专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

21. 发明申请

WO2015128679A1 SAMPLE HOLDING SYSTEM 审中-公开
标题翻译：样品保持系统
公开(公告)号：WO2015128679A1
公开(公告)日：2015-09-03
申请号：PCT/GB2015/050596
申请日：2015-03-02
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： JEDAMZIK, Dieter , SHARP, Peter
IPC分类号： G01R1/04 , G01N1/42 , G01R31/28
CPC分类号： G01N1/42 , B01L7/50 , B01L7/52 , B01L2300/1827 , G01N21/01 , G01R1/0408
摘要： A sample holding system comprises a sample holder adapted to operate in an operational temperature range of below 1K to at least 380K. The system may also comprise a substrate support. The sample holder has a substrate in the form of a circuit board. One or more sample holder connectors are utilised for providing electrical connection to the sample holder. The sample holder has a dedicated region for receiving a sample to be studied. Electrical circuitry provides electrical connection between the said sample holder electrical connectors and a part of the sample holder, through the circuit board.
摘要翻译：样品保持系统包括适于在低于1K至至少380K的操作温度范围内操作的样品保持器。该系统还可以包括衬底支撑件。样品架具有电路板形式的基板。一个或多个样品架连接器用于提供与样品架的电连接。样品架具有用于接收待研究样品的专用区域。电路通过电路板提供所述样品保持器电连接器和样品保持器的一部分之间的电连接。

22. 发明申请

WO2015114359A1 METHOD OF JOINING A SUPERCONDUCTOR 审中-公开
标题翻译：加工超导体的方法
公开(公告)号：WO2015114359A1
公开(公告)日：2015-08-06
申请号：PCT/GB2015/050231
申请日：2015-01-30
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： JEDAMZIK, Dieter
IPC分类号： H01R4/68
CPC分类号： H01R4/68
摘要： A method is provided of forming an electrically conductive joint between a first superconductor and a member. A first superconductor is provided having a first bonding surface. A member to be joined with the first superconductor, is provided having a second bonding surface. A reactive foil is located adjacent each of the first and second bonding surfaces. A joining material is positioned between the reactive foil and one or each of the first and second bonding surfaces. The joint is formed by initiating a reaction in the reactive foil so as to join the first and second bonding surfaces together. The method extends to joints between a first superconductor and a member using such a reactive foil.
摘要翻译：提供一种在第一超导体和构件之间形成导电接头的方法。提供具有第一接合表面的第一超导体。与第一超导体接合的部件设置有第二接合面。反应箔位于第一和第二粘结表面附近。接合材料位于反应箔和第一和第二粘合表面中的一个或每个之间。通过在反应性箔中引发反应以将第一和第二粘合表面接合在一起而形成接头。该方法延伸到使用这种反应箔的第一超导体和构件之间的接头。

23. 发明申请

WO2014188186A1 METHOD OF PROCESSING A PARTICLE SPECTRUM 审中-公开
标题翻译：处理颗粒光谱的方法
公开(公告)号：WO2014188186A1
公开(公告)日：2014-11-27
申请号：PCT/GB2014/051555
申请日：2014-05-21
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： STATHAM, Peter
IPC分类号： G01T1/17 , G01T1/36
CPC分类号： G01T1/36 , G01T1/171
摘要： A method is provided for processing a spectrum, obtained using a particle detection system, so as to reduce spectrum artefacts arising from unresolved particle events in the detection system. An input spectrum is obtained which contains artefacts due to "pile up" in the detector. A first effect upon the input spectrum of pairs of unresolved particle events is evaluated and a first corrected input spectrum is generated which comprises the input spectrum with the first effect removed. The effect of a pairs of unresolved particle events is then evaluated for this first corrected input spectrum so as to generate a second corrected input spectrum which comprises the input spectrum with the second effect removed. An output spectrum is then generated based upon a combination of the first and second corrected input spectra. The use of the method in improving sum spectra is also discussed.
摘要翻译：提供了一种用于处理使用粒子检测系统获得的光谱的方法，以便减少由检测系统中未解决的粒子事件引起的光谱伪像。获得包含由于检测器“堆积”而产生的伪像的输入光谱。评估对未解决的粒子事件对的输入光谱的第一影响，并且生成包括去除了第一效应的输入光谱的第一校正输入光谱。然后针对该第一校正输入光谱评估一对未解决的粒子事件的影响，以便产生包括去除第二效应的输入光谱的第二校正输入光谱。然后基于第一和第二校正输入光谱的组合产生输出光谱。还讨论了该方法在改进和谱中的应用。

