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    • 23. 发明申请
    • LIQUID CRYSTAL DISPLAY DEVICE
    • 液晶显示装置
    • US20110001910A1
    • 2011-01-06
    • US12828618
    • 2010-07-01
    • Jun FujiyoshiYasukazu KimuraDaisuke Sonoda
    • Jun FujiyoshiYasukazu KimuraDaisuke Sonoda
    • G02F1/1335
    • G02F1/13394G02F1/133512G02F1/134363G02F1/136286G02F2001/136222
    • A liquid crystal display device according to the invention includes a first substrate, on a surface of which are formed: a first color film which has a color other than black, and one portion of which configures a first pixel; a second color film, one portion of which configures a second pixel adjacent to the first pixel; a third color film, at least one portion of which configures a third pixel; and a fourth color film, a second substrate, and a liquid crystal layer sandwiched between the first substrate and second substrate, wherein the first color film and second color film have a first overlapping portion in which they overlap each other in the boundary between the first pixel and second pixel, and the fourth color film, being formed on the first overlapping portion, configures a post spacer which defines the space between the first substrate and second substrate.
    • 根据本发明的液晶显示装置包括:第一基板,其表面形成:第一彩色胶片,其具有不同于黑色的颜色,其一部分构成第一像素; 第二彩色胶片,其一部分配置与第一像素相邻的第二像素; 第三彩色胶片,其至少一部分配置第三像素; 以及夹在所述第一基板和所述第二基板之间的第四彩色胶片,第二基板和液晶层,其中,所述第一彩色胶片和所述第二彩色胶片具有第一重叠部分, 像素和第二像素,并且形成在第一重叠部分上的第四彩色胶片构成限定第一基板和第二基板之间的间隔的柱状间隔物。
    • 25. 发明授权
    • Display device and fabrication method thereof
    • 显示装置及其制造方法
    • US07535024B2
    • 2009-05-19
    • US11600164
    • 2006-11-16
    • Eiji OueToshihiko ItogaToshiki KanekoDaisuke SonodaTakeshi Kuriyagawa
    • Eiji OueToshihiko ItogaToshiki KanekoDaisuke SonodaTakeshi Kuriyagawa
    • H01L29/04
    • H01L29/78621H01L29/42384H01L29/4908H01L29/78696H01L2029/7863
    • The present invention provides a fabrication method of a display device which aims at the reduction of fabricating man-hours. In a fabrication method of a display device having a thin film transistor in which a gate electrode includes a first gate electrode and a second gate electrode which is overlapped to the first gate electrode and has a size thereof in the channel direction set smaller than the corresponding size of the first gate electrode, the semiconductor layer includes a channel region which is overlapped to the second gate electrode, a first impurity region which is overlapped to the first gate electrode and is formed outside the second gate electrode, a second impurity region which is formed outside the gate electrode, and a third conductive impurity region which is formed outside the gate electrode and the second impurity region, the first impurity region, the second impurity region and the third impurity region are respectively formed of the same conductive type, the impurity concentration of the first impurity region is lower than the impurity concentration of the third impurity region, and the impurity concentration of the second impurity region is lower than the impurity concentration of the first impurity region, impurities are collectively implanted into both of the first and second impurity regions such that the impurities are implanted into the first impurity region by way of the first gate electrode and the impurities are implanted into the second impurity region such that a peak position of the impurity concentration in the depth direction is positioned below the semiconductor layer thus lowering the impurity concentration of the second impurity region than the impurity concentration of the first impurity region.
