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    • 22. 发明专利
    • Display device, and method of manufacturing same
    • 显示装置及其制造方法
    • JP2007142082A
    • 2007-06-07
    • JP2005332701
    • 2005-11-17
    • Hitachi Displays Ltd株式会社 日立ディスプレイズ
    • OUE EIJIITOGA TOSHIHIKOKANEKO TOSHITERUSONODA DAISUKEKURIYAGAWA TAKESHI
    • H01L21/336H01L29/786
    • H01L29/78621H01L29/42384H01L29/4908H01L29/78696H01L2029/7863
    • PROBLEM TO BE SOLVED: To provide a method of manufacturing a display device wherein the number of manufacturing processes is reduced. SOLUTION: A gate electrode has a first gate electrode, and a second gate electrode which is superposed on the first gate electrode and has a smaller size in a channel direction than the first gate electrode. The semiconductor layer has a channel region which is superposed on the second gate electrode, a first impurity region which is superposed on the first gate electrode and is formed outside the second gate electrode, a second impurity region formed outside the gate electrode, and a conductive third impurity region which is formed outside the gate electrode and the second impurity region. Implantation of impurities is performed for both the first and second impurity regions at once for the first impurity region via the first gate electrode and for the second impurity region, so that a peak position in a depth direction of impurity concentration lies in a lower layer than the semiconductor layer. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种减少制造工艺数量的显示装置的制造方法。 解决方案:栅电极具有第一栅电极和第二栅电极,该第二栅电极叠置在第一栅电极上并且具有比第一栅电极在沟道方向上更小的尺寸。 半导体层具有重叠在第二栅电极上的沟道区,叠置在第一栅极上并形成在第二栅电极外侧的第一杂质区,形成在栅电极外侧的第二杂质区和导电 第三杂质区,形成在栅电极和第二杂质区之外。 通过第一栅电极和第二杂质区,对第一杂质区和第二杂质区一次对第一和第二杂质区进行杂质的注入,使得杂质浓度的深度方向的峰位置位于比 半导体层。 版权所有(C)2007,JPO&INPIT
    • 24. 发明专利
    • Display device
    • 显示设备
    • JP2010122521A
    • 2010-06-03
    • JP2008297058
    • 2008-11-20
    • Hitachi Displays Ltd株式会社 日立ディスプレイズ
    • OUE EIJIGOTO JUNKAITO TAKUO
    • G02F1/1368
    • PROBLEM TO BE SOLVED: To provide a display device having a driving circuit formed thereon using a CMOSTFT around a display region and capable of stabilizing characteristics of a PMOSTFT constituting the CMOSTFT.
      SOLUTION: In a right PMOSTFT in the CMOSTFT, an N-type channel region 8 is formed and a P-type region 7b is formed around a channel width direction. In a source region 14, which is P-type, a first N-type region 12b is formed in contact with the P-type region 7b in the channel region, and a second N-type region 11a having a larger impurity density than that of the first N-type region 12b is formed in contact with the first N-type region 12b. The current flowing through the P-type region 7b around the channel region is suppressed by a PN junction formed in the first and second N-type regions and the source region 14, which is P-type to make the characteristics of the PMOSTFT stable.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种显示装置,其具有在显示区域周围使用CMOSTFT形成的驱动电路,并且能够稳定构成CMOSTFT的PMOSTFT的特性。 解决方案:在CMOSTFT中的右PMOSTFT中,形成N型沟道区8,并且在沟道宽度方向上形成P型区7b。 在P型的源极区域14中,形成与沟道区域中的P型区域7b接触的第一N型区域12b和杂质密度大的第二N型区域11a。 第一N型区域12b形成为与第一N型区域12b接触。 通过形成在第一和第二N型区域中的PN结和作为P型的源极区域14的沟道区域周围流过P型区域7b的电流来抑制PMOSTFT的特性稳定。 版权所有(C)2010,JPO&INPIT
    • 25. 发明专利
    • Manufacturing method of display unit
    • 显示单元的制造方法
    • JP2009076558A
    • 2009-04-09
    • JP2007242286
    • 2007-09-19
    • Hitachi Displays Ltd株式会社 日立ディスプレイズ
    • OUE EIJIKAITO TAKUOSONODA DAISUKEMIYAKE HIDEKAZU
    • H01L21/336G02F1/1368H01L21/20H01L21/308H01L29/786
    • PROBLEM TO BE SOLVED: To provide a manufacturing method of a display unit reduced in the number of manufacturing steps, and suppressed degradation in characteristics of a film transistor.