24. 发明申请

WO2013171455A1 APPARATUS FOR REDUCING NOISE IN A CRYOCOOLER SUCH AS FOR MAGNETIC RESONANCE IMAGING SYSTEMS 审中-公开
标题翻译：用于减少诸如磁共振成像系统等的CRYOCOOLER噪声的设备
公开(公告)号：WO2013171455A1
公开(公告)日：2013-11-21
申请号：PCT/GB2013/051092
申请日：2013-04-29
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： GARSIDE, John , BUEHLER, Matthias , JEDAMZIK, Dieter
IPC分类号： F25B9/14 , F25D19/00
CPC分类号： F25B9/14 , F25B9/145 , F25B2500/12 , F25D19/006 , G01R33/3804 , G01R33/3815
摘要： An assembly for operating a cryocooler pedestal is provided. The assembly is operable when in use to provide a cryocooler pedestal with cyclical gaseous connection to high pressure and low pressure gas supply lines, and has a return conduit through which gas is caused to flow from the cryocooler pedestal into the low pressure supply line. The assembly further comprises a dispersion chamber adjacent the return conduit and in flow communication therewith through a plurality of orifices so as to reduce acoustic noise. The assembly has particular application in cooling a Magnetic Resonance Imaging system.
摘要翻译：提供了一种用于操作低温冷却器基座的组件。该组件在使用中可操作地提供具有与高压和低压气体供应管线的循环气体连接的低温冷却器基座，并且具有返回导管，气体从该冷却器底座流过低压供应管线。组件还包括与返回导管相邻的分散室，并通过多个孔与其流体连通，以便减少声学噪声。该组件在冷却磁共振成像系统时具有特别的应用。

25. 发明申请

WO2013128181A1 METHODS AND APPARATUS FOR DEPOSITING AND/OR ETCHING MATERIAL ON A SUBSTRATE 审中-公开
标题翻译：在基材上沉积和/或蚀刻材料的方法和装置
公开(公告)号：WO2013128181A1
公开(公告)日：2013-09-06
申请号：PCT/GB2013/050481
申请日：2013-02-27
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： MCNIE, Mark Edward , COOKE, Michael Joseph , LEA, Leslie Michael
IPC分类号： H01L21/3213 , H01L21/3065
CPC分类号： H01J37/32926 , C23C16/50 , C23C16/52 , G05B19/418 , G05B2219/34198 , H01J37/32449 , H01J37/32816 , H01J37/32834 , H01J37/32917 , H01J2237/24564 , H01J2237/24585 , H01J2237/248 , H01J2237/3321 , H01J2237/334 , H01L21/306 , H01L21/30655 , H01L22/12 , H01L22/26
摘要： Methods are disclosed for depositing material onto and/or etching material from a substrate in a surface processing tool having a processing chamber, a controller and one or more devices for adjusting the process parameters within the chamber. The method comprises: the controller instructing the one or more devices according to a series of control steps, each control step specifying a defined set of process parameters that the one or more devices are instructed to implement, wherein at least one of the control steps comprises the controller instructing the one or more devices to implement a defined set of constant process parameters for the duration of the step, including at least a chamber pressure and gas flow rate through the chamber, which duration is less than the corresponding gas residence time (T gr ) of the processing chamber for the step.
摘要翻译：公开了用于在具有处理室，控制器和用于调节室内的工艺参数的一个或多个装置的表面处理工具中从衬底上沉积材料和/或蚀刻材料的方法。该方法包括：控制器根据一系列控制步骤指示一个或多个设备，每个控制步骤指定一个或多个设备被指示实现的一组定义的过程参数，其中至少一个控制步骤包括所述控制器指示所述一个或多个设备在所述步骤的持续时间内实现一组定义的恒定过程参数，包括至少通过所述室的腔室压力和气体流速，所述持续时间小于相应的气体停留时间（Tgr ）的步骤处理室。

26. 发明申请

WO2018206982A1 METHOD OF JOINING A NIOBIUM TITANIUM ALLOY BY USING AN ACTIVE SOLDER 审中-公开
公开(公告)号：WO2018206982A1
公开(公告)日：2018-11-15
申请号：PCT/GB2018/051287
申请日：2018-05-11
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： JEDAMZIK, Dieter , ADAMS, Alvin
IPC分类号： B23K1/00 , B23K1/06 , B23K1/19 , B23K35/26 , B23K101/38 , B23K103/08 , B23K103/14 , B23K103/18
摘要： There is provided a method of joining a first member made of a niobium titanium alloy to a second member. The method comprises abutting a respective surface of each of the first member and the second member together to form an interface therebetween; providing a molten active solder at a surface of at least the first member at the interface and thermally activating the molten active solder; mechanically agitating the molten active solder so as to cause the molten solder to adhere to the first and second members and form a continuous body of molten solder linking the first and second; and causing the continuous body to solidify thereby forming a solder joint between the first and second members.

