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21. 发明申请

US20210025920A1 METHOD FOR ELECTRICALLY CONNECTING A TEST PIECE TO AN ELECTRICAL TEST DEVICE 有权
公开(公告)号：US20210025920A1
公开(公告)日：2021-01-28
申请号：US16981073
申请日：2019-03-15
申请人： Feinmetall GmbH
发明人： Gunther Böhm
IPC分类号： G01R1/073 , G01R31/28
摘要： The invention relates to a test card (1) for electrically connecting a test piece (2) to an electrical test device (3), having at least one holding element (4, 5) and having a plurality of electrically conductive contact devices (9) which are guided and supported by the holding element (4, 5), wherein the holding element (4, 5) has a plurality of openings (8) for guiding and/or supporting the contact devices (9) through which openings in each case one of the contact devices (9) extends. According to the invention, the holding element (4, 5) has a three-dimensional structure.

22. 发明授权

US10684309B2 Contact head for an electrical testing device, testing device 有权
公开(公告)号：US10684309B2
公开(公告)日：2020-06-16
申请号：US15992915
申请日：2018-05-30
申请人： FEINMETALL GMBH
发明人： Stefan Treuz , Denis Tabakow , Berislav Kopilas
IPC分类号： G01R1/067 , G01R31/28 , G01R1/44
摘要： A contact head (6) for an electrical test device (1) for electrically testing substrates, which have electrical contact points, with at least two guide plates (13, 14) that are arranged to each other by a spacer (15) and each have guide openings (16) essentially aligned with each other for receiving pin-shaped contact elements (8) and are oriented to each other by a centering device (20), wherein the centering device (20) has four centering pins (19), which are displaceably mounted in a slot (23), extending toward a center (Z) of the contact head (6), at least of one of the guide plates (13, 14), and wherein the centering pins (19) are each held in a centering opening (18) of the spacer (15). It is provided that the centering openings (18) each have only one guide surface (21) oriented at least essentially parallel to a radial axis (R)—in relation to the center (Z).

23. 发明申请

US20180045774A1 ELECTRIC CONTACT DEVICE 审中-公开
公开(公告)号：US20180045774A1
公开(公告)日：2018-02-15
申请号：US15552343
申请日：2016-02-15
申请人： FEINMETALL GMBH
发明人： Rainer SCHMID
IPC分类号： G01R31/28 , G01R1/073
CPC分类号： G01R31/2831 , G01R1/07342 , G01R1/07357 , G01R31/2808
摘要： A contact device for an electric contact for electrically testing an electric test object, comprising a contact head and at least one printed circuit board. The contact head has a plurality of guide bores in which elongated contact elements that buckle elastically in a lateral direction upon contacting the test object are mounted in a longitudinally movable manner. One end of the contact element is used to contact the test object and the other end is in contact with first contact surfaces which are arranged in a specified pattern and which are located on a face of the printed circuit board in a first, central region of the printed circuit board face. Second contact surfaces are arranged in a further specified pattern, are electrically connected to the first contact surfaces through the printed circuit board, and lie on the other face of the printed circuit board in a second, central region of the printed circuit board face. Third contact surfaces lie on the other face of the printed circuit board in at least one first peripheral portion of the printed circuit board face. At least some of the second contact surfaces are electrically connected to at least some of the third contact surfaces by bonded bonding wires. At least some of the first contact surfaces and/or at least some of the second contact surfaces are each electrically connected to one another by severable conductors, and at least one of which is severed.

