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11. 发明授权

US07445907B2 Methods for mass spectrometry detection and quantification of specific target proteins in complex biological samples 失效
标题翻译：复杂生物样品中特异性靶蛋白的质谱检测和定量方法
公开(公告)号：US07445907B2
公开(公告)日：2008-11-04
申请号：US10963019
申请日：2004-10-12
申请人： Nicholas P. Everett , James K. Petell , Scott A. Young
发明人： Nicholas P. Everett , James K. Petell , Scott A. Young
IPC分类号： C12Q1/37
CPC分类号： G01N33/6848
摘要： Mass spectrometry-based methods are described for the detection or quantification of targeted proteins in biological samples e.g., plants, animals, and microorganisms, parts (e.g., tissue or cells) thereof, and products derived from plants, animals or microorganisms.
摘要翻译：描述了用于检测或定量生物样品例如植物，动物和微生物，其部分（例如组织或细胞）以及源自植物，动物或微生物的产物的靶向蛋白质的基于质谱法的方法。

12. 发明授权

US07109458B2 Confocal wafer depth scanning inspection method 有权
标题翻译：共焦晶圆深度扫描检测方法
公开(公告)号：US07109458B2
公开(公告)日：2006-09-19
申请号：US11079614
申请日：2005-03-14
申请人： Christopher R. Fairley , Tao-Yi Fu , Bin-Ming Benjamin Tsai , Scott A. Young
发明人： Christopher R. Fairley , Tao-Yi Fu , Bin-Ming Benjamin Tsai , Scott A. Young
IPC分类号： G02B7/04
CPC分类号： G01N21/9501 , G02B3/0056 , G02B21/0024 , G02B21/0028 , G02B21/008 , G02B27/40
摘要： A semiconductor wafer inspection system and method is provided which uses a multiple element arrangement, such as an offset fly lens array. The preferred embodiment uses a laser to transmit light energy toward a beam expander, which expands the light energy to create an illumination field. An offset fly lens array converts light energy from the illumination field into an offset pattern of illumination spots. A lensing arrangement, including a first lens, a transmitter/reflector, an objective, and a Mag tube imparts light energy onto the specimen and passes the light energy toward a pinhole mask. The pinhole mask is mechanically aligned with the offset fly lens array. Light energy passing through each pinhole in the pinhole mask is directed toward a relay lens, which guides light energy onto a sensor. The offset fly lens array corresponds to the pinhole mask. The offset pattern of the offset fly lens array is chosen such that spots produced can be recombined into a continuous image, and the system utilizes a time delay and integration charge coupled device for rapid sensing along with an autofocus system that measures and cancels topological features of the specimen.
摘要翻译：提供了使用多重元件布置的半导体晶片检查系统和方法，例如偏移飞行透镜阵列。优选实施例使用激光将光能传递到光束扩展器，其扩展光能以产生照明场。偏移飞行透镜阵列将来自照明场的光能转换成照明点的偏移图案。包括第一透镜，发射器/反射器，物镜和Mag管的透镜装置将光能量施加到样本上并将光能传递给针孔掩模。针孔掩模与偏置飞行透镜阵列机械对准。通过针孔掩模中的每个针孔的光能被引向中继透镜，该中继透镜将光能引导到传感器上。偏移飞行透镜阵列对应于针孔掩模。选择偏移飞行透镜阵列的偏移图案，使得所产生的斑点可以重新组合成连续图像，并且系统利用时间延迟和积分电荷耦合器件与快速感测以及自动对焦系统一起测量和消除拓扑特征标本。

