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    • 21. 发明申请
    • Photothermal conversion measuring instrument
    • 光热转换测量仪器
    • US20080123099A1
    • 2008-05-29
    • US11902279
    • 2007-09-20
    • Eiji TakahashiRyo KatayamaHiroyuki Takamatsu
    • Eiji TakahashiRyo KatayamaHiroyuki Takamatsu
    • G01B9/02G01N21/00
    • G01N21/171G01N21/031
    • There is provided a photothermal conversion measuring instrument which can measure change in property caused by thermal effect in a sample with high sensitivity and high accuracy by a simple structure. The instrument includes a current control circuit for sequentially switching output light of a plurality of excitation light sources each outputting excitation light having a different wavelength band so that one of the output light is irradiated to the sample, a light detector for interfering measurement light transmitted through the sample with reference light and detecting the intensity of the interference light, and a signal processor for extracting the same cycle components as the switching cycle of the output light switched by the current control circuit from a signal of the interference light intensity obtained from the light detector and for obtaining a difference of signal values corresponding to each of the excitation light based on the extracted signals.
    • 提供了一种光热转换测量仪器,可以通过简单的结构,以高灵敏度和高精度测量样品中热效应引起的性能变化。 该仪器包括电流控制电路,用于顺序地切换多个激发光源的输出光,每个激发光源输出具有不同波长带的激发光,使得输出光中的一个照射到样本,用于干扰测量光的光检测器, 具有参考光的样本并检测干涉光的强度;以及信号处理器,用于从由光获得的干涉光强度的信号中提取与由电流控制电路切换的输出光的切换周期相同的周期分量 并且用于基于所提取的信号获得与每个激发光对应的信号值的差异。
    • 22. 发明申请
    • PLASMA GENERATING DEVICE
    • 等离子体发生装置
    • US20070266947A1
    • 2007-11-22
    • US11519133
    • 2006-09-12
    • Masatoshi OnodaEiji Takahashi
    • Masatoshi OnodaEiji Takahashi
    • C23C16/00C23F1/00
    • C23C16/509C23C16/24H01J37/32082
    • A plasma generating device provided with a plasma generating chamber (10) and a high-frequency antenna (1) arranged in the chamber (10) for generating inductively coupled plasma by applying a high-frequency power to a gas in the chamber (10) from the antenna (1). The antenna (1) is a low-inductance antenna formed of a first portion (11) extending from the outside of the chamber (10) into the chamber (10), and a plurality of second portions (12) diverging from an inner end (11e) of the first portion (11) in an electrically parallel fashion, and having a termination (12e) directly connected to the inner wall of the grounded chamber (10). The surface of the antenna (1) is coated with an electrically insulating material. Frequency of the high-frequency power applied to the antenna may be in a range from 40 MHz to hundreds of megahertz. The plasma generating device can generate desired plasma by suppressing disadvantages such as abnormal discharge, matching failure and others, and can be constructed so that a desired processing such as film deposition can be performed.
    • 一种等离子体产生装置,其具有设置在室(10)中的等离子体产生室(10)和高频天线(1),用于通过向室(10)中的气体施加高频电力来产生电感耦合等离子体, 从天线(1)。 天线(1)是由从腔室(10)的外部延伸到腔室(10)中的第一部分(11)形成的低电感天线,以及从腔室(10)的内侧开始的多个第二部分 (11)的电极(11e),并且具有直接连接到接地室(10)的内壁的终端(12e)。 天线(1)的表面涂覆有电绝缘材料。 施加到天线的高频功率的频率可以在40MHz到几百MHz的范围内。 等离子体发生装置可以通过抑制诸如异常放电,匹配故障等的缺点来产生期望的等离子体,并且可以构造成可以进行期望的处理,例如膜沉积。
    • 25. 发明授权
    • Method, apparatus, and computer program for evaluating noise immunity of a semiconductor device
    • 用于评估半导体器件的抗噪声性的方法,装置和计算机程序
    • US07233889B2
    • 2007-06-19
    • US10278507
    • 2002-10-23
    • Eiji TakahashiYoshiyuki SaitoYukihiro FukumotoHiroshi Benno
    • Eiji TakahashiYoshiyuki SaitoYukihiro FukumotoHiroshi Benno
    • G06F17/50
    • G06F17/5036
    • A method of evaluating noise immunity of a semiconductor device is provided. An actual circuit including the semiconductor device is represented by an equivalent circuit which has a target equivalent circuit, a noise source equivalent circuit, and an external equivalent circuit connected in parallel. The target equivalent circuit represents the semiconductor device. The noise source equivalent circuit represents a noise source outside the semiconductor device, and supplies noise to the target equivalent circuit. The external equivalent circuit represents a circuit outside the semiconductor device. The noise immunity is evaluated based on a voltage or current which arises in the target equivalent circuit by the noise. In this way, the immunity of the semiconductor device against extraneous noise can be evaluated in consideration of the effects of the circuitry outside the semiconductor device.
    • 提供了一种评估半导体器件的抗噪声性的方法。 包括半导体器件的实际电路由具有并联连接的目标等效电路,噪声源等效电路和外部等效电路的等效电路表示。 目标等效电路表示半导体器件。 噪声源等效电路表示半导体器件外部的噪声源,并且将噪声提供给目标等效电路。 外部等效电路表示半导体器件外部的电路。 基于由噪声在目标等效电路中产生的电压或电流来评估噪声抗扰度。 以这种方式,可以考虑半导体器件外的电路的影响来评估半导体器件对外来噪声的抗扰性。
    • 27. 发明申请
    • Apparatus for and method of calculating torque of variable capacity compressor
    • 可变容量压缩机扭矩计算装置及计算方法
    • US20060272343A1
    • 2006-12-07
    • US11440452
    • 2006-05-25
    • Eiji TakahashiMasaki KawachiMasanori OgawaHirofumi MutoDaisuke Shimizu
    • Eiji TakahashiMasaki KawachiMasanori OgawaHirofumi MutoDaisuke Shimizu
    • F25B49/00
    • B60H1/3208B60H2001/3266B60H2001/3275
    • An apparatus for calculating torque of a variable capacity compressor, including: a sensor configured to detect internal and external states of an air conditioner; an OFF-torque calculator configured to calculate and store a steady-state torque according to a state detected by the sensor just before a clutch is turned off; a start torque calculator configured to calculate a start torque according to a state detected by the sensor after the clutch is turned on; a steady-state full-stroke calculator configured to calculate a steady-state full-stroke torque based on an assumption that the compressor was in a full-stroke-state according to a state detected by the sensor after the clutch is turned on; and a determiner configured to provide, when an elapsed time after the clutch is turned on is less than a predetermined time, a maximum one of the torque values calculated by the OFF-torque calculator, start torque calculator, and steady-state full-stroke calculator.
    • 一种用于计算可变容量压缩机的扭矩的装置,包括:传感器,被配置为检测空调的内部和外部状态; 离合转矩计算器,其被配置为根据在离合器关闭之前由传感器检测到的状态来计算和存储稳态转矩; 启动转矩计算器,被配置为根据在所述离合器接通之后由所述传感器检测到的状态来计算起动转矩; 稳态全行程计算器,被配置为基于在离合器接通之后根据由传感器检测到的状态使压缩机处于全行程状态的假设来计算稳态全行程转矩; 以及确定器,被配置为当所述离合器接通之后的经过时间小于预定时间时,提供由所述OFF转矩计算器计算出的所述转矩值中的最大值,起动转矩计算器和稳态全行程 计算器