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11. 发明公开

EP2870437A1 RADIOMETRISCHE MESSANORDNUNG UND VERFAHREN ZUR DETEKTION VON ANSATZBILDUNG IN EINER RADIOMETRISCHEN MESSANORDNUNG 有权转让
标题翻译：无线电测用于测量检测方法的教育设备和方法，一个无线电测测量装置
公开(公告)号：EP2870437A1
公开(公告)日：2015-05-13
申请号：EP13727610.1
申请日：2013-06-07
申请人： Endress+Hauser GmbH+Co. KG
发明人： GLASER, Dirk , URBAN, Martin
IPC分类号： G01F23/288 , G01N9/24
CPC分类号： G01F23/2885 , G01F23/2845 , G01F23/288 , G01F25/0092 , G01N9/24 , G01N23/083 , G01N23/10 , G01N23/18 , G01N2223/302 , G01N2223/3037 , G01N2223/639
摘要： The invention relates to a radiometric measuring arrangement for measuring and/or monitoring a measurement variable, in particular a fill state or a density (ϱ), of contents (3) which can be found in a container (1) and to a method which can be carried out using said arrangement in order to detect a deposit formation in the container (1). The variable to be measured is measured by means of a measuring device, which emits radioactive radiation through the container (1) along a measuring beam path (A, A') during operation and which measures a radiation intensity (1
A ) exiting the container (1) along the measurement beam path (A, A'), and by means of a comparative measuring device, which emits radioactive radiation through the container (1) along a comparison beam path (B, B', C) and which measures a radiation intensity (l
B ) exiting the container (1) along the comparison beam path (B, B', C). The comparison beam path (B, B', C) runs through the container (1) such that a ratio (VA) of a sum of the two measuring beam path (A, A') segments (A1, A3) running through the deposit layer (21) to the length of another measuring beam path (A, A') segment (A2) running between said two segments (A1, A3) differs from the ratio (VB, VC) formed in the same manner for the comparison beam path (B, B', C) when a deposit layer (21) is present on the inner walls of the container (1). A deposit formation present during operation is detected using deviations, which are ascertained during operation, between the measurement results of the measuring device and the measurement results of the comparative measuring device.

12. 发明公开

EP2511937A4 ELECTRON MICROSCOPE 有权
标题翻译：电子显微镜
公开(公告)号：EP2511937A4
公开(公告)日：2015-03-04
申请号：EP10835635
申请日：2010-10-25
申请人： HITACHI HIGH TECH CORP
发明人： KAJI KAZUTOSHI
IPC分类号： H01J37/244 , G01N23/04 , G01N23/225 , H01J37/22 , H01J37/24 , H01J37/26 , H01J37/28
CPC分类号： H01J37/244 , G01N23/04 , G01N2223/102 , G01N2223/3037 , H01J37/26 , H01J2237/24415 , H01J2237/24485 , H01J2237/24495 , H01J2237/28
摘要： An object of the present invention relates to measurement of a quantitative element image with a high S/N ratio and measurement of an electron energy loss spectrum with high energy precision and energy resolution. The present invention relates to measurement of a characteristic X-ray spectrum obtained by correcting dead time due to excessive X rays and measurement of an electron energy loss spectrum obtained by correcting energy based on a zero loss peak in the case where the characteristic X-ray spectrum and the electron energy loss spectrum are measured by irradiating one irradiation position on a sample with an electron beam for a predetermined time while scanning the surface of the sample to observe a Z-contrast image. According to the present invention, it becomes possible to measure a quantitative element image with a high S/N ratio by a characteristic X ray, an element image with a high S/N ratio by an electron energy loss spectrum and a high energy resolution spectrum.