13. 发明授权

US08643835B2 Active planar autofocus 有权
标题翻译：主动平面自动对焦
公开(公告)号：US08643835B2
公开(公告)日：2014-02-04
申请号：US12833093
申请日：2010-07-09
申请人： Scott A. Young , Daniel L. Cavan , Yale Zhang , Aviv Balan
发明人： Scott A. Young , Daniel L. Cavan , Yale Zhang , Aviv Balan
IPC分类号： G01N21/00 , G01B11/14 , G06K9/00
CPC分类号： G01N21/956 , G01N21/9501
摘要： A system for inspecting a depth relative to a layer using a sensor with a fixed focal plane. A focus sensor senses the surface of the substrate and outputs focus data. In setup mode the controller scans a first portion of the substrate, receives the focus data and XY data, and stores correlated XYZ data for the substrate. In inspection mode the controller scans a second portion of the substrate, receives the focus data and XY data, and subtracts the stored Z data from the focus data to produce virtual data. The controller feeds the virtual data plus an offset to the motor for moving the substrate up and down during the inspection, thereby holding the focal plane at a desired Z distance.
摘要翻译：一种用于使用具有固定焦平面的传感器检查相对于层的深度的系统。聚焦传感器感测基板的表面并输出焦点数据。在设置模式下，控制器扫描基板的第一部分，接收聚焦数据和XY数据，并存储基板的相关XYZ数据。在检查模式下，控制器扫描基板的第二部分，接收焦点数据和XY数据，并从焦点数据中减去存储的Z数据，以产生虚拟数据。控制器将虚拟数据加上偏移量供给电机，以在检查期间上下移动基板，从而将焦平面保持在所需的Z距离。

14. 发明授权

US07873133B2 Recovery of client clock without jitter 有权
标题翻译：恢复客户端时钟无抖动
公开(公告)号：US07873133B2
公开(公告)日：2011-01-18
申请号：US11426481
申请日：2006-06-26
申请人： Scott A. Young , Ting-Kuang Chiang
发明人： Scott A. Young , Ting-Kuang Chiang
IPC分类号： H03D3/24
CPC分类号： H03L7/081 , H03L7/185 , H03L2207/12 , H04J3/076
摘要： The present invention provides a system, apparatus and method for recovering a client signal clock. The present invention is able to more effectively remove jitter within a clock signal by providing a phase shifting element in the feedback of a PLL system to compensate for sudden changes in an input reference clock. The PLL system provides flexible clock recovery so that it can accommodate various payload types because it extracts a client clock signal independent of a corresponding justification count number.
摘要翻译：本发明提供一种用于恢复客户端信号时钟的系统，装置和方法。通过在PLL系统的反馈中提供相移元件来补偿输入参考时钟的突然变化，本发明能够更有效地消除时钟信号内的抖动。 PLL系统提供灵活的时钟恢复，使得它可以适应各种有效载荷类型，因为它提取独立于对应对齐计数的客户端时钟信号。

15. 发明申请

US20080273196A1 Confocal wafer inspection system and method 有权
标题翻译：共聚焦晶片检测系统及方法
公开(公告)号：US20080273196A1
公开(公告)日：2008-11-06
申请号：US12218189
申请日：2008-07-11
申请人： Christopher R. Fairley , Tao-Yi Fu , Bin-Ming Benjanim Tsai , Scott A. Young
发明人： Christopher R. Fairley , Tao-Yi Fu , Bin-Ming Benjanim Tsai , Scott A. Young
IPC分类号： G01N21/956 , G01N21/93
CPC分类号： G01N21/9501 , G02B3/0056 , G02B21/0024 , G02B21/0028 , G02B21/008 , G02B27/40
摘要： A semiconductor wafer inspection system and method is provided which uses a multiple element arrangement, such as an offset fly lens array. The preferred embodiment uses a laser to transmit light energy toward a beam expander, which expands the light energy to create an illumination field. An offset fly lens array converts light energy from the illumination field into an offset pattern of illumination spots. A lensing arrangement, including a first lens, a transmitter/reflector, an objective, and a Mag tube imparts light energy onto the specimen and passes the light energy toward a pinhole mask. The pinhole mask is mechanically aligned with the offset fly lens array. Light energy passing through each pinhole in the pinhole mask is directed toward a relay lens, which guides light energy onto a sensor. The offset fly lens array corresponds to the pinhole mask. The offset pattern of the offset fly lens array is chosen such that spots produced can be recombined into a continuous image, and the system utilizes a time delay and integration charge coupled device for rapid sensing along with an autofocus system that measures and cancels topological features of the specimen.
摘要翻译：提供了使用多重元件布置的半导体晶片检查系统和方法，例如偏移飞行透镜阵列。优选实施例使用激光将光能传递到光束扩展器，其扩展光能以产生照明场。偏移飞行透镜阵列将来自照明场的光能转换成照明点的偏移图案。包括第一透镜，发射器/反射器，物镜和Mag管的透镜装置将光能量施加到样本上并将光能传递给针孔掩模。针孔掩模与偏置飞行透镜阵列机械对准。通过针孔掩模中的每个针孔的光能被引向中继透镜，该中继透镜将光能引导到传感器上。偏移飞行透镜阵列对应于针孔掩模。选择偏移飞行透镜阵列的偏移图案，使得所产生的斑点可以重新组合成连续图像，并且系统利用时间延迟和积分电荷耦合器件与快速感测以及自动对焦系统一起测量和消除拓扑特征标本。

