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    • 21. 发明申请
    • Wavefront Imaging Sensor
    • 波前成像传感器
    • US20100309457A1
    • 2010-12-09
    • US12792177
    • 2010-06-02
    • Xiquan CuiChanghuei Yang
    • Xiquan CuiChanghuei Yang
    • G01J1/02
    • G01J9/0215G02B21/0004G02B21/0092
    • Embodiments of the present invention relate to a wavefront imaging sensor (WIS) comprising an aperture layer having an aperture, a light detector having a surface and a transparent layer between the aperture layer and the light detector. The light detector can receive a light projection at the surface from light passing through the aperture. The light detector can also separately measure amplitude and phase information of a wavefront at the aperture based on the received light projection. The transparent layer has a thickness designed to locate the surface of the light detector approximately at a self-focusing plane in a high Fresnel number regime to narrow the light projection.
    • 本发明的实施例涉及一种波面成像传感器(WIS),其包括具有孔径的孔径层,具有表面的光检测器和在孔径层和光检测器之间的透明层。 光检测器可以从穿过孔的光接收表面的光投影。 光检测器还可以基于接收的光投射单独地测量孔径处的波前的幅度和相位信息。 透明层具有设计成将光检测器的表面大致定位在高菲涅尔数状态的自聚焦平面上以使光投影变窄的厚度。
    • 26. 发明申请
    • LIGHT-FIELD PIXEL
    • 光场像素
    • US20120211644A1
    • 2012-08-23
    • US13344523
    • 2012-01-05
    • Guoan ZhengChanghuei Yang
    • Guoan ZhengChanghuei Yang
    • G01J1/44
    • G01J9/00
    • A light-field pixel for detecting a wavefront, the light-field pixel comprises an aperture layer, a light detector layer, and a processor. The aperture layer has a non-conventional aperture and a non-conventional aperture. The non-conventional aperture has a higher gradient of transmission at normal incidence than the conventional aperture. The light detector is configured to measure a first intensity of light through the non-conventional aperture and a second intensity of light through the conventional aperture. The processor is configured to detect the wavefront based on the first intensity normalized by the second intensity.
    • 用于检测波前的光场像素,所述光场像素包括孔径层,光检测器层和处理器。 孔径层具有非常规孔径和非常规孔径。 非常规孔径在常规孔径处具有较高的垂直入射梯度。 光检测器被配置为测量通过非常规孔径的第一光强度和通过常规光圈的第二光强度。 处理器被配置为基于由第二强度归一化的第一强度来检测波前。