27. 发明申请

WO2016067039A1 RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING 审中-公开
标题翻译：具有背面FIB铣削的快速TEM样品制备方法
公开(公告)号：WO2016067039A1
公开(公告)日：2016-05-06
申请号：PCT/GB2015/053259
申请日：2015-10-29
申请人： OMNIPROBE, INC , OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： HAMMER, Mike , DAWSON, Michael , HARTFIELD, Cheryl
IPC分类号： G01N1/32 , H01J37/20 , H01J37/305
CPC分类号： H01J37/3056 , G01N1/32 , H01J37/20 , H01J37/285 , H01J2237/202 , H01J2237/204 , H01J2237/31745 , H01J2237/31749
摘要： A method for TEM sample preparation with backside milling of a sample extracted from a workpiece in an energetic-beam instrument is disclosed, where the energetic-beam instrument comprises: a focused ion beam, a stage capable of motion and tilting, a TEM grid held in a fixed holder on the stage, the TEM grid having a plane and the holder mounted in a fixed orientation with respect to the stage, and a probe tip rotatably connected to a nanomanipulator; the sample having a top surface and a backside and a required plane for the TEM sample that is normal to the top surface of the sample, and the sample being attached to the probe tip; the method comprising: rotating the probe tip by an angle calculated according to the geometry of the apparatus; moving the stage to position the TEM grid so that the plane of the TEM grid is substantially parallel to the required plane for the TEM sample; attaching the extracted sample to the TEM grid and removing the attachment of the probe tip to the extracted sample; and, tilting the stage by a stage-tilt angle, while maintaining the holder in the fixed orientation with respect to the stage, so that the axis of the ion beam is made substantially parallel to the required plane for the TEM sample; thereby placing the extracted sample into position for allowing backside milling by the focused ion beam to prepare a thinned cross-sectional sample for TEM viewing.
摘要翻译：公开了一种用于在能量束仪器中从工件提取的样品进行背面研磨的TEM样品制备方法，其中能量束仪器包括：聚焦离子束，能够运动和倾斜的台架，保持有TEM网格在舞台上的固定支架中，TEM格架具有平面，并且保持器以相对于平台的固定方向安装，以及可旋转地连接到纳米操纵器的探针尖端; 所述样品具有垂直于样品顶表面的TEM样品的顶表面和背面以及所需平面，并且样品附着到探针尖端; 所述方法包括：使所述探针尖端旋转根据所述装置的几何形状计算的角度; 移动舞台以定位TEM格栅，使得TEM格子的平面基本上平行于TEM样品的所需平面; 将提取的样品附着到TEM网格上，并将探针尖端附着到提取的样品上; 并且使台架相对于台架保持固定姿态，同时使台架倾斜角度，使得离子束的轴线基本上平行于TEM样品的所需平面; 从而将提取的样品放置在位置，以允许通过聚焦离子束的背面研磨以制备用于TEM观察的变薄的横截面样品。

28. 发明申请

WO2016016644A1 A METHOD FOR MEASURING THE MASS THICKNESS OF A TARGET SAMPLE FOR ELECTRON MICROSCOPY 审中-公开
标题翻译：用于测量电子显微镜目标样品的质量浓度的方法
公开(公告)号：WO2016016644A1
公开(公告)日：2016-02-04
申请号：PCT/GB2015/052188
申请日：2015-07-29
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： STATHAM, Peter
IPC分类号： G01N23/225
CPC分类号： G01N23/2252 , G01N2223/304 , G01N2223/633 , H01J37/261 , H01J2237/24578
摘要： A method is provided of measuring the mass thickness of a target sample for use in electron microscopy. Reference data are obtained which is representative of the X-rays (28) generated within a reference sample (12) when a particle beam (7) is caused to impinge upon a region (14) of the reference sample (12). The region (14) is of a predetermined thickness of less than 300 nm and has a predetermined composition. The particle beam (7) is caused to impinge upon a region (18) of the target sample (16). The resulting X-rays (29) generated within the target sample (16) are monitored (27) so as to produce monitored data. Output data are then calculated based upon the monitored data and the reference data, the output data including the mass thickness of the region (18) of the target sample (16).
摘要翻译：提供了一种测量用于电子显微镜的目标样品的质量厚度的方法。获得参考数据，其表示当使粒子束（7）撞击参考样品（12）的区域（14）时在参考样品（12）内产生的X射线（28）。区域（14）具有小于300nm的预定厚度并且具有预定的组成。使粒子束（7）撞击到目标样品（16）的区域（18）上。对目标样品（16）内生成的X射线（29）进行监测（27），以产生监测数据。然后基于所监视的数据和参考数据计算输出数据，输出数据包括目标样本（16）的区域（18）的质量厚度。

