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11. 发明申请

US20040257101A1 Probe area setting method and probe device 失效
标题翻译：探头区域设置方法和探头设备
公开(公告)号：US20040257101A1
公开(公告)日：2004-12-23
申请号：US10492557
申请日：2004-04-14
发明人： Youzou Miura , Tomokazu Ozawa
IPC分类号： G01R031/02 , G01R027/08
CPC分类号： H01L22/20 , G01R1/06794 , H01L21/681 , H01L2924/0002 , H01L2924/00
摘要： With a wafer having an indefinite shape or a broken wafer, it is hard for an operator to assign the design address of an edge chip and set a probe area. In a probe-area setting method of this invention, a wafer W is placed on a main chuck (18) that is movable at least in the X- and Y-directions. The main chuck (18) is moved, thus moving wafer W in the X- and Y-directions. All edge chips formed on the wafer W are retrieved by means of an upper camera (21A), thereby setting a probe area. To retrieve the edge chips, an edge chip is selected as one with which the retrieval should be started. The edge chips are successively retrieved in the turning direction of the wafer, as the chip retrieval direction is changed to the X- or Y-direction.
摘要翻译：对于具有不确定形状或破碎的晶片的晶片，操作者难以分配边缘芯片的设计地址并设置探针区域。在本发明的探针区域设定方法中，将晶片W放置在能够至少沿X方向和Y方向移动的主卡盘（18）上。主卡盘（18）移动，从而使晶片W沿X方向和Y方向移动。形成在晶片W上的所有边缘芯片通过上摄像机（21A）被检索，从而设置探针区域。为了检索边缘芯片，选择一个边缘芯片作为启动检索的芯片。当芯片取回方向改变为X方向或Y方向时，沿着晶片的转动方向连续地取出边缘芯片。

12. 发明申请

US20040257099A1 Conductive coil contact member 失效
标题翻译：导电线圈接触件
公开(公告)号：US20040257099A1
公开(公告)日：2004-12-23
申请号：US10892642
申请日：2004-07-15
发明人： Toshio Kazama
IPC分类号： G01R031/02
CPC分类号： G01R1/06716 , G01R1/0466 , G01R1/0483
摘要： In a conductive coil contact member having at least one tapered end consisting of a plurality of turns of coil wire having a progressively smaller coil radius toward a free end thereof, the coil wire comprises a core wire and at least one highly electrically conductive layer formed over the core wire, a last turn of the coil wire at the free end having a smaller coil radius than would be possible by coiling the coil wire. Thus, the core wire is coiled to a smallest possible radius in the last turn, and the coil wire diameter is thereafter increased by forming layers formed by plating or other similar methods. The final result is that the last turn of the coil wire at the free end has a smaller coil radius than would be possible by coiling the coil wire. The reduction in the coil radius of the last turn contributes to the improvement in the positional accuracy of the free end of the tapered end of the conductive coil contact member.
摘要翻译：在具有至少一个锥形端的导电线圈接触构件中，所述至少一个锥形端由多圈的线圈绕组组成，线圈线的自由端具有逐渐更小的线圈半径，所述线圈线包括芯线和至少一个高导电层，芯线，在自由端的线圈线的最后一圈具有比通过卷绕线圈线可能的更小的线圈半径。因此，芯线在最后一圈被卷绕成尽可能小的半径，然后通过形成通过电镀形成的层或其它类似方法来增加线圈线直径。最后的结果是线圈线在自由端的最后一圈具有比通过卷绕线圈线可能的更小的线圈半径。最后一圈的线圈半径的减小有助于提高导电线圈接触构件的锥形端部的自由端的位置精度。

13. 发明申请

US20040251906A1 Methods for affirming switched status of MEMS-based devices 失效
公开(公告)号：US20040251906A1
公开(公告)日：2004-12-16
申请号：US10839545
申请日：2004-05-04
申请人： PTS Corporation
发明人： Bevan Staple , Robert Anderson
IPC分类号： G01R031/02
CPC分类号： G02B26/0841
摘要： A configuration is provided by which it may be determined whether a MEMS device is in a select state. The select state is defined by a position of a moveable element, which is moved with electrostatic forces upon activation of an electrode. The select state is detected with a sensing configuration that has first and second regions. The regions are generally separated such that they are electrically uncoupled unless the moveable element is in the position that defines the select state. A detector may be provided to indicate whether the first and second regions are coupled electrically.

