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    • 11. 发明授权
    • Mass spectrometer using a dynamic pressure ion source
    • 质谱仪使用动态离子源
    • US07893401B2
    • 2011-02-22
    • US12158458
    • 2006-12-20
    • Li Ding
    • Li Ding
    • H01J49/04
    • H01J49/062H01J49/0481H01J49/164
    • A mass spectrometer has a pulsed ion source, a first ion trap (10) for trapping ions generated by the pulsed ion source and for locating trapped ions for subsequent ejection from the first ion trap. A pulse of cooling gas is introduced into the first ion trap (10) at a peak pressure suitable for enabling the first ion trap (10) to trap ions. A turbomolecular pump (17) reduces the pressure of cooling gas before the trapped ions are ejected from the first ion trap (1) towards a second ion trap (20) for analysis. The pulsed ion source has a sample plate (14) which forms an end wall of the first ion trap (10).
    • 质谱仪具有脉冲离子源,第一离子阱(10),用于捕获由脉冲离子源产生的离子,并用于定位捕获的离子用于随后从第一离子阱排出。 将冷却气体的脉冲以适于使第一离子阱(10)捕获离子的峰值压力引入到第一离子阱(10)中。 涡轮分子泵(17)在被捕获的离子从第一离子阱(1)向第二离子阱(20)排出之前降低冷却气体的压力,用于分析。 脉冲离子源具有形成第一离子阱(10)的端壁的样品板(14)。
    • 12. 发明授权
    • Optical material and method for modifying the refractive index
    • 用于改变折射率的光学材料和方法
    • US07789910B2
    • 2010-09-07
    • US11948298
    • 2007-11-30
    • Wayne H. KnoxLi DingJay F. KunzlerDharmendra JaniCandido D. Pinto
    • Wayne H. KnoxLi DingJay F. KunzlerDharmendra JaniCandido D. Pinto
    • A61F2/16
    • A61F2/1613A61B18/20A61F2/14A61F2/16A61F2/1627A61F2/1635B29D11/00461B29D11/023C08J7/12C08J7/123G02C2202/14
    • A method for modifying the refractive index of an optical, polymeric material. The method comprises irradiating select regions of the optical, polymeric material with a focused, visible or near-IR laser having a pulse energy from 0.05 nJ to 1000 nJ. The irradiation results in the formation of refractive optical structures, characterized by a change in refractive index, exhibit little or no scattering loss, and exhibit no significant differences in the Raman spectrum with respect to the non-irradiated optical, polymeric material. The method can be used to modify the refractive index of an intraocular lens following the surgical implantation of the intraocular lens in a human eye. The invention is also directed to an optical device comprising refractive optical structures, wherein the refractive structures are characterized by a change in refractive index, exhibit little or no scattering loss, and exhibit no significant differences in the Raman spectrum with respect to the non-irradiated optical, polymeric material.
    • 用于改变光学聚合物材料的折射率的方法。 该方法包括用具有0.05nJ至1000nJ的脉冲能量的聚焦,可见或近红外激光照射光学聚合物材料的选择区域。 照射导致折射光学结构的形成,其特征在于折射率的变化,显示很少或没有散射损失,并且在拉曼光谱方面相对于未照射的光学聚合物材料没有显着差异。 该方法可以用于在人眼中手术植入人工晶状体后修改眼内透镜的折射率。 本发明还涉及一种包括折射光学结构的光学器件,其中折射结构的特征在于折射率的变化,表现出很少的或没有散射损耗,并且在拉曼光谱方面相对于未辐照的表现没有显着的差异 光学,聚合材料。
    • 13. 发明申请
    • INTEGRATED SINGLE SPICE DECK SENSITIZATION FOR GATE LEVEL TOOLS
    • 针对门级水平工具的集成单个单位敏感度
    • US20100005429A1
    • 2010-01-07
    • US12166630
    • 2008-07-02
    • Jindrich ZejdaNarender HanchateRupesh NayakLi Ding
    • Jindrich ZejdaNarender HanchateRupesh NayakLi Ding
    • G06F17/50
    • G06F17/5036G06F17/505
    • One embodiment of the present invention provides systems and techniques for generating a transistor-level description of a subcircuit. A user may want to simulate a subcircuit in a circuit using a transistor-level simulator, and one or more cells in the subcircuit may need to be sensitized so that the cells are in a desired state when the subcircuit is simulated. An embodiment modifies the subcircuit by inserting analog switches in front of the cells that need to be sensitized, so that the analog switches can be used to apply a sensitization sequence to the cells during the transistor-level simulation. The embodiment can then generate a transistor-level description of the modified subcircuit. Next, the transistor-level description of the subcircuit can be stored, thereby enabling the transistor-level simulator to simulate the subcircuit.
