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21. 发明授权

US4628225A Electrode for laser stimulation lamps 失效
标题翻译：激光刺激灯电极
公开(公告)号：US4628225A
公开(公告)日：1986-12-09
申请号：US543614
申请日：1983-10-20
申请人： Dieter Keim , Helmut Fischer
发明人： Dieter Keim , Helmut Fischer
IPC分类号： H01J61/06
CPC分类号： H01J61/06
摘要： An electrode for laser stimulation lamps comprising an electrode element (2) of tungsten, a hollow cylindrical carrier body (3) of nickel or nickel alloy, and a mounting pin (6) of nickel, tungsten alloy, or nickel alloy. The parts are securely attached together. This construction reduces the variety of sizes and types of electrodes produced, facilitates subsequent manufacturing steps and improves mechanical stability by reducing overall weight. The electrode element (2) and the mounting pin (6) are seated at respectively opposite ends of the hollow cylindrical carrier, extending, at least in part, into the space defined by the hollow carrier and attached thereto.
摘要翻译：一种用于激光刺激灯的电极，包括钨的电极元件（2），镍或镍合金的中空圆柱形载体（3）和镍，钨合金或镍合金的安装销（6）。零件牢固地连接在一起。这种结构减少了生产的电极的尺寸和类型的多样性，有利于随后的制造步骤，并且通过减小整体重量来提高机械稳定性。电极元件（2）和安装销（6）分别位于中空圆柱形托架的相对端，至少部分地延伸到由中空托架限定的空间中并与之连接。

22. 发明授权

US4401518A Method of measuring thickness of a tin layer and thickness measuring device therefor 失效
标题翻译：测量锡层厚度的方法及其厚度测量装置
公开(公告)号：US4401518A
公开(公告)日：1983-08-30
申请号：US231689
申请日：1981-02-05
申请人： Helmut Fischer , Willi Steegmuller
发明人： Helmut Fischer , Willi Steegmuller
IPC分类号： G01B7/06 , G01N27/416 , G01N27/26 , G01N27/28
CPC分类号： G01B7/06 , G01N27/4161
摘要： An electrolyte chamber has an opening on the side facing the foil to be measured for letting the electrolyte through to the foil, a hollow cathode in the chamber, a supply line connected to the chamber through the hollow cathode for supplying the electrolyte to the chamber, and a negative pressure flow-off line connected to the chamber located at a distance from the mouth of the supply line. A negative pressure generator is connected to the flow-off line through a separator vessel which has a level switch which shuts off the generator when the electrolyte reaches a predetermined level. The supply line is connected to a supply vessel containing the electrolyte and runs continuously into the liquid volume in the vessel. The vessel has a connection to the atmosphere.
摘要翻译：电解质室在面向待测量的箔的一侧上具有开口，用于使电解质通过箔，腔室中的中空阴极，通过空心阴极连接到室的供应线，用于将电解质供应到室，以及连接到位于距离供给管嘴的一定距离处的室的负压流出线。负压发生器通过分离器容器连接到流出线路，分离器容器具有在电解液达到预定水平时切断发电机的液位开关。供应管线连接到容纳电解质的供应容器，并连续运行到容器中的液体容积中。船只与大气连接。

23. 发明授权

US4293767A Apparatus for measuring the thickness of thin layers 失效
标题翻译：用于测量薄层厚度的装置
公开(公告)号：US4293767A
公开(公告)日：1981-10-06
申请号：US69610
申请日：1979-08-24
申请人： Helmut Fischer , Albert Ott , Willi Steegmuller
发明人： Helmut Fischer , Albert Ott , Willi Steegmuller
IPC分类号： G01N23/203 , G01N23/00
CPC分类号： G01N23/203
摘要： The apparatus measures the thickness of thin layers on strips and wires which are moved relative to the apparatus. The apparatus is stationary and includes one or more beta emitters directed towards the layer and spatially arranges relative to the longitudinal axis of a beta radiation detector or counting tube which is arranged to the rear of the beta emitter for counting the backscattered beta radiation, and a guide for the strip or wire at a specified distance from the beta emitter. The ratio of the characteristic cross-sectional dimension (D) of the window of the beta radiation detector to the intersecting surface diameter (d) of the intersecting surface layer/intensity distribution curve of the beta emitter, being expressed as D/d=15 . . . 2; with the distance between the layer and the beta radiation emitter being in the plateau region of the curve of the counting rate/distance characteristic obtained by the above feature.
摘要翻译：该装置测量相对于装置移动的条和线上的薄层的厚度。该装置是静止的并且包括一个或多个指向该层的β发射体，并相对于β辐射检测器或计数管的纵向轴线在空间上布置，该β辐射检测器或计数管被布置到用于计数背散射β辐射的β发射器的后部，在距离beta发射器一定距离处的条或导线的引导。 β辐射检测器的窗口的特征截面尺寸（D）与β发射体的相交表面层/强度分布曲线的交叉表面直径（d）的比值表示为D / d = 15 。。。 2; 其中层和β辐射发射器之间的距离在通过上述特征获得的计数速率/距离特性的曲线的平台区域中。