14. 发明申请

US20040251891A1 Suction cap for IC sockets and IC socket assembly using same 失效
标题翻译：集成电路插座和IC插座组件的吸头
公开(公告)号：US20040251891A1
公开(公告)日：2004-12-16
申请号：US10831006
申请日：2004-04-23
发明人： Shinichi Hashimoto
IPC分类号： G01R031/02
CPC分类号： G01R1/045 , H05K3/303
摘要： An IC socket suction cap and an IC socket assembly that employs the suction cap are configured to reduce the risk of deforming a housing of the IC socket assembly. The IC socket assembly includes a loading plate for applying pressure on the IC socket housing by the operation of a lever. The IC socket suction cap includes a flat suction surface, latch arms for latching and engaging the housing, and loading plate holding pieces, for holding the loading plate in a state in which it does not exert pressure onto the housing.
摘要翻译：使用吸嘴的IC插座吸头盖和IC插座组件被构造成减小IC插座组件的壳体变形的风险。 IC插座组件包括用于通过杠杆的操作在IC插座壳体上施加压力的装载板。 IC插座吸嘴包括平坦的抽吸表面，用于闩锁和接合壳体的闩锁臂以及装载板保持件，用于将装载板保持在不对壳体施加压力的状态。

15. 发明申请

US20040239358A1 Output buffer circuit having signal path used for testing and integrated circuit and test method including the same 失效
标题翻译：具有用于测试和集成电路的信号路径的输出缓冲电路及包括其的测试方法
公开(公告)号：US20040239358A1
公开(公告)日：2004-12-02
申请号：US10851332
申请日：2004-05-24
发明人： Si-Young Choi
IPC分类号： G01R031/02
CPC分类号： G01R31/31715 , G01R31/31713
摘要： An output buffer circuit includes a signal path used for testing and designed for outputting output signals at predetermined logic levels in response to internal output signals from an internal logic circuit. The output buffer circuit and includes a first control input, a second control input, a test signal input circuit, and a plurality of output buffers. The first control input receives a predetermined control signal. The second control input receives a test signal having a predetermined voltage. The test signal input circuit switches between a test mode and a normal mode in response to the control signal, receives and outputs the test signal while in the test mode, and receives and outputs the internal output signals while in the normal mode. The plurality of output buffers output the output signals through a plurality of outputs, in response to the internal output signals or the test signal. The output buffer circuit, and a test method using the same, are advantageous in that the characteristics of the output buffers can be exactly evaluated without being affected by the internal logic circuit.
摘要翻译：输出缓冲电路包括用于测试的信号路径，用于响应于来自内部逻辑电路的内部输出信号以预定逻辑电平输出输出信号。输出缓冲电路，包括第一控制输入，第二控制输入，测试信号输入电路和多个输出缓冲器。第一控制输入接收预定的控制信号。第二控制输入接收具有预定电压的测试信号。测试信号输入电路响应于控制信号在测试模式和正常模式之间切换，在测试模式下接收并输出测试信号，并在正常模式下接收和输出内部输出信号。响应于内部输出信号或测试信号，多个输出缓冲器通过多个输出输出输出信号。输出缓冲电路和使用该输出缓冲电路的测试方法的优点在于可以精确地估计输出缓冲器的特性而不受内部逻辑电路的影响。

16. 发明申请

US20040239357A1 Contactor for electronic components and test method using the same 有权
标题翻译：电子元件接触器和使用相同的测试方法
公开(公告)号：US20040239357A1
公开(公告)日：2004-12-02
申请号：US10854172
申请日：2004-05-27
申请人： FUJITSU LIMITED
发明人： Kazuhiro Tashiro , Shigeyuki Maruyama , Daisuke Koizumi , Takumi Kumatabara , Keisuke Fukuda
IPC分类号： G01R031/02
CPC分类号： G01R1/0483 , G01R1/0441
摘要： A contactor configured to be electrically connected to the terminals of an electronic component is disclosed. The connector includes multiple contact electrodes contacting the terminals of the electronic component and multiple elastic electrodes each composed of an electrically conductive elastic body. The elastic electrodes generate a pressing force for pressing the contact electrodes against the terminals of the electronic component. The contact electrodes are separable from the elastic electrodes.
摘要翻译：公开了一种被配置为电连接到电子部件的端子的接触器。连接器包括与电子部件的端子接触的多个接触电极和各自由导电性弹性体构成的多个弹性电极。弹性电极产生用于将接触电极压靠在电子部件的端子上的按压力。接触电极可与弹性电极分离。

17. 发明申请

US20040239349A1 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof 有权
标题翻译：半导体芯片的探针卡和测试方法，电容器及其制造方法
公开(公告)号：US20040239349A1
公开(公告)日：2004-12-02
申请号：US10621445
申请日：2003-07-18
申请人： FUJITSU LIMITED
发明人： Yasuo Yamagishi , Takeshi Shioga , John David Baniecki , Kazuaki Kurihara
IPC分类号： G01R031/02
CPC分类号： G01R1/07378 , G01R31/2886 , H01L2224/05568 , H01L2224/05573 , H01L2224/16 , H01L2224/48091 , H01L2224/48247 , H01L2924/00014 , H01L2924/15311 , H01L2224/05599
摘要： A probe card includes probes, a build-up interconnection layer having a multilayer interconnection structure therein and carrying the probes on a top surface in electrical connection with the multilayer interconnection structure, and a capacitor provided on the build-up interconnection layer in electrical connection with one of the probes via the multilayer interconnection structure, wherein the multilayer interconnection structure includes an inner via-contact in the vicinity of the probe and the capacitor is embedded in a resin insulation layer constituting the build-up layer.
摘要翻译：探针卡包括探针，在其中具有多层互连结构的堆积互连层，并且在与多层互连结构电连接的顶表面上承载探针，以及设置在积层互连层上的电容器，其与通过多层互连结构的探针中的一个，其中多层互连结构包括在探针附近的内部通孔接触，并且电容器嵌入构成堆积层的树脂绝缘层中。