    • 本发明的一个实施例提供了用于产生子电路的晶体管级描述的系统和技术。 用户可能需要使用晶体管级模拟器来模拟电路中的分支电路,并且子电路中的一个或多个单元可能需要被敏化,使得当模拟子电路时,单元格处于期望状态。 实施例通过将模拟开关插入需要敏化的单元前面来修改子电路,使得模拟开关可用于在晶体管级仿真期间向单元施加致敏序列。 然后,该实施例可以生成修改后的子电路的晶体管级描述。 接下来,可以存储子电路的晶体管级描述,从而使晶体管级模拟器能够模拟子电路。
    • 14. 发明申请
    • ION TRAP ARRAY
    • 离子束阵列
    • US20090294655A1
    • 2009-12-03
    • US12298968
    • 2007-04-13
    • Chuanfan DingLi Ding
    • Chuanfan DingLi Ding
    • B01D59/44H01J49/00
    • H01J49/4225H01J49/004H01J49/065H01J49/4235
    • The invention “Ion Trap Array (ITA)” pertains generally to the field of ion storage and analysis technologies, and particularly to the ion storing apparatus and mass spectrometry instruments which separate ions by its character such as mass-to-charge ratio. The aim of this invention is providing an apparatus for ion storage and analysis comprising at least two or more rows of parallel placed electrode array wherein each electrode array includes at least two or more parallel bar-shaped electrodes, by applying different phase of alternating current voltages on different bar electrodes to create alternating electric fields inside the space between two parallel electrodes of different rows of electrode arrays, multiple linear ion trapping fields paralleled constructed in the space between the different rows of electrode arrays which are open to adjacent each other without a real barrier. This invention also provides a method for ion storage and analysis involving with the trapping, cooling and mass-selected analyzing of ions by this apparatus mentioned which constructs multiple conjoint linear ion trapping fields in the space between the different rows of electrode arrays
    • 本发明“离子阱阵列(ITA)”一般涉及离子存储和分析技术领域,特别涉及离子存储装置和质谱仪器,它们通过诸如质荷比的特性分离离子。 本发明的目的是提供一种用于离子存储和分析的装置,其包括至少两行或多行平行放置的电极阵列,其中每个电极阵列包括至少两个或更多个平行的棒状电极,通过施加不同相位的交流电压 在不同的棒电极上在不同行电极阵列的两个平行电极之间的空间内部产生交替电场,多个线性离子俘获场平行地构造在电极阵列的不同行之间的空间中,这些空间彼此相邻而没有实际 屏障。 本发明还提供一种离子存储和分析的方法,其涉及通过所述装置进行的捕获,冷却和质量选择的离子分析,其构造了在不同行电极阵列之间的空间中的多个联合线性离子捕获场
    • 18. 发明授权
    • System and method for testing a link control card
    • 用于测试链路控制卡的系统和方法
    • US07479781B2
    • 2009-01-20
    • US11440318
    • 2006-05-24
    • Kang WuWei ZhangJun HuangLi Ding
    • Kang WuWei ZhangJun HuangLi Ding
    • G01R31/00
    • H04L43/50
    • A system and method for testing a Link Control Card (LCC) of a storage device includes a host, a middle plane (MP), a switch, and a testing device array. The host is connected to the testing device array for sending out command sets and receiving results. The MP is connected between the LCC and the testing device array. The switch determines the LCC to output hard reset signals and the hard reset signals are transferred to the testing device array via the MP. The testing device array includes a plurality of testing devices, and each of the testing devices includes a micro-controller unit (MCU); a connector being connected to the MCU, and coupled to the MP; an address setting unit being connected to the MCU, for setting an unique address of each of the testing devices; and a first interface being connected to the MCU for outputting results.
    • 用于测试存储设备的链路控制卡(LCC)的系统和方法包括主机,中间平面(MP),交换机和测试设备阵列。 主机连接到测试设备阵列,用于发送命令集和接收结果。 MP连接在LCC和测试设备阵列之间。 该开关确定LCC输出硬复位信号,硬复位信号通过MP传输到测试器件阵列。 测试装置阵列包括多个测试装置,并且每个测试装置包括微控制器单元(MCU); 连接器连接到MCU,并连接到MP; 连接到MCU的地址设置单元,用于设置每个测试设备的唯一地址; 以及连接到MCU的第一接口,用于输出结果。