29. 发明申请

WO2015121603A1 METHOD OF PERFORMING ELECTRON DIFFRACTION PATTERN ANALYSIS UPON A SAMPLE 审中-公开
标题翻译：在样品上进行电子衍射图案分析的方法
公开(公告)号：WO2015121603A1
公开(公告)日：2015-08-20
申请号：PCT/GB2014/050700
申请日：2014-03-10
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： BAUER, Frank Willi
IPC分类号： H01J37/20 , H01J37/252 , H01J37/295 , H01J37/305 , G01N23/20
CPC分类号： G01N23/20058 , G01N23/20025 , G01N23/203 , G01N23/2055 , H01J37/20 , H01J37/252 , H01J37/2955 , H01J37/3056 , H01J2237/20207 , H01J2237/20214 , H01J2237/20221 , H01J2237/24578 , H01J2237/2544 , H01J2237/31749
摘要： A method is provided for performing electron diffraction pattern analysis upon a sample in a vacuum chamber of a microscope. Firstly a sample is isolated from part of a specimen using a focussed particle beam. A manipulator end effector is then attached to the sample so as to effect a predetermined orientation between the end effector and the sample. With the sample detached, the manipulator end effector is rotated about a rotation axis to bring the sample into a predetermined geometry with respect to an electron beam and diffraction pattern imaging apparatus so as to enable an electron diffraction pattern to be obtained from the sample while the sample is still fixed to the manipulator end effector. An electron beam is caused to impinge upon the sample attached to the manipulator end effectorso as to obtain an electron diffraction pattern.
摘要翻译：提供了用于对显微镜的真空室中的样品进行电子衍射图案分析的方法。首先，使用聚焦粒子束从样品的一部分中分离样品。然后将机械手端部执行器附接到样品，以便在末端执行器和样品之间实现预定的取向。在样品分离的情况下，操纵器末端执行器围绕旋转轴线旋转以使样品相对于电子束和衍射图案成像装置成预定几何形状，以便能够从样品获得电子衍射图案，同时样品仍然固定在机械手末端执行器上。使电子束撞击附着在机械手末端效应器上的样品，以获得电子衍射图案。

30. 发明申请

WO2014114927A1 SUBSTRATE CARRIER 审中-公开
标题翻译：基板载体
公开(公告)号：WO2014114927A1
公开(公告)日：2014-07-31
申请号：PCT/GB2014/050162
申请日：2014-01-21
申请人： OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
发明人： NEWTON, Andrew , PIEKARNIAK, Piotr
IPC分类号： H01L21/687
CPC分类号： H01L21/68728
摘要： A substrate carrier for plasma processing apparatus is disclosed, comprising: a base plate assembly comprising a platform on which a substrate is placed in use, the volume to be occupied in use by a substrate placed on the platform constituting a substrate zone; and a top plate assembly on the base plate assembly, the top plate assembly comprising a top plate having an aperture therethrough surrounding the substrate zone and one or more retention members extending into the aperture, over a portion of the substrate zone, such that in use a substrate disposed in the substrate zone is retained in a fixed position between the base plate assembly and the top plate assembly. The upper surface of the top plate, facing away from the base plate assembly, is substantially planar and the one or more retention members protrude above the substantially planar upper surface of the top plate.
摘要翻译：公开了一种用于等离子体处理装置的基板载体，包括：基板组件，其包括在使用中放置基板的平台，被放置在构成基板区域的平台上的基板使用的待使用体积; 以及位于基板组件上的顶板组件，顶板组件包括顶板，该顶板具有穿过其的围绕基板区域的孔，以及在基板区域的一部分上延伸到孔中的一个或多个保持构件，使得在使用中设置在基板区域中的基板被保持在基板组件和顶板组件之间的固定位置。顶板的上表面背离基板组件，其基本上是平面的，并且一个或多个保持构件突出在顶板的基本平坦的上表面上方。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式