      SOLUTION: A display unit manufactured by this method is provided with a first thin film transistor formed by sequentially forming a gate electrode, a gate insulating layer, a semiconductor layer of a crystal layer and an amorphous layer, a source electrode, and a drain electrode on the same substrate and a second thin film transistor formed by sequentially forming a gate electrode, a gate insulating film, an amorphous semiconductor layer, a source electrode, and a drain electrode. This manufacturing method includes steps of forming, after the formation of the gate insulating film, an amorphous semiconductor layer on the substrate and also selectively forming a crystalline semiconductor layer to the amorphous semiconductor layer and etching the amorphous semiconductor layer by making the crystalline semiconductor layer remain using an alkali etching solution (etchant) of the amine system.
      COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:提供减少制造步骤数量的显示单元的制造方法,并且抑制薄膜晶体管的特性的劣化。 解决方案:通过该方法制造的显示单元设置有通过顺序地形成栅电极,栅极绝缘层,晶体层的半导体层和非晶层而形成的第一薄膜晶体管,源电极和 通过顺序地形成栅电极,栅极绝缘膜,非晶半导体层,源电极和漏电极形成的同一基板上的漏电极和第二薄膜晶体管。 该制造方法包括以下步骤:在形成栅绝缘膜之后,在衬底上形成非晶半导体层,并且还通过使晶体半导体层保持在非晶半导体层上并选择性地形成晶体半导体层并蚀刻非晶半导体层 使用胺系统的碱蚀刻溶液(蚀刻剂)。 版权所有(C)2009,JPO&INPIT
    • 27. 发明专利
    • Display device, and manufacturing method thereof
    • 显示装置及其制造方法
    • JP2008034407A
    • 2008-02-14
    • JP2006202712
    • 2006-07-26
    • Hitachi Displays Ltd株式会社 日立ディスプレイズ
    • NODA TAKASHIKAMO NAOHIROOUE EIJIHATANO MUTSUKOSATO TAKESHI
    • H01L21/20H01L21/336H01L21/8238H01L27/08H01L27/092H01L29/786
    • H01L29/04H01L21/02532H01L21/02683H01L21/02691H01L27/1248H01L27/1285
    • PROBLEM TO BE SOLVED: To obtain a system-in-panel display device using a high-performance thin-film transistor by suppressing the aggregation of a melted semiconductor when growing a strip of a psuedo monocrystal continuously, by controlling the direction while irradiating a semiconductor film, such as silicon, with continuous oscillation laser beams by scanning. SOLUTION: The display device comprises: a silicon nitride film 102 formed on an insulating substrate 101, a silicon oxide film 103 formed on the silicon nitride film, a semiconductor film 104 formed on the silicon oxide film 103, and a thin-film transistor using the semiconductor film 104. The silicon oxide film 103 is composed of a first silicon oxide film formed with SiH 4 and N 2 O as feed gas, and a second silicon oxide film formed with TEOS gas as feed gas. The semiconductor film is a psuedo monocrystal, where a crystal particle is in a strip shape. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:为了通过在连续生长伪单晶条带的同时通过抑制熔融半导体的聚集来获得使用高性能薄膜晶体管的系统内置显示装置,通过控制方向同时 通过扫描用连续振荡的激光束照射诸如硅的半导体膜。 解决方案:显示装置包括:形成在绝缘基板101上的氮化硅膜102,形成在氮化硅膜上的氧化硅膜103,形成在氧化硅膜103上的半导体膜104, 使用半导体膜104的薄膜晶体管。氧化硅膜103由作为进料气体的形成有SiH 4 SB 3和N 2 SB 2的第一氧化硅膜组成,第二氧化硅膜 用TEOS气体形成的氧化硅膜作为原料气体。 半导体膜是伪晶体,其中晶体颗粒呈带状。 版权所有(C)2008,JPO&INPIT
    • 28. 发明专利
    • Manufacturing method of display device
    • 显示装置的制造方法
