wafer having opposite front and rear surfaces and active semiconductor devices disposed in the semiconductor wafer at a part of the front surface, attaching a glass plate to the front surface of the semiconductor wafer, thinning the semiconductor wafer to a desired thickness from the rear surface, forming a first radiating layer over the rear surface of the semiconductor wafer, selectively forming a second radiating layer on the first radiating layer using, as a mask, a photoresist pattern covering portions of the first radiating layer opposite dicing regions, removing the semiconductor wafer from the glass plate, and cutting through the wafer and the first radiating layer with a dicing blade to produce a plurality of semiconductor chips. In this method, since the first radiating layer supports the thin wafer, the glass plate can be removed before the dicing process. Therefore, electrical testing of the semiconductor devices included in the wafer can be carried out before the wafer is divided into chips.
    • 一种制造半导体芯片的方法包括制备具有相对的前表面和后表面的半导体晶片和在前表面的一部分设置在半导体晶片中的有源半导体器件,将玻璃板附接到半导体晶片的前表面,使半导体 从后表面到期望的厚度,在半导体晶片的后表面上形成第一辐射层,在第一辐射层上选择性地形成第二辐射层,使用覆盖第一辐射层的部分的光刻胶图案作为掩模 层,相对的切割区域,从玻璃板去除半导体晶片,并用切割刀片切割晶片和第一辐射层,以产生多个半导体芯片。 在该方法中,由于第一辐射层支撑薄晶片,因此可以在切割处理之前去除玻璃板。 因此,在将晶片分成芯片之前,可以进行包括在晶片中的半导体器件的电气测试。
    • 24. 发明授权
    • Method of dicing semiconductor wafer
    • 切割半导体晶片的方法
    • US6136668A
    • 2000-10-24
    • US169928
    • 1998-10-09
    • Masahiro TamakiKazuo HayashiShozui Takeno
    • Masahiro TamakiKazuo HayashiShozui Takeno
    • H01L21/301H01L21/304H01L23/58
    • H01L21/3043
    • A semiconductor wafer is prepared which includes a semiconductor layer having on its surface a plurality of functional devices, and a separation line region surrounding and separating the plurality of functional devices from one another. A metal layer is formed on the surface of separation line region of semiconductor region. A reinforcing layer is formed on the surface of semiconductor wafer. By selectively etching the back surface of semiconductor layer, a hole is formed to surround the peripheries of functional device, passing through semiconductor layer and reaching from the back surface to metal layer. Reinforcing plate is removed from semiconductor wafer. Metal layer is irradiated with laser and fused to provide a plurality of semiconductor chips separated from one another.
    • 制备半导体晶片,其包括在其表面上具有多个功能器件的半导体层和围绕并分离多个功能器件的分离线区域。 在半导体区域的分离线区域的表面上形成金属层。 在半导体晶片的表面上形成增强层。 通过选择性地蚀刻半导体层的背面,形成围绕功能元件的周边的孔,穿过半导体层并从后表面到达金属层。 从半导体晶片去除加强板。 金属层用激光照射并熔合,以提供彼此分离的多个半导体芯片。
    • 26. 发明授权
    • Semiconductor device and method of manufacturing the same
    • 半导体装置及其制造方法
    • US06329671B1
    • 2001-12-11
    • US09642830
    • 2000-08-22
    • Masahiro TamakiKazuo HayashiShozui Takeno
    • Masahiro TamakiKazuo HayashiShozui Takeno
    • H01L2358
    • H01L21/3043H01L21/78
    • A semiconductor wafer is prepared which includes a semiconductor layer having on its surface a plurality of functional devices, and a separation line region surrounding and separating the plurality of functional devices from one another. A metal layer is formed on the surface of separation line region of semiconductor region. A reinforcing layer is formed on the surface of semiconductor wafer. By selectively etching the back surface of semiconductor layer, a hole is formed to surround the peripheries of functional device, passing through semiconductor layer and reaching from the back surface to metal layer. Reinforcing plate is removed from semiconductor wafer. Metal layer is irradiated with laser and fused to provide a plurality of semiconductor chips separated from one another.
    • 制备半导体晶片,其包括在其表面上具有多个功能器件的半导体层和围绕并分离多个功能器件的分离线区域。 在半导体区域的分离线区域的表面上形成金属层。 在半导体晶片的表面上形成增强层。 通过选择性地蚀刻半导体层的背面,形成围绕功能元件的周边的孔,穿过半导体层并从后表面到达金属层。 从半导体晶片去除加强板。 金属层用激光照射并熔合,以提供彼此分离的多个半导体芯片。
    • 27. 发明授权
    • Method of producing semiconductor device with heat dissipation metal layer and metal projections
    • 制造具有散热金属层和金属突起的半导体器件的方法
    • US06245596B1
    • 2001-06-12
    • US09427584
    • 1999-10-27
    • Katsuya KosakiMasahiro TamakiHiroshi Matsuoka
    • Katsuya KosakiMasahiro TamakiHiroshi Matsuoka
    • H01L2324
    • H01L21/78H01L23/3677H01L2924/0002H01L2924/00
    • A method of producing a semiconductor device having a heat dissipating metal layer wherein the number of patterning steps is reduced, laser dicing produces a better profile, and first and second metal layers are prevented from separating from each other, and a semiconductor device produced by the method. The number of patterning steps is reduced by employing a flat exposure step for photoresist with mask alignment. A better appearance is obtained by forming the metal layers which connect the semiconductor devices with each other from a first metal layer having a lower melting point and a second metal layer having a higher melting point and severing the first metal layer and the second metal layer successively, from the first metal layer side. A second metal layer is prevented from peeling by preventing oxidation of the plated feeder layer through plating of the second metal layer.
    • 一种制造具有散热金属层的半导体器件的方法,其中图案化步骤的数量减少,激光切割产生更好的轮廓,并且防止第一和第二金属层彼此分离,并且制造由 方法。 通过对具有掩模对准的光致抗蚀剂采用平坦曝光步骤来减少图案化步骤的数量。 通过形成从具有较低熔点的第一金属层和具有较高熔点的第二金属层彼此连接半导体器件的金属层,并且连续切断第一金属层和第二金属层而获得更好的外观 ,从第一金属层侧。 通过第二金属层的镀覆防止电镀料层的氧化,防止第二金属层剥离。