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    • 23. 发明申请
    • Master controller architecture
    • 主控制器架构
    • US20060129874A1
    • 2006-06-15
    • US10999720
    • 2004-11-30
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • G06F11/00
    • G11C29/16G11C29/44G11C29/4401G11C29/72
    • A master controller for an RRAM subsystem. An interface communicates with at least one RRAM controller. A main control unit selects and implements test and repair operations on the RRAM subsystem through the RRAM controller. A timer determines a maximum number of test and repair operations that can be implemented within a given time. Thus, a master controller is included in the RRAM subsystem. The master controller has a relatively simple interface, and performs test and repair operations on the RRAM subsystem. The advantages of using the master controller include an elimination of additional test ports, simplification of the process of preparing the test vectors for RRAM testing, and the master controller is able to accumulate test results and initiate repairs based on those results. In this manner, the RRAM subsystem has a self-repair functionality.
    • 用于RRAM子系统的主控制器。 接口与至少一个RRAM控制器通信。 主控单元通过RRAM控制器对RRAM子系统进行测试和修复操作。 定时器确定在给定时间内可以实现的最大测试和修复操作数。 因此,主控制器包含在RRAM子系统中。 主控制器具有相对简单的接口,并对RRAM子系统执行测试和修复操作。 使用主控制器的优点包括消除额外的测试端口,简化了用于RRAM测试的测试向量的准备过程,并且主控制器能够根据这些结果积累测试结果并启动修复。 以这种方式,RRAM子系统具有自修复功能。
    • 25. 发明申请
    • TRANSPORT SUBSYSTEM FOR AN MBIST CHAIN ARCHITECTURE
    • 用于MBIST链架构的运输子系统
    • US20090307543A1
    • 2009-12-10
    • US12183512
    • 2008-07-31
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • G11C29/12G06F11/27
    • G11C29/48G11C29/1201G11C29/26G11C29/32G11C2029/2602G11C2029/5602
    • An apparatus comprising a controller, a plurality of transport circuits and a plurality of memory-controlling circuits. The controller may be configured to (i) present one or more commands and (ii) receive one or more responses. Each of the plurality of transport circuits may be configured to (i) receive one of the commands, (ii) present the responses, and (iii) generate one or more control signals. Each of the plurality of memory-controlling circuits may be (i) coupled to a respective one of the plurality of transport circuits and (ii) configured to (i) generate one or more memory access signals in response to the one or more control signals, (ii) receive one or more memory output signals from a respective memory in response to the one or more memory access signals and (iii) generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized. The controller generally provides a common testing routine for each respective memory that may be adjusted for the size of each respective memory by the memory-controlling circuits.
    • 一种装置,包括控制器,多个传输电路和多个存储器控制电路。 控制器可以被配置为(i)呈现一个或多个命令,并且(ii)接收一个或多个响应。 多个传输电路中的每一个可以被配置为(i)接收命令之一,(ii)呈现响应,以及(iii)产生一个或多个控制信号。 多个存储器控制电路中的每一个可以(i)耦合到多个传输电路中的相应一个,并且(ii)被配置为(i)响应于一个或多个控制信号而产生一个或多个存储器访问信号 ,(ii)响应于所述一个或多个存储器访问信号,从相应存储器接收一个或多个存储器输出信号,以及(iii)响应于所述一个或多个存储器输出信号产生响应。 各个存储器可以独立地定尺寸。 控制器通常为每个相应的存储器提供通用的测试程序,这些存储器可以通过存储器控制电路为每个相应的存储器的大小进行调整。
    • 29. 发明授权
    • Transport subsystem for an MBIST chain architecture
    • 用于MBIST链架构的传输子系统
    • US08046643B2
    • 2011-10-25
    • US12183512
    • 2008-07-31
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • Alexandre AndreevAnatoli BolotovMikhail Grinchuk
    • G11C29/00G01R31/28
    • G11C29/48G11C29/1201G11C29/26G11C29/32G11C2029/2602G11C2029/5602
    • An apparatus including a controller configured to present one or more commands and receive one or more responses, a plurality of transport circuits configured to receive one of the commands, present the responses, and generate one or more control signals, and a plurality of memory-controlling circuits, each coupled to a respective one of the plurality of transport circuits and configured to generate one or more memory access signals in response to the one or more control signals, receive one or more memory output signals from a respective memory in response to the one or more memory access signals, and generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized. The controller generally provides a common testing routine for each respective memory that may be adjusted for the size of each respective memory by the memory-controlling circuits.
    • 一种装置,包括:控制器,被配置为呈现一个或多个命令并接收一个或多个响应;多个传输电路,被配置为接收命令中的一个,呈现响应,并产生一个或多个控制信号;以及多个存储器 - 控制电路,每个耦合到所述多个传输电路中的相应一个,并被配置为响应于所述一个或多个控制信号而产生一个或多个存储器访问信号,响应于所述控制电路响应于所述控制电路接收来自相应存储器的一个或多个存储器输出信号 一个或多个存储器访问信号,并且响应于一个或多个存储器输出信号而产生响应。 各个存储器可以独立地定尺寸。 控制器通常为每个相应的存储器提供通用的测试程序,这些存储器可以通过存储器控制电路为每个相应的存储器的大小进行调整。