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    • 29. 发明授权
    • Redundancy semiconductor memory device with error correction code (ECC) circuits for correcting errors in recovery fuse data
    • 具有用于校正恢复熔丝数据中的错误的纠错码(ECC)电路的冗余半导体存储器件
    • US06915476B2
    • 2005-07-05
    • US11004799
    • 2004-12-07
    • Makoto MorinoMasayuki Nakamura
    • Makoto MorinoMasayuki Nakamura
    • G11C29/04G06F11/10G11C7/00G11C11/401G11C29/00G11C29/42
    • G06F11/1008G11C29/789G11C29/802G11C29/812
    • A semiconductor integrated circuit device includes a memory array having first to Nth banks, where N is an integer greater than or equal to 2. The memory array further includes a redundancy block having first to Nth column recovery circuit blocks corresponding to the first to Nth banks, first to Nth row recovery circuit blocks corresponding to the first to Nth banks, first to Nth ECC fuse blocks corresponding to the first to Nth banks, and first to Nth ECC circuits corresponding to the first to Nth banks. During initial cycles, the first to Nth ECC circuits correct errors in column recovery fuse data in the first to Nth column recovery circuit blocks and errors in row recovery fuse data in the first to Nth row recovery circuit blocks by using ECC fuse data in the first to Nth ECC fuse blocks, respectively.
    • 半导体集成电路装置包括具有第一至第N个存储体的存储器阵列,其中N是大于或等于2的整数。存储器阵列还包括具有与第一至第N个存储体相对应的第一至第N列恢复电路块的冗余块 对应于第一至第N组的第一至第N行恢复电路块,对应于第一至第N个存储体的第一至第N个ECC熔丝块以及对应于第一至第N个存储体的第一至第N个ECC电路。 在初始周期期间,第一至第N ECC电路通过在第一至第N行ECC恢复电路块中的第一至第N列恢复电路块中的ECC恢复熔丝数据和第一至第N行恢复电路块中的ECC恢复熔丝数据中的错误来校正第一至第N行恢复电路块中的ECC熔丝数据 到第N个ECC保险丝块。
    • 30. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • 半导体集成电路设备
    • US20050122800A1
    • 2005-06-09
    • US11004799
    • 2004-12-07
    • Makoto MorinoMasayuki Nakamura
    • Makoto MorinoMasayuki Nakamura
    • G11C29/04G06F11/10G11C7/00G11C11/401G11C29/00G11C29/42
    • G06F11/1008G11C29/789G11C29/802G11C29/812
    • A semiconductor integrated circuit device includes a memory array having first to Nth banks, where N is an integer greater than or equal to 2. The memory array further includes a redundancy block having first to Nth column recovery circuit blocks corresponding to the first to Nth banks, first to Nth row recovery circuit blocks corresponding to the first to Nth banks, first to Nth ECC fuse blocks corresponding to the first to Nth banks, and first to Nth ECC circuits corresponding to the first to Nth banks. During initial cycles, the first to Nth ECC circuits correct errors in column recovery fuse data in the first to Nth column recovery circuit blocks and errors in row recovery fuse data in the first to Nth row recovery circuit blocks by using ECC fuse data in the first to Nth ECC fuse blocks, respectively.
    • 半导体集成电路装置包括具有第一至第N个存储体的存储器阵列,其中N是大于或等于2的整数。存储器阵列还包括具有与第一至第N个存储体相对应的第一至第N列恢复电路块的冗余块 对应于第一至第N组的第一至第N行恢复电路块,对应于第一至第N个存储体的第一至第N个ECC熔丝块以及对应于第一至第N个存储体的第一至第N个ECC电路。 在初始周期期间,第一至第N ECC电路通过在第一至第N行ECC恢复电路块中的第一至第N列恢复电路块中的ECC恢复熔丝数据和第一至第N行恢复电路块中的ECC恢复熔丝数据中的错误来校正第一至第N行恢复电路块中的ECC熔丝数据 到第N个ECC保险丝块。