    • 本发明提供了一种旨在减少制造工时的显示装置的制造方法。 在具有薄膜晶体管的显示装置的制造方法中,其中栅电极包括第一栅极和与第一栅电极重叠并且具有小于相应的沟道方向的尺寸的第二栅电极 第一栅电极的尺寸,半导体层包括与第二栅电极重叠的沟道区,与第一栅电极重叠并形成在第二栅电极外的第一杂质区,第二杂质区, 形成在栅极电极外部的第三导电杂质区域和形成在栅电极和第二杂质区域外的第三导电杂质区域,第一杂质区域,第二杂质区域和第三杂质区域分别由相同的导电类型形成,杂质 第一杂质区域的浓度低于第三杂质区域的杂质浓度 第二杂质区域的杂质浓度低于第一杂质区域的杂质浓度,将杂质共同地注入到第一和第二杂质区域中,使得杂质通过第一栅电极注入第一杂质区域 并且将杂质注入到第二杂质区域中,使得深度方向上的杂质浓度的峰值位置位于半导体层的下方,从而降低第二杂质区域的杂质浓度比第一杂质区域的杂质浓度降低。
    • 26. 发明申请
    • Display device and fabrication method thereof
    • 显示装置及其制造方法
    • US20070108449A1
    • 2007-05-17
    • US11600164
    • 2006-11-16
    • Eiji OueToshihiko ItogaToshiki KanekoDaisuke SonodaTakeshi Kuriyagawa
    • Eiji OueToshihiko ItogaToshiki KanekoDaisuke SonodaTakeshi Kuriyagawa
    • H01L29/04H01L21/84
    • H01L29/78621H01L29/42384H01L29/4908H01L29/78696H01L2029/7863
    • The present invention provides a fabrication method of a display device which aims at the reduction of fabricating man-hours. In a fabrication method of a display device having a thin film transistor in which a gate electrode includes a first gate electrode and a second gate electrode which is overlapped to the first gate electrode and has a size thereof in the channel direction set smaller than the corresponding size of the first gate electrode, the semiconductor layer includes a channel region which is overlapped to the second gate electrode, a first impurity region which is overlapped to the first gate electrode and is formed outside the second gate electrode, a second impurity region which is formed outside the gate electrode, and a third conductive impurity region which is formed outside the gate electrode and the second impurity region, the first impurity region, the second impurity region and the third impurity region are respectively formed of the same conductive type, the impurity concentration of the first impurity region is lower than the impurity concentration of the third impurity region, and the impurity concentration of the second impurity region is lower than the impurity concentration of the first impurity region, impurities are collectively implanted into both of the first and second impurity regions such that the impurities are implanted into the first impurity region by way of the first gate electrode and the impurities are implanted into the second impurity region such that a peak position of the impurity concentration in the depth direction is positioned below the semiconductor layer thus lowering the impurity concentration of the second impurity region than the impurity concentration of the first impurity region.
    • 本发明提供了一种旨在减少制造工时的显示装置的制造方法。 在具有薄膜晶体管的显示装置的制造方法中,其中栅电极包括第一栅极和与第一栅电极重叠并且具有小于相应的沟道方向的尺寸的第二栅电极 第一栅电极的尺寸,半导体层包括与第二栅电极重叠的沟道区,与第一栅电极重叠并形成在第二栅电极外的第一杂质区,第二杂质区, 形成在栅电极外部的第三导电杂质区域和形成在栅电极和第二杂质区域外的第三导电杂质区域,第一杂质区域,第二杂质区域和第三杂质区域分别由相同的导电型形成,杂质 第一杂质区域的浓度低于第三杂质区域的杂质浓度 第二杂质区域的杂质浓度低于第一杂质区域的杂质浓度,将杂质共同地注入到第一和第二杂质区域中,使得杂质通过第一栅电极注入第一杂质区域 并且将杂质注入到第二杂质区域中,使得深度方向上的杂质浓度的峰值位置位于半导体层的下方,从而降低第二杂质区域的杂质浓度比第一杂质区域的杂质浓度降低。
    • 30. 发明申请
    • DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF
    • 显示装置及其制造方法
    • US20110024763A1
    • 2011-02-03
    • US12844887
    • 2010-07-28
    • Takeshi NODAToshio MiyazawaTakuo KaitohDaisuke Sonoda
    • Takeshi NODAToshio MiyazawaTakuo KaitohDaisuke Sonoda
    • H01L33/16H01L21/336
    • H01L29/78621G02F1/1368H01L29/66765H01L29/78627
    • A display device which has thin film transistors, wherein a semiconductor layer includes a first layer, second layers and third layers, the first layer has a channel region, the second layers are an impurity layer, the third layers are a low-concentration impurity layer, the second layers have connection portions connected with an electrodes, the third layers are formed to annularly surround the second layers, a channel-region-side edge portion out of edge portions of the third layer is in contact with the first layer, the edge portions of the third layer but the channel-region-side edge portion are in contact with an interlayer insulation film, the second layers have a first region where the second layer overlaps with a gate electrode and a second region where the second layer does not overlap with the gate electrode, and the connection portion is in the second region.
    • 一种具有薄膜晶体管的显示装置,其中半导体层包括第一层,第二层和第三层,第一层具有沟道区,第二层是杂质层,第三层是低浓度杂质层 所述第二层具有与电极连接的连接部,所述第三层形成为环绕所述第二层,所述第三层的边缘部分之外的沟道区域侧边缘部与所述第一层接触,所述边缘 第三层的第二层与沟道区侧边缘部分接触层间绝缘膜,第二层具有第一区域,其中第二层与栅电极重叠,第二区与第二层不重叠 与栅电极连接,连接部位在第二区域。