16. 发明授权

US07071386B2 Xenorhabdus TC gene for pest control 有权
标题翻译： Xenorhabdus TC基因用于病虫害防治
公开(公告)号：US07071386B2
公开(公告)日：2006-07-04
申请号：US10753901
申请日：2004-01-07
申请人： Scott B. Bintrim , Jon C. Mitchell , Ignacio M. Larrinua , Patricia C. Apel-Birkhold , Susan B. Green , Barry W. Schafer , Scott A. Bevan , Scott A. Young , Lining Guo
发明人： Scott B. Bintrim , Jon C. Mitchell , Ignacio M. Larrinua , Patricia C. Apel-Birkhold , Susan B. Green , Barry W. Schafer , Scott A. Bevan , Scott A. Young , Lining Guo
IPC分类号： A01H5/00 , A01H5/10 , C12N15/82 , C12N1/21 , C12N15/31
CPC分类号： C12N15/8286 , Y02A40/162
摘要： The subject invention relates to novel nucleic acid encoding a Xenorhabdus strain Xwi toxin complex (TC) protein and plants and bacteria transformed therewith.
摘要翻译：本发明涉及编码Xenorhabdus菌株Xwi毒素复合物（TC）蛋白质的新型核酸以及用其转化的植物和细菌。

17. 发明授权

US09553034B1 Combined semiconductor metrology system 有权
标题翻译：组合半导体计量系统
公开(公告)号：US09553034B1
公开(公告)日：2017-01-24
申请号：US13533360
申请日：2012-06-26
申请人： Scott A. Young , Guoheng Zhao , NanChang Zhu , Neeraj Khanna
发明人： Scott A. Young , Guoheng Zhao , NanChang Zhu , Neeraj Khanna
IPC分类号： H01L21/66 , G01N21/95
CPC分类号： H01L22/24 , G01N21/8851 , G01N21/9501 , G01N21/9503 , G01N2021/8845 , H01L22/12 , H01L22/20
摘要： A semiconductor wafer inspection system includes a camera and two or more illuminators. The illuminators illuminate a line of the semiconductor wafer in sequence and the camera captures an interleaved image of illuminated lines such that the individual images can be recovered from the interleaved image. The semiconductor wafer can be moved by a conveyor so that adjacent lines can be sequentially illuminated by the illuminators. The camera may include two or more line sensors.
摘要翻译：半导体晶片检查系统包括相机和两个或更多个照明器。照明器依次照射半导体晶片的一行，并且相机捕获照明线的交错图像，使得各个图像可以从交错图像中恢复。半导体晶片可以通过输送机移动，使得相邻的线可以被照明器依次照明。相机可以包括两个或更多个线传感器。

18. 发明授权

US09170231B2 Quantification and characterization of allergens 有权
标题翻译：过敏原的定量和表征
公开(公告)号：US09170231B2
公开(公告)日：2015-10-27
申请号：US13877311
申请日：2011-08-22
申请人： Scott A. Young , Barry W. Schafer , Krishna Kuppannan , Samir Julka , Dave R. Albers
发明人： Scott A. Young , Barry W. Schafer , Krishna Kuppannan , Samir Julka , Dave R. Albers
IPC分类号： G01N27/62 , G01N30/72 , G01N30/78 , G01N30/46 , G01N30/88 , G01N30/74
CPC分类号： G01N27/62 , G01N30/463 , G01N30/7233 , G01N30/74 , G01N30/78 , G01N2030/884
摘要： Embodiments of the invention include methods of determining the allergen content of a composition. Embodiments of the invention may include providing a composition comprising an allergen; at least partially purifying the allergen from the composition to form an extract; and determining the amount of allergen in the extract using liquid chromatography with ultraviolet and mass spectrometric detection.
摘要翻译：本发明的实施方案包括确定组合物的变应原含量的方法。本发明的实施方案可以包括提供包含变应原的组合物; 至少部分地从组合物中纯化变应原以形成提取物; 并使用具有紫外和质谱检测的液相色谱法测定提取物中的变应原的量。