18. 发明申请

US20040232931A1 Thin film probe card contact drive system 有权
公开(公告)号：US20040232931A1
公开(公告)日：2004-11-25
申请号：US10884552
申请日：2004-07-02
申请人： Intel Corporation
发明人： Warren Stuart Crippen
IPC分类号： G01R031/02
CPC分类号： G01R1/0735 , G01R1/07371 , H01R13/24 , H01R13/631 , H01R2201/20
摘要： A probe card includes a flexible membrane, a plurality of probes attached to the flexible membrane, and a layer of foam connected to the flexible membrane so that when the probes are moved into the flexible membrane, the layer of foam is also deflected to produce a counteracting force at the probes. A plurality of push rods are used to transfer the force at the contacts to the foam layer. The foam layer is attached to a rigid plate or push plate. A guide plate includes openings through which the push rods pass. The guide plate supports the push rods along their length and reduces the spacing between the push rods at the flexible member when compared to the spacing of the push rods at the foam layer.

19. 发明申请

US20040232929A1 Multi point contactor and blade construction 失效
标题翻译：多点接触器和叶片结构
公开(公告)号：US20040232929A1
公开(公告)日：2004-11-25
申请号：US10877418
申请日：2004-06-25
申请人： Ceramic Component Technologies, Inc.
发明人： Christian R. Saulnier , James G. Gasque , Manuel A. Gallardo
IPC分类号： G01R031/02
CPC分类号： G01R1/0425
摘要： A multi point contactor (MPC) on a component testing system for electrically contacting a terminal on a device under test (DUT) includes at least three independently moveable contacts to help insure at least two of them contact the DUT terminal. At least one of the contacts includes an integral spring, preferably in the form of a blade laser machined from a sheet of electrically conductive material to include a first portion for bearing against the contact-holding structure, a second portion for bearing against the terminal on the DUT, and a third portion interconnecting the first and second portions that functions as an integral spring bias for spring biasing the second portion from the first portion toward the terminal on the DUT. Preferably, the third portion of the blade has a serpentine shape that consistently results in desired constant-force spring characteristics over a nominal range of blade travel.
摘要翻译：用于电接触待测器件（DUT）上的端子的元件测试系统上的多点接触器（MPC）包括至少三个可独立移动的触点，以帮助确保其中至少两个接触DUT端子。触点中的至少一个包括整体式的弹簧，优选地以从导电材料片加工的刀片激光器的形式，包括用于抵靠接触保持结构的第一部分，用于抵靠端子的第二部分所述DUT和第三部分互连，所述第一和第二部分用作一体的弹簧偏压，用于将所述第二部分从所述第一部分向所述DUT的所述端子弹簧偏置。优选地，叶片的第三部分具有蛇形形状，其一致地在叶片行进的标称范围内产生期望的恒定力弹簧特性。

20. 发明申请

US20040232924A1 Methods and systems for automated pipeline testing 失效
标题翻译：自动化管道测试的方法和系统
公开(公告)号：US20040232924A1
公开(公告)日：2004-11-25
申请号：US10873473
申请日：2004-06-22
发明人： Thomas N. Hilleary , Perry B. Peden JR.
IPC分类号： G01R031/02 , G01R027/08 , H04Q009/00
CPC分类号： G01N17/02 , C23F13/22 , C23F2213/32 , F16L58/00
摘要： A method for testing a cathodic protection system is disclosed where the system includes a cathodic protection rectifier configured to apply a voltage across a pipeline and a reference point. The method includes measuring a magnitude of an output voltage of the cathodic protection rectifier, transmitting to a site remote from the rectifier, the measured output voltage magnitude using a cellular control channel, receiving the transmitted measurement at the remote site, and using the transmitted measurement to determine whether the cathodic protection system is operational.
摘要翻译：公开了一种用于测试阴极保护系统的方法，其中系统包括被配置为跨越管道和参考点施加电压的阴极保护整流器。该方法包括测量阴极保护整流器的输出电压的大小，使用蜂窝控制信道传输到远离整流器的位置，测量的输出电压幅度，在远程站点接收所发送的测量值，以及使用所传送的测量值以确定阴极保护系统是否可操作。

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