    • JP2007095726A
    • 2007-04-12
    • JP2005279215
    • 2005-09-27
    • Hitachi Displays Ltd株式会社 日立ディスプレイズ
    • KAITO TAKUOOUE EIJIITOGA TOSHIHIKO
    • H01L29/786G02F1/1368G09F9/00H01L21/20H01L21/336
    • H01L27/1285H01L21/2026H01L27/1296H01L29/04
    • PROBLEM TO BE SOLVED: To provide a manufacturing method of a display device with which yield drop of the display device due to flocculation occurring in pseudo single crystallization of a silicon film is reduced. SOLUTION: The manufacturing method of the display device comprises a semiconductor film reforming process for irradiating a semiconductor film in a first state with a laser, and reforming it into a semiconductor film in a second state which has elongated crystal grains; a flocculation detecting process for detecting flocculation of the semiconductor film which occurs in the semiconductor film reforming process; and a defect judging process for judging it to be defective when a position of flocculation exists in a prescribed region, and judging it to be non-defective when it exists outside the prescribed region. COPYRIGHT: (C)2007,JPO&INPIT
    • 解决的问题:提供一种显示装置的制造方法,其中由于在硅膜的伪单晶中发生的絮凝导致的显示装置的产量下降降低。 解决方案:显示装置的制造方法包括半导体膜重整工艺,用于在第一状态下用激光照射半导体膜,并在具有细长晶粒的第二状态下将其重整成半导体膜; 用于检测在半导体膜重整工艺中发生的半导体膜的絮凝的絮凝检测过程; 以及当在规定区域中存在絮凝位置时将其判断为有缺陷的缺陷判断处理,并且当其存在于规定区域之外时判断为无缺陷。 版权所有(C)2007,JPO&INPIT
    • 29. 发明专利
    • Image display unit
    • 图像显示单元
    • JP2006019609A
    • 2006-01-19
    • JP2004197750
    • 2004-07-05
    • Hitachi Displays Ltd株式会社 日立ディスプレイズ
    • MATSUMURA MIEKOHATANO MUTSUKOITOGA TOSHIHIKOOUE EIJI
    • H01L29/786G02F1/1368G09F9/30H01L21/20H01L21/336H01L51/50
    • H01L29/045H01L27/1285
    • PROBLEM TO BE SOLVED: To obtain a system-in-display of high function and multi-function at a low cost. SOLUTION: High performance and high reliability of a low temperature polysilicon thin film transistor are realized by terminating defect of a polycrystalline silicon interface constituting a gate oxide film/channel by fluorine. To maximize its effect, a material wherein scattering by potential barrier of grain boundary is not dominant, that is, an almost band-like crystalline thin film SPSI wherein grain boundary dividing a channel is little is used in the channel of the thin film transistor. Consequently, it is possible to realize a thin film transistor which has both sharp transmission characteristic and good hot carrier resistance and realizes both high performance and high reliability, to form various circuits which operate rapidly by a low voltage on the same glass substrate as a picture element, and to obtain a high function/multi-function system-in-display at a low cost. COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:以低成本获得高功能和多功能的系统显示。 解决方案:通过用氟终止构成栅极氧化膜/沟道的多晶硅界面的缺陷,实现了低温多晶硅薄膜晶体管的高性能和高可靠性。 为了最大化其效果,通过晶界的势垒散射不是主要的材料,即,在薄膜晶体管的沟道中使用其中分割沟道的晶界小的几乎带状的晶体薄膜SPSI。 因此,可以实现具有尖锐的传输特性和良好的热载流子电阻的薄膜晶体管,并且实现了高性能和高可靠性,从而形成在与图像相同的玻璃基板上通过低电压快速操作的各种电路 元件,并以低成本获得高功能/多功能系统显示。 版权所有(C)2006,JPO&NCIPI