19. 发明授权

US07517956B2 Xenorhabdus TC proteins and genes for pest control 有权
标题翻译： Xenorhabdus TC蛋白和病虫害防治基因
公开(公告)号：US07517956B2
公开(公告)日：2009-04-14
申请号：US11375551
申请日：2006-03-14
申请人： Scott B. Bintrim , Jon C. Mitchell , Ignacio M. Larrinua , Patricia C. Apel-Birkhold , Susan B. Green , Barry W. Schafer , Scott A. Bevan , Scott A. Young , Lining Guo
发明人： Scott B. Bintrim , Jon C. Mitchell , Ignacio M. Larrinua , Patricia C. Apel-Birkhold , Susan B. Green , Barry W. Schafer , Scott A. Bevan , Scott A. Young , Lining Guo
IPC分类号： C07K14/00 , C07H21/04
CPC分类号： C12N15/8286 , Y02A40/162
摘要： The subject invention relates to novel Xenorhabdus toxin complex (TC) proteins and genes that encode these proteins. More specifically, the subject invention relates to TC genes and proteins obtainable from Xenorhabdus strain Xwi. The subject invention also provides an exochitinase obtainable from the Xwi strain. This exochitinase can be used to control insects using methods known in the art.
摘要翻译：本发明涉及新型异戊酰梭菌毒素复合物（TC）蛋白质和编码这些蛋白质的基因。更具体地，本发明涉及从Xenorhabdus菌株Xwi获得的TC基因和蛋白质。本发明还提供可从Xwi菌株获得的外切蛋白酶。该外切蛋白酶可以使用本领域已知的方法来控制昆虫。

20. 发明授权

US06867406B1 Confocal wafer inspection method and apparatus using fly lens arrangement 有权
标题翻译：共焦晶片检查方法和使用飞行透镜装置的装置
公开(公告)号：US06867406B1
公开(公告)日：2005-03-15
申请号：US09533203
申请日：2000-03-23
申请人： Christopher R. Fairley , Tao-Yi Fu , Bin-Ming Benjamin Tsai , Scott A. Young
发明人： Christopher R. Fairley , Tao-Yi Fu , Bin-Ming Benjamin Tsai , Scott A. Young
IPC分类号： G02B21/00 , G02B27/40
CPC分类号： G01N21/9501 , G02B3/0056 , G02B21/0024 , G02B21/0028 , G02B21/008 , G02B27/40
摘要： A semiconductor wafer inspection system and method is provided which uses a multiple element arrangement, such as an offset fly lens array. The preferred embodiment uses a laser to transmit light energy toward a beam expander, which expands the light energy to create an illumination field. An offset fly lens array converts light energy from the illumination field into an offset pattern of illumination spots. A lensing arrangement, including a first lens, a transmitter/reflector, an objective, and a Mag tube imparts light energy onto the specimen and passes the light energy toward a pinhole mask. The pinhole mask is mechanically aligned with the offset fly lens array. Light energy passing through each pinhole in the pinhole mask is directed toward a relay lens, which guides light energy onto a sensor. The offset fly lens array corresponds to the pinhole mask. The offset pattern of the offset fly lens array is chosen such that spots produced can be recombined into a continuous image, and the system utilizes a time delay and integration charge coupled device for rapid sensing along with an autofocus system that measures and cancels topological features of the specimen.
摘要翻译：提供了使用多重元件布置的半导体晶片检查系统和方法，例如偏移飞行透镜阵列。优选实施例使用激光将光能传递到光束扩展器，其扩展光能以产生照明场。偏移飞行透镜阵列将来自照明场的光能转换成照明点的偏移图案。包括第一透镜，发射器/反射器，物镜和Mag管的透镜装置将光能量施加到样本上并将光能传递给针孔掩模。针孔掩模与偏置飞行透镜阵列机械对准。通过针孔掩模中的每个针孔的光能被引向中继透镜，该中继透镜将光能引导到传感器上。偏移飞行透镜阵列对应于针孔掩模。选择偏移飞行透镜阵列的偏移图案，使得所产生的斑点可以重新组合成连续图像，并且系统利用时间延迟和积分电荷耦合器件与快速感测以及自动对焦系统一起测量和消除拓扑特征标本。

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