24. 发明授权

US4025169A High speed wide angle objective lens system 失效
标题翻译：高速广角物镜系统
公开(公告)号：US4025169A
公开(公告)日：1977-05-24
申请号：US671129
申请日：1976-03-29
申请人： Helmut Fischer , Erhard Glatzel , Walter Jahn , Heinz Zajadatz
发明人： Helmut Fischer , Erhard Glatzel , Walter Jahn , Heinz Zajadatz
IPC分类号： G02B9/64 , G02B13/04 , G02B13/18
CPC分类号： G02B9/64
摘要： An extremely high speed wide angle objective lens system, wherein a reducing Newtonian finder telescope is arranged in front of an objective lens group which produces a real image on an image plane. Rules or conditions are stated, and several specific examples are given. In many of the examples, the back focus distance is relatively large, thus making the lens system suitable for use with a mirror reflex camera where room is needed for swinging the reflex mirror.
摘要翻译：一种极高速度的广角物镜系统，其中在物镜组前方设置有还原牛顿型望远镜望远镜，该物镜组在图像平面上产生实像。说明规则或条件，并给出了几个具体示例。在许多示例中，后焦距距离相对较大，因此使得透镜系统适用于需要用于摆动反射镜的房间的镜面反射照相机。

25. 发明授权

US11385151B2 Measuring device and detection of measurement signals during a penetrating movement of penetrating member 有权
公开(公告)号：US11385151B2
公开(公告)日：2022-07-12
申请号：US16070617
申请日：2017-01-09
申请人： Helmut Fischer GmbH Institut für Elektronik und Messtechnik
发明人： Helmut Fischer
IPC分类号： G01N3/46
摘要： A measuring device for detection pf measurement signals during a penetrating movement of a penetrating member into a surface of a test object or during a sensing movement of the penetrating member on the surface of the test object. The measuring device includes a housing which accommodates a force generating device and on which a holding element is arranged remote from the force generating device, which holding element is movable relative to the housing at least in one direction along a longitudinal axis of the housing and which accommodates the penetrating member. The measuring device also includes at least one first measuring element for measuring the penetration depth of the penetrating member into the surface of the test object or a traversing movement of the penetrating member along the longitudinal axis relative to the housing during a sensing movement on the surface of the test object, wherein a transmission element is provided which extends between the force generating device and the penetrating member.

26. 发明授权

US09857171B2 Measuring probe for non-destructive measuring of the thickness of thin layers 有权
公开(公告)号：US09857171B2
公开(公告)日：2018-01-02
申请号：US13066796
申请日：2011-04-25
申请人： Helmut Fischer
发明人： Helmut Fischer
IPC分类号： G01R7/06 , G01B21/08 , G01B7/06
CPC分类号： G01B21/08 , G01B7/105
摘要： The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers on an object with a measuring head, which comprises at least one sensor element for contact on a measurement surface of an object, and with a support device for receiving the measuring head, which is at least partly surrounded by a housing, wherein at least one further measuring head, which is adjacent to and separated from the first measuring head, is arranged on the support device, which can be controlled independently of the first measuring head.

27. 发明申请

US20130240918A1 ELECTROLYTICALLY COATED OPTOELECTRONIC SEMICONDUCTOR COMPONENT AND METHOD FOR PRODUCING AN OPTOELECTRONIC SEMICONDUCTOR COMPONENT 有权
标题翻译：电光涂层光电子半导体元件和生产光电半导体元件的方法
公开(公告)号：US20130240918A1
公开(公告)日：2013-09-19
申请号：US13823726
申请日：2011-07-27
申请人： Siegfried Herrmann , Helmut Fischer
发明人： Siegfried Herrmann , Helmut Fischer
IPC分类号： H01L33/62 , H01L33/48
CPC分类号： H01L33/62 , H01L33/0079 , H01L33/38 , H01L33/48 , H01L33/486 , H01L33/647 , H01L2224/48091 , H01L2224/48247 , H01L2924/01068 , H01L2933/0016 , H01S5/0217 , H01S5/02256 , H01L2924/00014
摘要： The invention relates to an optoelectronic seminconductor component, comprising a substrate-free optoelectronic semiconductor chip (1), which has a first main surface (1a) on an upper face and a second main surface (1b) on a lower face, and a metal carrier (2), which is arranged on the lower face of the optoelectronic seminconductor chip (1), wherein the metal carrier (2) protrudes over the optoelectronic semiconductor chip (1) in at least one lateral direction (1) and the metal carrier (2) is deposited on the second main surface (1b) of the optoelectronic semiconductor chip (1) using a galvanic or electroless plating method.
摘要翻译：本发明涉及一种光电半导体元件，它包括一个无衬底的光电半导体芯片（1），它在上表面上具有第一主表面（1a），在下表面上具有第二主表面（1b）载体（2），其布置在光电半导体芯片（1）的下表面上，其中金属载体（2）在至少一个横向方向（1）上突出超过光电半导体芯片（1），并且金属载体（2）使用电镀或无电镀方法沉积在光电半导体芯片（1）的第二主表面（1b）上。

