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    • 11. 发明授权
    • Chemical plasma treatment for rounding tungsten surface spires
    • 化学等离子体处理用于圆形钨表面尖顶
    • US06180484B2
    • 2001-01-30
    • US09140776
    • 1998-08-26
    • Kun-Chih WangWen-Yi Hsieh
    • Kun-Chih WangWen-Yi Hsieh
    • H01L2120
    • H01L28/60C23C16/14C23C16/56H01L21/7684H01L21/76877
    • The present invention proposes a method for forming a tungsten film with a good surface property and utilizes a chemical plasma treatment to round the tungsten surface and to improve the leakage issue of tungsten conductive film. A fabrication of a DRAM cell capacitor with tungsten bottom electrode is described for a preferred embodiment. Forming an inter-layer dielectric on a semiconductor substrate, a tungsten layer is formed thereon. A chemical plasma treatment is carried out to round the tungsten surface spires and result in a better surface properties. The tungsten layer is patterned to serve as the bottom electrode, and another dielectric layer is formed to cover the bottom electrode of tungsten. Finally, the top storage electrode is formed to finish the present process.
    • 本发明提出了一种形成具有良好表面性能的钨膜的方法,并利用化学等离子体处理使钨表面圆弧化并改善了钨导电膜的泄漏问题。 对于优选实施例描述了具有钨底电极的DRAM单元电容器的制造。 在半导体衬底上形成层间电介质,在其上形成钨层。 进行化学等离子体处理以使钨表面尖锐化,并产生更好的表面性能。 图案化钨层用作底部电极,并且形成另一个电介质层以覆盖钨的底部电极。 最后,形成顶部存储电极以完成本工艺。
    • 12. 发明授权
    • Method fabricating metal interconnected structure
    • 制造金属互连结构的方法
    • US06169028A
    • 2001-01-02
    • US09237787
    • 1999-01-26
    • Kun-Chih WangMing-Sheng YangWen-Yi Hsieh
    • Kun-Chih WangMing-Sheng YangWen-Yi Hsieh
    • H10L2144
    • H01L21/7684H01L21/3212H01L21/76807
    • A method for fabricating a metal interconnect structure. A semiconductor substrate comprising a conductive layer therein is provided. A dielectric layer is formed on the semiconductor substrate. A part of the dielectric layer is removed to form a dual damascene opening and a trench therein, wherein the dual damascene opening exposes the conductive layer. The trench is larger than the dual damascene opening. A conformal barrier layer is formed on the dielectric layer. A conformal metal layer is formed on the barrier layer to fill the dual damascene opening and to partially fill the trench. The metal layer positioned in the trench has a thickness equal to the depth of the trench. A conformal cap layer is formed on the metal layer. A CMP process is performed to remove the cap layer, the metal layer and the barrier layer outside the trench and outside the dual damascene opening.
    • 一种制造金属互连结构的方法。 提供了包括其中的导电层的半导体衬底。 在半导体衬底上形成电介质层。 去除介电层的一部分以在其中形成双镶嵌开口和沟槽,其中双镶嵌开口暴露导电层。 沟槽大于双镶嵌开口。 在电介质层上形成保形阻挡层。 在阻挡层上形成保形金属层以填充双镶嵌开口并部分填充沟槽。 定位在沟槽中的金属层的厚度等于沟槽的深度。 在金属层上形成共形盖层。 执行CMP处理以去除沟槽外部的覆盖层,金属层和阻挡层,并且在双镶嵌开口外部。
    • 14. 发明授权
    • Deposition method with improved step coverage
    • 沉积方法具有改进的台阶覆盖
    • US6046097A
    • 2000-04-04
    • US274599
    • 1999-03-23
    • Kevin HsiehKun-Chih WangWen-Yi Hsieh
    • Kevin HsiehKun-Chih WangWen-Yi Hsieh
    • H01L21/768H01L21/28
    • H01L21/76843
    • A deposition method for improving the step coverage of contact holes is disclosed. The method includes initially placing a semiconductor substrate on a chuck of a chamber, wherein the substrate has some contact holes. The chuck is firstly adjusted and conductive material is firstly deposited onto the substrate, wherein the direction of the first deposition is about vertical to the surface of the substrate, and therefore the bottom of the contact holes is then substantially deposited with the conductive material. Next, the chuck is secondly adjusted so that it has a tilt angle between the direction of the second deposition and rotation axis of the chuck. Finally, the chuck is continuously rotated and the conductive material is secondly deposited onto the substrate, and therefore the sidewall of the contact holes is then substantially deposited with the conductive material.
    • 公开了一种用于改善接触孔的台阶覆盖的沉积方法。 该方法包括最初将半导体衬底放置在室的卡盘上,其中衬底具有一些接触孔。 首先调整卡盘,并且首先将导电材料沉积到基底上,其中第一沉积的方向大约垂直于基底的表面,因此接触孔的底部然后基本上沉积有导电材料。 接下来,卡盘被二次调节,使得其在第二沉积的方向和卡盘的旋转轴线之间具有倾斜角。 最后,卡盘连续旋转,导电材料第二次沉积在基片上,因此接触孔的侧壁然后基本上沉积有导电材料。
    • 20. 发明授权
    • Electrical contact for socket connector
    • 插座连接器电接触
    • US07841864B2
    • 2010-11-30
    • US12538883
    • 2009-08-11
    • Shih-Wei HsiaoWen-Yi Hsieh
    • Shih-Wei HsiaoWen-Yi Hsieh
    • H01R12/00
    • H01R13/2421
    • An electrical connector (100) includes an insulative housing (2) defining a plurality of passageways (21) and a plurality of contacts (1) received in corresponding passageways. Each contact includes a moveable part (10) forming a pair of guiding beams (105), an immoveable part (20) coupled with the moveable part and a biasing device (30) constantly urging the moveable part away from immoveable part. The immoveable part includes a pair of posts (205) and defines a pair of guiding slots (207). The guiding beams are received in the guiding slots and are capable of moving with regard to the immovable part along opposite surfaces of the immoveable part. The guiding beams and the posts are decussated to surround the biasing device for preventing the biasing device from disengaging therefrom.
    • 电连接器(100)包括限定多个通道(21)的绝缘外壳(2)和容纳在相应通道中的多个触点(1)。 每个触点包括形成一对引导梁(105)的可移动部分(10),与可移动部分联接的不可移动部分(20)和不断地将可移动部分推离远离不可移动部分的偏置装置(30)。 不可移动部分包括一对柱(205)并且限定一对引导槽(207)。 引导梁被容纳在引导槽中并且能够相对于不可移动部分的相对表面相对于不可移动部分移动。 引导梁和柱被折叠以围绕偏置装置,以防止偏置装置与其分离。