13. 发明申请

WO2016001536A1 PROCÉDÉ ET SYSTÈME D'ANALYSE D'UN OBJET PAR DIFFRACTOMÉTRIE UTILISANT UN SPECTRE EN DIFFUSION ET UN SPECTRE EN TRANSMISSION 审中-公开
标题翻译：使用散射光谱和透射光谱分析物体的方法和系统
公开(公告)号：WO2016001536A1
公开(公告)日：2016-01-07
申请号：PCT/FR2015/051714
申请日：2015-06-25
申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
发明人： PAULUS, Caroline , TABARY, Joachim
IPC分类号： G01N23/20 , G01N23/201 , G01N23/087
CPC分类号： G01N23/20083 , G01N23/087 , G01N23/201 , G01N23/2076 , G01N2223/04 , G01N2223/045 , G01N2223/3037 , G01N2223/304 , G01N2223/316 , G01N2223/50
摘要： L'invention concerne un procédé d'analyse d'un objet comprenant; irradiation de l'objet par un rayonnement photonique incident; acquisition d'un spectre énergétique diffusé par le matériau à l'aide d'un détecteur spectrométrique (6) placé en diffusion; acquisition d'un spectre énergétique transmis par le matériau à l'aide d'un détecteur spectrométrique (7) placé en transmission; reconstruction d'une signature (f) représentative de l'objet, à partir à la fois du spectre en diffusion mesuré et du spectre en transmission mesuré; comparaison de sa signature ainsi reconstruite à des signatures de matériaux étalons.
摘要翻译：本发明涉及一种用于分析物体的方法，包括：用入射光子辐射照射物体; 以散射模式使用光谱测定器（6）获取由材料散射的能谱; 以传输模式获取由所述材料使用光谱检测器（7）发送的能谱; 从测量的散射光谱和从测量的透射光谱重建表示物体的签名（f）; 将如此重建的签名与标准材料的签名进行比较。

14. 发明申请

WO2013001247A1 PROCEDE ET DISPOSITIF D'IDENTIFICATION D'UN MATERIAU PAR ANALYSE SPECTRALE DE RAYONNEMENTS ELECTROMAGNETIQUES TRAVERSANT CE MATERIAU 审中-公开
标题翻译：通过材料电磁辐射的光谱分析来识别材料的方法和装置
公开(公告)号：WO2013001247A1
公开(公告)日：2013-01-03
申请号：PCT/FR2012/051510
申请日：2012-06-29
申请人： COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES , BELDJOUDI, Guillaume , REBUFFEL, Véronique , RINKEL, Jean
发明人： BELDJOUDI, Guillaume , REBUFFEL, Véronique , RINKEL, Jean
IPC分类号： G01B15/02 , G01V5/00 , G01N23/087
CPC分类号： G01R23/18 , A61B6/52 , G01B15/025 , G01N23/087 , G01N2223/3037 , G01R23/16 , G06K9/00523
摘要： Ce procédé d'identification d'un matériau comporte les étapes suivantes : mesure (200) d'un spectre d'un rayonnement électromagnétique transmis à travers le matériau à identifier; détermination (202, 204) d'au moins une bande d'énergies, dite bande de mesure, et de coefficients spectraux d'une fonction de comparaison dans cette bande de mesure, à partir du spectre mesuré; estimation (PH1, PH2), à l'aide des coefficients spectraux déterminés, de la nature et/ou de l'épaisseur du matériau à identifier sur la base d'un ensemble de paramètres spectraux de référence relatifs à des matériaux et/ou épaisseurs de référence et définis dans des bandes de référence. L'estimation comporte au moins les deux étapes suivantes : sélection préalable (208i, 208p) d'une pluralité de matériaux et/ou épaisseurs de référence, dits candidats possibles, à partir d'une confrontation des coefficients spectraux déterminés avec au moins une partie des paramètres spectraux de référence; estimation (222) de la nature et/ou de l'épaisseur du matériau à identifier à partir d'une confrontation des coefficients spectraux déterminés avec les paramètres spectraux d'au moins une partie des candidats possibles, dans au moins une bande d'énergies commune aux bandes de référence de ladite au moins une partie des candidats possibles et à la bande de mesure.
摘要翻译：本发明涉及一种用于识别材料的方法，包括以下步骤：测量（200）透过待鉴定材料的电磁辐射谱; 从测量的光谱中确定（202,204）至少一个称为测量带的能带和所述测量带中的比较函数的频谱系数; 基于与参考厚度和/或材料有关的参考光谱参数的集合并且在参考频带内定义，使用预定的频谱系数来估计（PH1，PH2）要识别的材料的性质和/或厚度。该估计至少包括以下两个步骤：从参考光谱的至少一部分确定的光谱系数的比较中，先前选择（208i，208p）多个参考厚度和/或材料（称为可能的候选）参数; 并且从至少一个可能候选的一部分的光谱参数确定的光谱系数的比较中估计（222）待识别的材料的性质和/或厚度，所述至少一部分可能候选的参考频带和测量带。