28. 发明申请

US20120296519A1 Crane Control 审中-公开
标题翻译：起重机控制
公开(公告)号：US20120296519A1
公开(公告)日：2012-11-22
申请号：US13475313
申请日：2012-05-18
申请人： Johannes Karl Eberharter , Klaus Schneider , Eugen Schobesberger , Helmut Fischer
发明人： Johannes Karl Eberharter , Klaus Schneider , Eugen Schobesberger , Helmut Fischer
IPC分类号： B63B27/10 , B66C13/16
CPC分类号： B63B27/10 , B66C13/02 , B66C23/52 , B66C23/905
摘要： The present invention relates to a crane control for a crane arranged on a ship, having a load moment limitation system which determines a maximum permitted payload, wherein the load moment limitation system is in communication with a measuring unit for measuring the movement of the ship and determines the maximum permitted payload on the basis of data of the measuring unit.
摘要翻译：本发明涉及一种布置在船上的起重机的起重机控制装置，具有确定最大允许有效载荷的负载力矩限制系统，其中负载力矩限制系统与用于测量船舶运动的测量单元相连通，基于测量单元的数据确定最大允许有效载荷。

29. 发明申请

US20110271750A1 Method and device for measuring the thickness of thin layers over large-area surfaces to be measured 有权
标题翻译：用于测量要测量的大面积表面上的薄层厚度的方法和装置
公开(公告)号：US20110271750A1
公开(公告)日：2011-11-10
申请号：US13068407
申请日：2011-05-10
申请人： Helmut Fischer
发明人： Helmut Fischer
IPC分类号： G01B21/08
CPC分类号： G01B7/105
摘要： The invention relates to a method and a device for measuring the thickness of thin layers over large-area surfaces to be measured (12), in which at least one measuring probe (28), which comprises at least one sensor element (29) and at least one contact spherical cap (31) associated with the sensor element (29), is applied to the surface to be measured (12) in order to obtain a measured value, wherein the large-area surface to be measured (12) is subdivided into individual partial areas (14), a matrix of measurement points (16) is determined for each partial area (14) to be inspected, measured values are ascertained at equidistant measurement points (16) along at least one row (17) of the matrix of the partial area (14) using a device (21) carrying the at least one measuring probe (28), and the measured values are ascertained successively for all rows (17) in the matrix in the partial area (14) and evaluated for this partial area (14).
摘要翻译：本发明涉及一种用于测量要测量的大面积表面（12）上的薄层的厚度的方法和装置，其中至少一个测量探针（28）包括至少一个传感器元件（29）和将与传感器元件（29）相关联的至少一个接触球形盖（31）施加到被测量表面（12）以获得测量值，其中待测量的大面积表面（12）为被分为单独的部分区域（14），对于要检查的每个部分区域（14）确定测量点（16）的矩阵，测量值沿着至少一行（17）的等距测量点（16）确定使用承载至少一个测量探针（28）的装置（21）的部分区域（14）的矩阵以及在部分区域（14）中的矩阵中的所有行（17）连续地确定测量值，以及评估该部分区域（14）。

30. 发明申请

US20110260721A1 Measuring probe for non-destructive measuring of the thickness of thin layers 有权
标题翻译：测量探头用于非破坏性测量薄层厚度
公开(公告)号：US20110260721A1
公开(公告)日：2011-10-27
申请号：US13066797
申请日：2011-04-25
申请人： Helmut Fischer
发明人： Helmut Fischer
IPC分类号： G01B7/06 , G01D21/00
CPC分类号： G01B7/10 , G01B7/001 , G01B7/105 , G01B21/08
摘要： The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.
摘要翻译：本发明涉及一种用于非破坏性地测量薄层厚度的测量探针，特别是在通过开口或弯曲表面可访问的空腔中，测量头包括至少一个传感器元件并且至少包括分配给待检查的空腔中的传感器元件的一个接触球形盖，以及用于在测量表面上和/或沿着待测量表面定位和引导测量探针的夹持元件，其中在夹持元件上提供了一种长而弹性屈服的导向杆，其在其与夹持元件相对的端部上接收至少一个测量头，使得其可相对于导向杆至少一个自由度移动。

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