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    • 19. 发明授权
    • Intelligent wall switch
    • 智能墙壁开关
    • US08053994B2
    • 2011-11-08
    • US12477248
    • 2009-06-03
    • Yuan-Sheng LiuYen-Wen Chen
    • Yuan-Sheng LiuYen-Wen Chen
    • H05B37/02
    • H05B37/0272H05B37/0227Y02B20/48Y10T307/786Y10T307/826Y10T307/832Y10T307/845Y10T307/944
    • An intelligent wall switch comprises an extend operation panel including sensor areas with a first conducting film; a glass on the back sides of the sensor areas including second conducting films; a first circuit board including a backlight LED and an infrared emitter and connected to a flexible cable connected to the second conducting film; a frame on a back side of the glass; a controller system including a second circuit board having an AC-DC power module, relays, AC output connectors, an AC input connector all on a back side thereof, and having a flat cable connector, an infrared receiver, and multiple indicating LEDs all on a front side thereof; a connecting piece and a housing being used to receive the AC-DC power module, the connecting piece being disposed on a back side of the frame, the AC-DC power module being connected to the cable by the flat cable connector.
    • 一种智能墙壁开关包括一个扩展操作面板,包括具有第一导电膜的传感器区域; 在包括第二导电膜的传感器区域的背面上的玻璃; 第一电路板,包括背光LED和红外发射器,并连接到连接到第二导电膜的柔性电缆; 在玻璃背面的框架; 控制器系统,包括具有AC-DC电源模块,继电器,AC输出连接器,其背面上的AC输入连接器的第二电路板,以及具有扁平电缆连接器,红外接收器和多个指示LED的第二电路板 其前侧; 用于接收AC-DC电源模块的连接件和壳体,连接件设置在框架的背面,AC-DC电源模块通过扁平电缆连接器连接到电缆。
    • 20. 发明授权
    • Chip testing device and system
    • 芯片测试装置和系统
    • US07793177B2
    • 2010-09-07
    • US11783371
    • 2007-04-09
    • Yen-Wen ChenYen-Ynn Chou
    • Yen-Wen ChenYen-Ynn Chou
    • G01R31/28
    • G01R31/318555G01R31/31716G01R31/318572
    • A chip testing device having a plurality of testing units is provided. Each testing unit comprises a selector, a flip-flop unit, a first buffer and a second buffer. The selector is controlled by a control signal and has a first input terminal, a feedback input terminal, and a first output terminal. The flip-flop unit has a second input terminal coupled to the first output terminal, a clock signal input terminal for receiving a reference clock signal, and a second output terminal outputting an output data. The first buffer is coupled to the flip-flop unit to convert the output data to a high voltage data, and outputs the high voltage data. The second buffer is coupled to the first buffer to convert high voltage data to low voltage data and transmit the low voltage data to the feedback input terminal.
    • 提供具有多个测试单元的芯片测试装置。 每个测试单元包括选择器,触发器单元,第一缓冲器和第二缓冲器。 选择器由控制信号控制,并具有第一输入端,反馈输入端和第一输出端。 触发器单元具有耦合到第一输出端子的第二输入端子,用于接收参考时钟信号的时钟信号输入端子和输出输出数据的第二输出端子。 第一缓冲器耦合到触发器单元以将输出数据转换为高电压数据,并输出高电压数据。 第二缓冲器耦合到第一缓冲器,以将高电压数据转换成低电压数据,并将低电压数据传送到反馈输入端。