会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 23. 发明授权
    • Pattern fabrication method using a charged particle beam and apparatus
for realizing same
    • 使用带电粒子束的图案制造方法及其实现装置
    • US5149975A
    • 1992-09-22
    • US647562
    • 1991-01-29
    • Haruo YodaFumio Murai
    • Haruo YodaFumio Murai
    • G03F7/20H01J37/302H01L21/027H01L21/30
    • H01J37/3026H01J2237/31769
    • The present application relates to a method and an apparatus for forming a pattern, in which a plane on which a pattern on a sample is traced is decomposed into predetermined partial regions; the pattern density in each of the partial regions is stored in data storing means as pattern density map data; and the irradiation energy amount of a charged particle beam is corrected on the basis of the pattern density map data to correct shortage and excess in the exposure dose due to roughness and fineness of the the pattern, i.e. the proximity effect. Further, the present application relates to a method and an apparatus for forming a pattern, in which when one or a plurality of layers located under the layer on which the pattern should be formed have patterns, influences of the underlayers on the proximity effect are taken into account.
    • 本申请涉及一种用于形成图案的方法和装置,其中将跟踪样本上的图案的平面分解成预定的部分区域; 每个部分区域中的图案密度作为图案密度图数据存储在数据存储装置中; 并且基于图案密度图数据校正带电粒子束的照射能量,以校正由于图案的粗糙度和细度,即邻近效应引起的曝光剂量的不足和过剩。 此外,本申请涉及用于形成图案的方法和装置,其中当位于其上应形成图案的层下面的一个或多个层具有图案时,取下底层对邻近效应的影响 考虑到