24. 发明申请

US20160109483A1 ELECTRICAL CONTACTING DEVICE 有权
标题翻译：电气接触装置
公开(公告)号：US20160109483A1
公开(公告)日：2016-04-21
申请号：US14786770
申请日：2014-03-25
申请人： FEINMETALL GMBH
发明人： Gunther BÖHM , Georg STEIDLE , Wolfgang SCHÄFER , Achim WEILAND
IPC分类号： G01R1/073 , G01R31/28 , H01R12/71
CPC分类号： G01R1/07357 , G01R31/2889 , H01R12/714 , H01R12/91
摘要： An electrical contacting device for electrical physical contact with a specimen, particularly wafers, taking place in a contacting direction, with at least one conductor substrate which can be electrically connected to a testing device, at least one contact distance transformer and at least one contact head having electrical contact elements, particularly resilient contact elements, preferably serving to compensate different physical contact distances existing in the contacting direction particularly at the contact elements.
摘要翻译：一种用于与接触方向上发生的样品（特别是晶片）电学物理接触的电接触装置，所述电接触装置与至少一个能够电连接到测试装置的导体基板，至少一个接触距离变压器和至少一个接触头具有电接触元件，特别是弹性接触元件，优选用于补偿存在于接触方向，特别是接触元件处的不同物理接触距离。

25. 发明申请

US20230008782A1 TEST APPARATUS FOR TEST CARDS 有权
公开(公告)号：US20230008782A1
公开(公告)日：2023-01-12
申请号：US17946982
申请日：2022-09-16
申请人： Feinmetall GmbH
发明人： Carsten Molitor , Aleksandar Markovski , Helmut Seefeldt
IPC分类号： G01R1/073 , G01R31/28
摘要： A test apparatus (1) for test cards (37), comprising a receiving device (3) for holding at least one test card (37) to be tested, comprising at least one contact device (4) for making electrical touch contact with electrically conductive contact points of the at least one test card (37) in the receiving device (3), wherein the contact device (4) can be arranged vertically above the receiving device for the purpose of making touch contact, and comprising an actuating device (19), which is formed to displace the contact device (4) and the receiving device (3) relative to one another for the purpose of establishing the touch contact. It is provided that the receiving device (3) can be displaced by means of the actuating device (19) from a test position, which is located vertically below the contact device (4), into a loading and unloading position, which is laterally spaced apart from the contact device (4), and the other way round.

26. 发明授权

US11519937B2 Contact element system with at least two contact elements having different cross-sectional areas, differently shaped strips in an intermediate region, and a same bending rigidity 有权
公开(公告)号：US11519937B2
公开(公告)日：2022-12-06
申请号：US16618855
申请日：2018-06-05
申请人： FEINMETALL GMBH
发明人： Gunther Böhm , Matthias Schnaithmann , Achim Weiland
IPC分类号： G01R1/067 , G01R1/073 , H01R13/24
摘要： A contact element system has a plurality of pin-type or needle-type and electrically conductive contact elements of equal length, which each have two end regions for electrically contacting contact positions and each have an intermediate region under longitudinal loading, overcoming their bending rigidity, and are designed with lamellar sections in the intermediate region such that they have at least two strips which are substantially parallel to each other and run at a distance from one another. At least two of the contact elements have different cross sectional surfaces and differently formed strips in the intermediate region, wherein the forms of the strips are chosen such that the contact elements have the same or approximately the same bending rigidity.

27. 发明授权

US10197620B2 Electric contact device 有权
公开(公告)号：US10197620B2
公开(公告)日：2019-02-05
申请号：US15552343
申请日：2016-02-15
申请人： FEINMETALL GMBH
发明人： Rainer Schmid
IPC分类号： G01R31/28 , G01R1/073
摘要： A contact device for an electric contact for electrically testing an electric test object, comprising a contact head and at least one printed circuit board. The contact head has a plurality of guide bores in which elongated contact elements that buckle elastically in a lateral direction upon contacting the test object are mounted in a longitudinally movable manner. One end of the contact element is used to contact the test object and the other end is in contact with first contact surfaces which are arranged in a specified pattern and which are located on a face of the printed circuit board in a first, central region of the printed circuit board face. Second contact surfaces are arranged in a further specified pattern, are electrically connected to the first contact surfaces through the printed circuit board, and lie on the other face of the printed circuit board in a second, central region of the printed circuit board face. Third contact surfaces lie on the other face of the printed circuit board in at least one first peripheral portion of the printed circuit board face. At least some of the second contact surfaces are electrically connected to at least some of the third contact surfaces by bonded bonding wires. At least some of the first contact surfaces and/or at least some of the second contact surfaces are each electrically connected to one another by severable conductors, and at least one of which is severed.