15. 发明申请

WO2015089580A1 IMPROVED METHOD FOR RAPID ANALYSIS OF GOLD 审中-公开
标题翻译：黄金快速分析的改进方法
公开(公告)号：WO2015089580A1
公开(公告)日：2015-06-25
申请号：PCT/AU2014/050424
申请日：2014-12-16
申请人： COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
发明人： TICKNER, James , ROACH, Greg
IPC分类号： G01N23/223 , G21G1/12 , G01T1/24 , G01T1/34
CPC分类号： G01N23/221 , A61B6/4258 , G01N23/2208 , G01N2223/07 , G01N2223/072 , G01N2223/074 , G01N2223/1016 , G01N2223/3037 , G01N2223/616 , G21G1/12
摘要： A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy.
摘要翻译：提供了确定样品中目标元素浓度的方法。该方法包括（i）相对于包含参考元件的参考材料定位包含目标元素的样品，（ii）用Bre致辐射X射线同时照射样品和参考物质，从而在目标元素中产生活化的核，在参考元件中产生活化的核，（iii）从照射的样品中检测去激活的γ射线，以及从照射的参考物质中去激活γ射线，（iv）从被照射样品中确定检测到的去激活γ射线的第一数量和来自所述参考物质的检测到的去激活γ射线的第二数量，以及（v）通过首先将来自被照射的样品的检测到的去激活γ射线的第一数量归一化来确定样品中的目标元素的浓度第二数量检测到来自参考物质的失活γ射线。参考元件与目标元件截面比在电子束能量范围内的变化小于预定的测量精度。

16. 发明申请

WO2009122317A2 SPECTRAL DETECTOR CALIBRATION 审中-公开
标题翻译：光谱检测器校准
公开(公告)号：WO2009122317A2
公开(公告)日：2009-10-08
申请号：PCT/IB2009/051189
申请日：2009-03-20
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , LIVNE, Amir , WAINER, Naor , SCHLOMKA, Jens-Peter , ROESSL, Ewald , PROKSA, Roland
发明人： LIVNE, Amir , WAINER, Naor , SCHLOMKA, Jens-Peter , ROESSL, Ewald , PROKSA, Roland
IPC分类号： G01N23/02 , A61B6/03
CPC分类号： G01T7/005 , A61B6/032 , A61B6/4035 , A61B6/4042 , A61B6/4441 , A61B6/482 , A61B6/585 , G01N2223/3037 , G01T1/1647
摘要： A method includes detecting radiation that traverses a material having a known spectral characteristic with a radiation sensitive detector pixel that outputs a signal indicative of the detected radiation and determining a mapping between the output signal and the spectral characteristic. The method further includes determining an energy of a photon detected by the radiation sensitive detector pixel based on a corresponding output of the radiation sensitive detector pixel and the mapping.
摘要翻译：一种方法包括利用辐射敏感检测器像素检测穿过具有已知光谱特性的材料的辐射，所述辐射敏感检测器像素输出指示检测到的辐射的信号并确定输出信号和光谱特性之间的映射。该方法还包括基于辐射敏感检测器像素的对应输出和映射来确定由辐射敏感检测器像素检测到的光子的能量。

17. 发明授权

US12099025B2 Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection 有权
$Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection$
公开(公告)号：US12099025B2
公开(公告)日：2024-09-24
申请号：US17849632
申请日：2022-06-25
申请人： THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
发明人： Lin Zheng , Shitao Dou , Xin Chen , Lunwu Zhang , Jin Zhang , Taibin Wu , Luchang Che , Chengzhang Wang , Kun Zhou , Fangchao Zhao , Changguang He , Xianhe Feng
IPC分类号： G01N23/207 , G01N23/20008 , G01N23/20091 , G01N23/2055
CPC分类号： G01N23/207 , G01N23/20008 , G01N23/20091 , G01N23/2055 , G01N2223/0563 , G01N2223/0566 , G01N2223/1016 , G01N2223/204 , G01N2223/3037 , G01N2223/316 , G01N2223/3306 , G01N2223/3307 , G01N2223/3308 , G01N2223/331 , G01N2223/501 , G01N2223/605 , G01N2223/606 , G01N2223/607
摘要： A device for measuring short-wavelength characteristic X-ray diffraction based on array detection, and a measurement and analysis method based on the device are provided. An array detector of the device only detects and receives a diffraction ray which is diffracted by a material of a to-be-measured part inside a sample and passes through a through hole of a receiving collimator, and rays passing through a positioning hole. The to-be-measured part inside the sample is placed at the center of the diffractometer circle of the device. The method is performed with the device. With the present disclosure, a diffraction pattern of a part inside the sample with a centimeter thickness, i.e. Debye rings, can be rapidly and non-destructively measured, thereby rapidly and non-destructively measuring and analyzing crystal structures, and its crystal structural change of the part inside the sample, such as phase, texture, and stress.