28. 发明申请

US20170023615A1 CONTACT-DISTANCE TRANSFORMER, ELECTRICAL TESTING DEVICE, AND METHOD FOR PRODUCING A CONTACT-DISTANCE TRANSFORMER 审中-公开
标题翻译：接触距离变压器，电气测试装置及其制造接触式变压器的方法
公开(公告)号：US20170023615A1
公开(公告)日：2017-01-26
申请号：US15301058
申请日：2015-04-02
申请人： FEINMETALL GMBH
发明人： Cetin Ekin
IPC分类号： G01R1/073 , H05K1/02 , G01R1/04 , H05K3/40 , H05K3/12 , H01L21/67 , H05K1/11 , H05K3/46
CPC分类号： G01R1/07371 , B33Y80/00 , G01R1/0491 , G01R1/06761 , G01R1/07342 , G01R1/07357 , G01R3/00 , G01R31/2889 , H01L21/67288 , H01R12/714 , H01R12/91 , H05K1/0296 , H05K1/112 , H05K1/162 , H05K1/165 , H05K1/167 , H05K3/1241 , H05K3/4038 , H05K3/4614 , H05K3/4664 , H05K3/4673 , H05K2201/0187 , H05K2201/09236 , H05K2201/09263 , H05K2201/10189 , H05K2201/10265 , H05K2201/1031 , H05K2201/10378 , H05K2203/0126 , H05K2203/159
摘要： A contact-distance transformer of an electric testing device for testing an electric specimen such as a wafer, for reducing a distance between neighboring electric contacts, the transformer having a non-electrically conductive supporting structure with a first side with first electric contacts positioned apart a first distance and a second side with second electric contacts positioned apart a second, smaller distance. The first contacts are connected to the second contacts by electric connections passing through the support structure and/or which are positioned on the support structure.
摘要翻译：一种用于测试诸如晶片的电试样的电测试装置的接触距离变压器，用于减小相邻电触头之间的距离，所述变压器具有非导电支撑结构，其具有第一侧，第一电触点位于第一侧第一距离和第二侧，其中第二电触点定位在第二较小距离处。第一触点通过穿过支撑结构的电连接和/或定位在支撑结构上的电连接件连接到第二触点。

29. 发明申请

US20220317154A1 CONTACT PIN WITH INDIVIDUALLY MOVABLE CONTACT ELEMENTS 有权
公开(公告)号：US20220317154A1
公开(公告)日：2022-10-06
申请号：US17843209
申请日：2022-06-17
申请人： Feinmetall GmbH
发明人： Lutz Benedix , Jörg Burgold
IPC分类号： G01R1/067
摘要： The invention relates to a contact device (1) for contacting an electrical contact point of a test object, comprising a contact plunger (3), which has a plunger shaft (4) for mounting in a guide sleeve (2) in an axially displaceable manner as well as a contact head (5) which is assignable to the test object and arranged on a free end of the plunger shaft (4), and comprising at least one contact element (13), which is movably mounted on and/or in the contact head (5), whereby at least one spring element (6), which is elastically deformable against its spring force by means of the contact element (13) under a load resulting from a contact, is assigned to the contact element (13). is provided that several of the contact elements (13), which in each case have a contact area (14) for contacting, are arranged next to one another on the contact head (5) in such a way that the contact areas (14) form an at least essentially continuous contact surface (15) of the contact head (5) for the contact point in the unloaded state.

30. 发明授权

US10775416B2 Method for producing a contact spacing converter and contact spacing converter 有权
公开(公告)号：US10775416B2
公开(公告)日：2020-09-15
申请号：US15561873
申请日：2016-02-15
申请人： FEINMETALL GMBH
发明人： Christian König , Jörg Burgold , Gunther Böhm , Wolfgang Schäfer
IPC分类号： G01R3/00 , G01R1/073 , B33Y10/00 , B29C64/10 , C23C18/32 , C23C28/02 , C25D3/12 , C25D5/48 , C25D7/00
摘要： A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.

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