18. 发明申请

US20180059037A1 METHOD OF FABRICATING A REFERENCE BLADE FOR CALIBRATING TOMOGRAPHIC INSPECTION, AND A RESULTING REFERENCE BLADE 审中-公开
公开(公告)号：US20180059037A1
公开(公告)日：2018-03-01
申请号：US15559848
申请日：2016-03-15
申请人： SAFRAN AIRCRAFT ENGINES
发明人： Sara SOMANOU , Celine DEJOS , Franck Paul Dominique Vital PANIZZOLI , Philippe ARSLAN
IPC分类号： G01N23/04 , B33Y10/00 , B33Y80/00
CPC分类号： G01N23/046 , B29C64/106 , B29D99/0025 , B29L2031/082 , B33Y10/00 , B33Y80/00 , F01D5/282 , F05D2220/36 , F05D2260/83 , G01N2223/3037 , G01N2223/419 , G01N2223/63 , G01N2223/6466
摘要： A method of fabricating a reference blade for calibrating non-destructive inspection by tomography of real blades of similar shapes and dimensions, including making a three-dimensional blank out of resin, creating housings in the thickness of the blank at predetermined locations, and introducing in each of the housings a cylinder including an artificial defect or a real defect in order to obtain the reference blade.

19. 发明申请

US20160245761A1 Method of determination of physical parameters of an object imaged using computer tomograph and equipment for implementation of said method 审中-公开
公开(公告)号：US20160245761A1
公开(公告)日：2016-08-25
申请号：US14553906
申请日：2014-11-25
申请人： Uniwersytet Slaski w Katowicach
发明人： Marcin BINKOWSKI
IPC分类号： G01N23/04 , G01N23/06 , G01N9/24
CPC分类号： G01N23/046 , G01N9/24 , G01N23/085 , G01N2223/3037 , G01N2223/419
摘要： The core of the invention lies in a method of determination of physical parameters of the object (3) imaged using computer tomograph, in particular determination of absolute parameters of physical density and/or X-ray absorption coefficient, wherein the reference (2) of the determined physical parameters is installed between the X-ray source (4) and the detector (1) or, advantageously, directly on the detector (1), outside the rotating tomograph platform where the scanned object (3) is placed, followed by object scanning, during which the images of tomographic projections record simultaneously the two-dimensional image of the studied object and the two-dimensional image of the reference, where for at least one projection for at least one reference area the value of image greyscale intensity is performed in relative units by readout of pixel value from the projection image, which reflects the X-ray radiation intensity in greyscale after passing through the scanner chamber and the reference, and the obtained results are used as a basis for calculations of coefficients of calibration function, preferably using linear regression, then the calibration function is substituted with a variable, namely the value determined from the pixel value from the projection image, which reflects the intensity of X-rays in greyscale after passing through the scanner chamber and the scanned object and the value of calibration function is calculated, reflecting the value of the physical parameter and it is stored, preferably in the same pixel in the projection, then on the basis of thus determined projection a computer image reconstruction takes place, the result of which represents in the absolute scale values of the determined physical parameter. The core of the invention is also contained in the equipment for using this method.

20. 发明授权

US08908827B2 Compositions, methods of use and systems for analysis of silicon levels in petroleum materials 有权
标题翻译：组分，使用方法和石油材料中硅含量分析系统
公开(公告)号：US08908827B2
公开(公告)日：2014-12-09
申请号：US13523430
申请日：2012-06-14
申请人： James Carnahan , Zewu Chen , Leslie Johnson
发明人： James Carnahan , Zewu Chen , Leslie Johnson
IPC分类号： G01N23/223
CPC分类号： G01N33/2835 , G01N23/223 , G01N2223/076 , G01N2223/3037 , G01N2223/637 , G01N2223/652
摘要： This invention relates in general to the determination of silicon levels in fuel mixtures, such as petroleum products. More particularly, the present invention relates to compositions for use as standards in an x-ray analyzer for the measurement of silicon in various fuel mixtures, and to methods of using these compositions.
摘要翻译：本发明一般涉及燃料混合物如石油产品中硅含量的测定。更具体地说，本发明涉及用作X射线分析仪中用于测量各种燃料混合物中的硅的标准品的组合物，以及使用这些组合物的方法。

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